Figure 2.3.1.10

Parrish, W.; Langford, J. I.

doi:10.1107/97809553602060000578

International
Tables for
Crystallography
Volume C
Mathematical, physical and chemical tables
Edited by E. Prince

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International Tables for Crystallography (2006). Vol. C. ch. 2.3, p. 50

Figure 2.3.1.10

W. Parrish^a ^‡ and J. I. Langford^b

^a IBM Almaden Research Center, San Jose, CA, USA, and ^bSchool of Physics & Astronomy, University of Birmingham, Birmingham B15 2TT, England

Figure 2.3.1.10

(a) Origin of specimen-related aberrations in focusing plane of conventional reflection specimen diffractometer (Fig. 2.3.1.3). A no aberration from curved specimen; B flat specimen; C specimen displacement from 0. (b) Computed angular shifts caused by specimen displacement, R = 185 mm. (c) Flat-specimen asymmetric aberration, Si(422), Cu Kα₁, Kα₂ peak intensities normalized. (d) Computed flat-specimen centroid shifts for various apertures; parabola for constant irradiated 2 cm specimen length. (e) Transparency asymmetric aberration, LiF(200) powder reflection, Cu Kα, peak intensities normalized, thin specimen (solid-line profile) 0.1 mm thick; thick specimen (dotted-line profile) 1.0 mm, α_ES 1°, α_RS 0.046°. (f) Computed transparency centroid shifts for various values of linear absorption coefficient.