International Tables for Crystallography (2006). Vol. C, ch. 5.2, pp. 491-504
doi: 10.1107/97809553602060000596

Chapter 5.2. X-ray diffraction methods: polycrystalline

Contents

  • 5.2. X-ray diffraction methods: polycrystalline  (pp. 491-504) | html | pdf | chapter contents |
    • 5.2.1. Introduction  (pp. 491-492) | html | pdf |
      • 5.2.1.1. The techniques available  (p. 491) | html | pdf |
      • 5.2.1.2. Errors and aberrations: general discussion  (p. 491) | html | pdf |
      • 5.2.1.3. Errors of the Bragg angle  (p. 491) | html | pdf |
      • 5.2.1.4. Bragg angle: operational definitions  (pp. 491-492) | html | pdf |
    • 5.2.2. Wavelength and related problems  (pp. 492-493) | html | pdf |
      • 5.2.2.1. Errors and uncertainties in wavelength  (p. 492) | html | pdf |
      • 5.2.2.2. Refraction  (p. 492) | html | pdf |
      • 5.2.2.3. Statistical fluctuations  (pp. 492-493) | html | pdf |
    • 5.2.3. Geometrical and physical aberrations  (pp. 493-494) | html | pdf |
      • 5.2.3.1. Aberrations  (p. 493) | html | pdf |
      • 5.2.3.2. Extrapolation, graphical and analytical  (pp. 493-494) | html | pdf |
    • 5.2.4. Angle-dispersive diffractometer methods: conventional sources  (p. 495) | html | pdf |
    • 5.2.5. Angle-dispersive diffractometer methods: synchrotron sources  (pp. 495-496) | html | pdf |
    • 5.2.6. Whole-pattern methods  (p. 496) | html | pdf |
    • 5.2.7. Energy-dispersive techniques  (pp. 496-497) | html | pdf |
    • 5.2.8. Camera methods  (pp. 497-498) | html | pdf |
    • 5.2.9. Testing for remanent systematic error   (p. 498) | html | pdf |
    • 5.2.10. Powder-diffraction standards  (pp. 498-499) | html | pdf |
    • 5.2.11. Intensity standards  (p. 500) | html | pdf |
    • 5.2.12. Instrumental line-profile-shape standards  (p. 501) | html | pdf |
    • 5.2.13. Factors determining accuracy  (pp. 501-504) | html | pdf |
    • References | html | pdf |
    • Tables
      • Table 5.2.1.1. Functions of the cell angles in equation (5.2.1.3) for the possible unit cells  (p. 492) | html | pdf |
      • Table 5.2.4.1. Centroid displacement <Δθ/θ> and variance W of certain aberrations of an angle-dispersive diffractometer  (p. 494) | html | pdf |
      • Table 5.2.7.1. Centroid displacement [\langle \Delta E/E\rangle] and variance W of certain aberrations of an energy-dispersive diffractometer  (p. 497) | html | pdf |
      • Table 5.2.8.1. Some geometrical aberrations in the Debye–Scherrer method   (p. 498) | html | pdf |
      • Table 5.2.10.1. NIST values for silicon standards  (p. 499) | html | pdf |
      • Table 5.2.10.2. Reflection angles (°) for tungsten, silver, and silicon  (p. 499) | html | pdf |
      • Table 5.2.10.3. Silicon standard reflection angles (°)  (p. 500) | html | pdf |
      • Table 5.2.10.4. Silicon standard high reflection angles (°)  (p. 501) | html | pdf |
      • Table 5.2.10.5. Tungsten reflection angles (°)   (p. 502) | html | pdf |
      • Table 5.2.10.6. Fluorophlogopite 00 l standard reflection angles  (p. 503) | html | pdf |
      • Table 5.2.10.7. Silver behenate 00 l standard reflection angles  (p. 503) | html | pdf |
      • Table 5.2.11.1. NIST intensity standards, SRM 674  (p. 503) | html | pdf |