International
Tables for
Crystallography
Volume C
Mathematical, physical and chemical tables
Edited by E. Prince

© International Union of Crystallography 2006
International Tables for Crystallography (2006). Vol. C. ch. 2.3, p. 72

Section 2.3.5.1.2. Spectral purity

W. Parrisha‡ and J. I. Langfordb

a IBM Almaden Research Center, San Jose, CA, USA, and bSchool of Physics & Astronomy, University of Birmingham, Birmingham B15 2TT, England

2.3.5.1.2. Spectral purity

| top | pdf |

Spectral contamination from metals inside the tube may occur and increase with tube use. This reduces the intensity by coating the anode and windows and may not be noticed when using an incident-beam or diffracted-beam monochromator. It can be measured by removing the monochromator or β filter, operating the tube at high kV, and recording the diffraction pattern of a simple powder (e.g. Si or W), a rolled metal foil, or a single-crystal plate (Ladell & Parrish, 1959[link]). The contaminating elements can be identified from the extra peaks. It is advisable to check the spectral purity when the tube is new and periodically thereafter.

References

First citation Ladell, J. & Parrish, W. (1959). Determination of spectral contamination of X-ray tubes. Philips Res. Rep. 14, 401–420.Google Scholar








































to end of page
to top of page