International
Tables for
Crystallography
Volume C
Mathematical, physical and chemical tables
Edited by E. Prince

International Tables for Crystallography (2006). Vol. C. ch. 2.3, p. 53

Section 2.3.1.4. Reflection specimen, θ–θ scan

W. Parrisha and J. I. Langfordb

a IBM Almaden Research Center, San Jose, CA, USA, and bSchool of Physics & Astronomy, University of Birmingham, Birmingham B15 2TT, England

2.3.1.4. Reflection specimen, θ–θ scan

| top | pdf |

In this geometry, the specimen is fixed in the horizontal plane and the X-ray tube and detector are synchronously scanned in the vertical plane in opposite directions above the centre of the specimen as shown in Fig. 2.3.1.14[link] . The distances source to S and S to RS are equal to that the angles of incidence and diffraction and a constant dθ/dt are maintained over the entire angular range. A focusing monochromator can be used in the incident or diffracted beam. High- and low-temperature chambers are simplified because the specimen does not move. The arms carrying the X-ray tube and detector must be counterbalanced because of the unequal weights. The method has advantages in certain applications such as the measurement of liquid scattering without a covering window, high-temperature molten samples, and other applications requiring a stationary horizontal sample (Kaplow & Averbach, 1963[link]; Wagner, 1969[link]).

[Figure 2.3.1.14]

Figure 2.3.1.14| top | pdf |

Optics of θ–θ scanning diffractometer. X-ray tube and detector move synchronously in opposite directions (arrows) around fixed horizontal specimen. A focusing monochromator can be used after the receiving slit.

References

First citation Kaplow, R. & Averbach, B. L. (1963). X-ray diffractometer for the study of liquid structures. Rev. Sci. Instrum. 34, 579–581.Google Scholar
First citation Wagner, C. N. J. (1969). Diffraction analysis of liquid and amorphous alloys. Adv. X-ray Anal. 12, 50–71.Google Scholar








































to end of page
to top of page