X-ray diffraction methods: single crystal

Gałdecka, E.

doi:10.1107/97809553602060000597

Absolute measurements 5.3.1.1

of lattice spacings 5.3.1.1

Accuracy of lattice-parameter (lattice-spacing) determination 5.3.1.1, 5.3.1.1, 5.3.1.2, 5.3.1.2, 5.3.1.2, 5.3.1.2, 5.3.1.2, 5.3.1.2

relative 5.3.1.1

Arrangements giving partial reduction of systematic errors 5.3.4

Asymmetric (Straumanis) film mounting 5.3.2.3.4, 5.3.2.3.4

Back reflection 5.3.2.4.1, 5.3.2.4.1, 5.3.2.4.2

Bond method 5.3.1.2

Bragg angle

accuracy of 5.3.1.1, 5.3.1.2

determination 5.3.1.2

measurement of 5.3.1.1

Bragg law 5.3.1.1, 5.3.1.1, 5.3.1.1, 5.3.1.1

Camera radius

extremely large 5.3.2.3.5

uncertainty, elimination 5.3.2.3.4, 5.3.2.3.4

Cameras

for recording lattice-parameter changes 5.3.2.3.5

Kossel 5.3.2.4.1

Characteristic X-rays

excitation 5.3.2.4.1

Comparison measurements of lattice parameters 5.3.1.2

Conical surface of an hkl reflection 5.3.2.4.1

Conic section 5.3.2.4.2, 5.3.2.4.3

Convolution 5.3.1.1, 5.3.1.1

Crystal profile 5.3.1.1

Crystal thickness

in transmission geometry 5.3.2.4.1

Data-processing

single-crystal methods 5.3.1.1

Defects

study of 5.3.1.1

Direct-lattice parameters 5.3.1.1, 5.3.1.1

Divergent-beam techniques 5.3.2.4

classification 5.3.2.4.2

Double-crystal spectrometers

with photographic recording 5.3.2.3.5

Effect on lattice parameters (examination)

of pressure 5.3.1.2

Effect on lattice parameters

of electric field 5.3.1.2

of temperature 5.3.1.2, 5.3.2.3.4, 5.3.2.3.5

Eigenvalue filtering 5.3.2.3.4

Energy-dispersive

methods, in lattice-spacing determination 5.3.1.2

Epitaxic layers, study of 5.3.2.4.4

Excitation of characteristic X-rays 5.3.2.4.1

Extrapolation in lattice-parameter determination 5.3.1.1, 5.3.2.3.4

Film shrinkage

error, elimination of 5.3.2.3.4, 5.3.2.3.4

Half-width 5.3.1.1

minimum 5.3.1.1

of wavelength distribution 5.3.1.1

High-angle Bragg reflections

in lattice-parameter determination 5.3.2.3.4

Identity period determination 5.3.2.3.1

accuracy of 5.3.2.3.4

Interplanar spacing determination

accuracy of 5.3.1.1, 5.3.1.1

precision of 5.3.1.1, 5.3.1.1

Kossel

camera 5.3.2.4.1

cone 5.3.2.4.1, 5.3.2.4.3

lines 5.3.2.4, 5.3.2.4.1, 5.3.2.4.3, 5.3.2.4.4

lines, intersections of 5.3.2.4.1, 5.3.2.4.2

method 5.3.2.4

pattern 5.3.2.3, 5.3.2.4.2

plane 5.3.2.4.2

Kα doublet 5.3.2.3.5, 5.3.2.4.2, 5.3.2.4, 5.3.2.4.2, 5.3.2.4.3, 5.3.2.4.3, 5.3.3.3.1

