International Tables for Crystallography

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X-ray diffraction methods: polycrystalline
W. Parrish, A. J. C. Wilson and J. I. Langford. International Tables for Crystallography (2006). Vol. C, ch. 5.2, pp. 491-504  [ doi:10.1107/97809553602060000596 ]

Abstract

The determination of lattice parameters using X-ray powder methods is reviewed. Topics covered include: wavelength errors, refraction and statistical fluctuations; geometrical and physical aberrations; angle-dispersive diffractometer methods (using conventional and synchrotron sources); whole-pattern methods; energy-dispersive techniques; camera methods; testing for remanent systematic error; powder-diffraction, intensity and instrumental line-profile-shape standards; and factors determining accuracy.


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About International Tables for Crystallography

International Tables for Crystallography is the definitive resource and reference work for crystallography. The multi-volume series comprises articles and tables of data relevant to crystallographic research and to applications of crystallographic methods in all sciences concerned with the structure and properties of materials.