International Tables for Crystallography (2006). Vol. C, ch. 8.8, pp. 735-743
doi: 10.1107/97809553602060000616

Chapter 8.8. Accurate structure-factor determination with electron diffraction

Contents

  • 8.8. Accurate structure-factor determination with electron diffraction  (pp. 735-743) | html | pdf | chapter contents |
    • References | html | pdf |
    • Figures
      • Fig. 8.8.1. Schematic representations of four convergent-beam configurations used for structure-factor determination: ( a ) intensity profile of a low-order reflection, g ; ( b ) non-systematic three- or four-beam configuration with a strong coupling reflection, h ; ( c ) symmetric many-beam configuration in a dense zone; ( d ) integrated intensity measurement of high-order reflections using a wide aperture (Taftø & Metzger, 1985)  (p. 736) | html | pdf |