Kβ line in lattice-spacing determination 5.3.1.2

Lattice-parameter changes

study of 5.3.1.2, 5.3.2.3.5

Lattice-parameter determination 5.3.1.1

absolute 5.3.1.1

from one crystal mounting 5.3.2.3.3

from separate photographs 5.3.2.3.1

of deformed lattice 5.3.2.4.2, 5.3.2.4.2

of large flat slab 5.3.1.2

of polycrystals (Kossel method) 5.3.2.4.4

of single crystals 5.3.1.1

of small spherical crystals 5.3.1.2

of standard crystal 5.3.1.2

powder diffraction 5.3.1.1, 5.3.1.1, 5.3.1.1, 5.3.2.3.4, 5.3.2.3.4

precision 5.3.1.1, 5.3.2.3.4, 5.3.2.4.3

preliminary 5.3.1.2

relative 5.3.1.1

sensitivity of 5.3.1.1, 5.3.1.2

Lattice-parameter determination methods

non-dispersive 5.3.1.2, 5.3.1.2

pseudo-non-dispersive 5.3.1.2

single-crystal X-ray 5.3.1.1

Lattice-parameter differences

determination of 5.3.1.2

Laue photography

combined with powder diffraction 5.3.1.1

Least-squares refinement 5.3.1.1, 5.3.2.3.4

Lens configuration 5.3.2.4.2

Lens-shaped figures 5.3.2.4.1, 5.3.2.4, 5.3.2.4.3

Measured profile 5.3.1.1

Measurements of lattice parameters

absolute 5.3.1.1

relative 5.3.1.1

Misalignment 5.3.1.2

Multiple diffraction 5.3.2.4.2

Multiple-diffraction methods

with photographic recording 5.3.2.4.2

Multiple-exposure techniques 5.3.2.4.2, 5.3.2.5

Non-dispersive methods (techniques) 5.3.1.2, 5.3.1.2

Original profile 5.3.1.1

Oscillation photographs processing 5.3.2.3.4, 5.3.2.3.4

Perfect single crystals 5.3.2.3.5

Phase diagrams, determination of 5.3.2.3.5

Phase transitions, study of 5.3.2.3.5

Photographic methods

single-crystal 5.3.2

single-crystal, classification of 5.3.1.2

Powder diffraction

combined with Laue photography 5.3.1.1

Powder methods

compared with single-crystal methods 5.3.1.1, 5.3.1.1

Precision of lattice-spacing determination 5.3.1.1

relative 5.3.1.1

Pressure, effect on lattice parameters

study of 5.3.1.2

Profile fitting

in oscillation photographs 5.3.2.3.4

Pseudo-non-dispersive methods 5.3.1.2

radiation

elimination 5.3.2.3.5

Ratio method

for powder samples 5.3.2.3.4

for single crystals 5.3.2.3.4

Reciprocal cell

picture of, three-dimensional 5.3.2.3.3

picture of, two-dimensional 5.3.2.3.2

picture of, undeformed 5.3.2.3.2

Reciprocal lattice

geometry 5.3.2.4.2

Refinement

least-squares 5.3.1.1, 5.3.2.3.4

Refraction

correction for 5.3.1.1

Relative measurements of lattice spacing 5.3.1.1

Single-crystal methods

compared with powder methods 5.3.1.1, 5.3.1.1

photographic 5.3.2

Single-crystal X-ray techniques 5.3.1.1

Small spherical crystals

lattice-parameter determination of 5.3.1.2

Sources of X-radiation 5.3.1.2

Spectrometers

double-crystal 5.3.2.3.5

Standard crystal 5.3.1.2

lattice-parameter determination of 5.3.1.2

Statistical errors

of lattice-parameter determination 5.3.1.1

Stereographic projection of Kossel pattern 5.3.2.3

Strain, measurement of 5.3.2.3.5

Strainmeter 5.3.2.3.5

Straumanis film mounting 5.3.2.3.4

Stress

study of 5.3.2.3.5

Symmetric arrangement in single-crystal methods 5.3.2.3.4

Systematic errors

in divergent-beam methods 5.3.2.4.3

in photographic methods 5.3.2.4.3

reduced by detailed analysis of Kossel patterns 5.3.2.4.2

reduced experimentally 5.3.2.4.2, 5.3.3.4.2, 5.3.3.4.3.2

reduced owing to extrapolation 5.3.1.1, 5.3.2.3.4, 5.3.2.3.4

Temperature dependence of lattice parameters

examination 5.3.1.2

Thermal effects, error connected with 5.3.2.4.3

Thermal expansion

study of 5.3.2.3.5, 5.3.2.3.5, 5.3.3.4.2

Thickness

of crystal (sample) 5.3.2.4.1, 5.3.2.4.1

Topography 5.3.3.5, 5.3.3.7.4

Transmission geometry 5.3.2.4.1, 5.3.2.4.1

crystal thickness for 5.3.2.4.1, 5.3.2.4.2

Umweganregung 5.3.3.6

Wavelength determination 5.3.1.1, 5.3.1.2

errors in 5.3.4

Wavelengths

distribution 5.3.1.1, 5.3.1.2

White radiation

in lattice-parameter determination 5.3.1.2, 5.3.2.1

X-ray beam

highly divergent 5.3.1.2, 5.3.2.1, 5.3.2.4, 5.3.2.4.1

in single-crystal techniques 5.3.1.2

well collimated 5.3.1.2, 5.3.1.2, 5.3.2.1, 5.3.2.1

X-ray source(s)

in the sample 5.3.2.4.1

on the sample 5.3.2.4.1

outside the sample 5.3.2.4.1

X-ray spectrometers

Bragg 5.3.2.3.4

symmetric 5.3.2.3.4

X-ray wavelengths

in single-crystal methods 5.3.1.2, 5.3.1.2

Chapter 5.3. X-ray diffraction methods: single crystal

Chapter index