International Tables for Crystallography

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X-ray diffraction methods: single crystal
E. Gałdecka. International Tables for Crystallography (2006). Vol. C, ch. 5.3, pp. 505-536  [ doi:10.1107/97809553602060000597 ]

Abstract

Lattice-parameter determination using X-ray diffraction methods on single crystals is reviewed. All the methods are classified with respect to the measurement technique, in particular into photographic and counter-diffractometer techniques. The methods are described in approximately chronological sequence, i.e. from the earliest and simplest rotating-crystal method to the latest non-dispersive techniques, and at the same time from those of poor accuracy and precision to those attaining the highest precision and/or accuracy. In each of the methods realizing a given technique, first the absolute and then the relative method are described.


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About International Tables for Crystallography

International Tables for Crystallography is the definitive resource and reference work for crystallography. The multi-volume series comprises articles and tables of data relevant to crystallographic research and to applications of crystallographic methods in all sciences concerned with the structure and properties of materials.