International
Tables for Crystallography Volume C Mathematical, physical and chemical tables Edited by E. Prince © International Union of Crystallography 2006 |
International Tables for Crystallography (2006). Vol. C. ch. 4.2, p. 215
Section 4.2.3.2.3. Requirements for the absolute measurement of μl or (μ/ρ)
D. C. Creaghb
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The following prescription should be followed if accurate, absolute measurements of and are to be obtained.
Whichever detection system is chosen, it is essential that the system dead-time be determined experimentally. For descriptions of techniques for the determination of system dead-time, see, for example, Bertin (1975).
References
Bertin, E. P. (1975). Principles and practice of X-ray spectrometric analysis. New York: Plenum.Google ScholarChipman, D. R. (1969). Conversion of relative intensities to an absolute scale. Acta Cryst. A25, 209–214.Google Scholar
Gerward, L. (1981). X-ray attenuation coefficients and atomic photoelectric absorption cross sections of silicon. J. Phys. B, 14, 3389–3395.Google Scholar
Jennings, L. D. (1984). The polarization ratio of crystal monochromators. Acta Cryst. A40, 12–16.Google Scholar
Parratt, L. G., Porteus, I. O., Schnopper, H. W. & Watanabe, T. (1959). X-ray absorption coefficients and geometrical collimation of the beam. Rev. Sci. Instrum. 30, 344–347.Google Scholar
Templeton, D. H. & Templeton, L. K. (1982). X-ray dichroism and polarized anomalous scattering of the uranyl ion. Acta Cryst. A38, 62–67.Google Scholar
Templeton, D. H. & Templeton, L. K. (1985a). X-ray dichroism and anomalous scattering of potassium tetrachloroplatinate(II). Acta Cryst. A41, 356–371.Google Scholar
Templeton, D. H. & Templeton, L. K. (1986). X-ray birefringence and forbidden reflections in sodium bromate. Acta Cryst. A42, 478–481.Google Scholar