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International Tables for Crystallography (2006). Vol. B. ch. 2.5, pp. 276-345
https://doi.org/10.1107/97809553602060000558 |
Chapter 2.5. Electron diffraction and electron microscopy in structure determination
Related articles
Related articles within International Tables are as follows:
Volume B: Reciprocal space (first online edition, 2006)
- Chapter 1.2. The structure factor, by P. Coppens
- Chapter 1.3. Fourier transforms in crystallography: theory, algorithms and applications, by G. Bricogne
- Chapter 2.2. Direct methods, by C. Giacovazzo
- Chapter 2.3. Patterson and molecular-replacement techniques, by M. G. Rossmann and E. Arnold
- Chapter 4.3. Diffuse scattering in electron diffraction, by J. M. Cowley and J. K. Gjønnes
- Chapter 5.1. Dynamical theory of X-ray diffraction, by A. Authier
- Chapter 5.2. Dynamical theory of electron diffraction, by A. F. Moodie, J. M. Cowley and P. Goodman
Volume C: Mathematical, physical and chemical tables (first online edition, 2006)
- Chapter 4.3. Electron diffraction, by C. Colliex, J. M. Cowley, S. L. Dudarev, M. Fink, J. Gjønnes, R. Hilderbrandt, A. Howie, D. F. Lynch, L. M. Peng, G. Ren, A. W. Ross, V. H. Smith Jr, J. C. H. Spence, J. W. Steeds, J. Wang, M. J. Whelan and B. B. Zvyagin
- Chapter 6.1. Intensity of diffracted intensities, by P. J. Brown, A. G. Fox, E. N. Maslen, M. A. O'Keefe and B. T. M. Willis