International Tables for Crystallography (2006). Vol. C, ch. 5.4, pp. 537-540
doi: 10.1107/97809553602060000598

Chapter 5.4. Electron-diffraction methods

Contents

  • 5.4. Electron-diffraction methods  (pp. 537-540) | html | pdf | chapter contents |
    • 5.4.1. Determination of cell parameters from single-crystal patterns  (pp. 537-538) | html | pdf |
      • 5.4.1.1. Introduction  (pp. 537-538) | html | pdf |
      • 5.4.1.2. Zero-zone analysis  (p. 538) | html | pdf |
      • 5.4.1.3. Non-zero-zone analysis  (p. 538) | html | pdf |
    • 5.4.2. Kikuchi and HOLZ techniques  (pp. 538-540) | html | pdf |
    • References | html | pdf |
    • Figures
      • Fig. 5.4.1.1. Diffraction geometry  (p. 537) | html | pdf |
      • Fig. 5.4.1.2. A diffraction pattern with the crystal oriented at a zone axis  (p. 538) | html | pdf |
      • Fig. 5.4.2.1. Schematic diagram showing the geometry of a Kikuchi pattern  (p. 538) | html | pdf |
      • Fig. 5.4.2.2. Schematic diagram of three Kikuchi lines that nearly intersect at the same point  (p. 539) | html | pdf |
      • Fig. 5.4.2.3. Schematic diagram showing the indexing of the most prominent lines in the selected-area channelling pattern near the [111] zone of Si  (p. 540) | html | pdf |
    • Tables
      • Table 5.4.1.1. Unit-cell information available for photographic recording  (p. 537) | html | pdf |