International
Tables for
Crystallography
Volume C
Mathematical, physical and chemical tables
Edited by E. Prince

International Tables for Crystallography (2006). Vol. C. ch. 7.2, p. 642

Section 7.2.4.2. Scintillation detectors

J. N. Chapmana

a Department of Physics and Astronomy, University of Glasgow, Glasgow G12 8QQ, Scotland

7.2.4.2. Scintillation detectors

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One of the most widely used total flux detectors is a scintillator, the output from which is coupled into a photomultiplier by a light-pipe. In the first stage, an incident electron deposits its energy in the scintillator, producing a number of light photons with an energy deficiency of up to ∼20% (Herrmann, 1984[link]). By careful design of the light-pipe, an appreciable fraction of the photons will reach the photomultiplier, which should have a photocathode whose quantum yield peaks around the wavelength of the photons from the scintillator. Even though the quantum yield of the photocathode is likely to be < 0.2, the number of photoelectrons emerging from the photocathode for each electron incident on the scintillator should be considerably greater than unity, provided the incident electron energy exceeds ~10 keV. With lower-energy electrons, it is advantageous to provide an additional acceleration onto the scintillator to ensure that an adequate number of photons is generated.

Following the production of photoelectrons, considerable multiplication takes place down the dynode chain of the photomultiplier and a current pulse may easily be detected at the anode. Electron counting is therefore a possibility and to take advantage of this over as wide a current range as possible scintillators with very fast decay times (10−8 to 10−7 s) should be used. Such scintillators have the additional advantage that they may be used in systems where beam scanning is performed at TV rates.

When the rate of arrival of electrons at the detector appreciably exceeds 106  s−1, it becomes increasingly difficult to distinguish the output from individual electrons and the detector must be operated in an analogue mode. Despite this, the individual electron pulse-height distributions from good scintillators are sufficiently narrow that values of DQE greater than 0.8 may be obtained (Chapman & Morrison, 1984[link]). Scintillators meeting both speed and pulse-height distribution requirements include plastics (e.g. Nuclear Enterprise NE102A) and Ce-doped YAG (Schauer & Autrata, 1979[link]). It should be noted that the materials discussed in Subsection 7.2.3.1[link] are generally un­suitable for fast detector systems because of their relatively long time constants and the existence of an afterglow that persists for several seconds.

To handle the large dynamic range encountered in diffraction patterns, it is advantageous to use a detector system capable of both counting the arrival of individual electrons and making analogue current measurements. Such a system, which allows signals whose magnitudes differ by a factor of 108 to be recorded with a high DQE in a single scan, has been described by Craven & Buggy (1984[link]). More general advantages of detector systems based on scintillation counters are their desirable input/output characteristics, which are essentially linear, and the fact that a quantitative measure of electron intensity is directly available in a form suitable for input to a computer. Analysis of the data may thus begin as soon as its collection is completed.

The susceptibility to radiation damage of many high-efficiency scintillators, resulting in a diminution of light output with increasing use, is probably the major disadvantage of these detectors. Of importance in some instances is the fact that the entire detection system is relatively bulky and it may not always be possible to position it satisfactorily within the apparatus.

References

First citation Chapman, J. N. & Morrison, G. R. (1984). Detector systems for transmission electron microscopy. J. Microsc. Spectrosc. Electron. 9, 329–340.Google Scholar
First citation Craven, A. J. & Buggy, T. W. (1984). Correcting electron energy loss spectra for artefacts introduced by a serial data collection system. J. Microsc. 136, 227–239.Google Scholar
First citation Herrmann, K.-H. (1984). Detection systems. Quantitative electron microscopy, edited by J. N. Chapman & A. J. Craven, Chap. 4. Edinburgh University Press.Google Scholar
First citation Schauer, P. & Autrata, R. (1979). Electro-optical properties of a scintillation detector in SEM. J. Microsc. Spectrosc. Electron. 4, 633–650.Google Scholar








































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