International
Tables for Crystallography Volume C Mathematical, physical and chemical tables Edited by E. Prince © International Union of Crystallography 2006 |
International Tables for Crystallography (2006). Vol. C. ch. 4.2, p. 258
Section 4.2.6.4. Table of wavelengths, energies, and linewidths used in compiling the tables of the dispersion corrections
D. C. Creaghb
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4.2.6.4. Table of wavelengths, energies, and linewidths used in compiling the tables of the dispersion corrections
Table 4.2.6.7 lists the characteristic emission wavelengths that are commonly used by crystallographers in their experiments. Also included are the emission energies (since many systems use energy rather than wavelength discrimination) and the line widths (full width at half-maximum) of these lines (Agarwal, 1979; Stearns, 1984; Deutsch & Hart, 1984a,b).
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References
Agarwal, B. K. (1979). X-ray spectroscopy, p. 215. Berlin: Springer-Verlag.Google ScholarDeutsch, M. & Hart, M. (1982). Wavelength energy shape and structure of the Cu Kα1 X-ray emission line. Phys. Rev. B, 26, 5550–5567.Google Scholar
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Deutsch, M. & Hart, M. (1984b). X-ray refractive-index measurement in silicon and lithium fluoride. Phys. Rev. B, 30, 640–642.Google Scholar
Stearns, D. G. (1984). Broadening of extended X-ray absorption fine structure ensuing from the finite lifetime of the K hole. Philos. Mag. 49, 541–558.Google Scholar