(International Tables) Mathematical, physical and chemical tables

International Tables for Crystallography
Volume C: Mathematical, physical and chemical tables

First online edition (2006) ISBN: 978-1-4020-1900-5 eISBN: 978-1-4020-5408-2 doi: 10.1107/97809553602060000103

Edited by E. Prince

Preface to the third edition (p. xxxi) | html | pdf |
E. Prince

Part 1. Crystal geometry and symmetry
- 1.1. Summary of general formulae (pp. 2-5) | html | pdf | chapter contents |
  E. Koch
  - 1.1.1. General relations between direct and reciprocal lattices (pp. 2-3) | html | pdf |
    - 1.1.1.1. Primitive crystallographic bases (pp. 2-3) | html | pdf |
    - 1.1.1.2. Non-primitive crystallographic bases (p. 3) | html | pdf |
  - 1.1.2. Lattice vectors, point rows, and net planes (pp. 3-4) | html | pdf |
  - 1.1.3. Angles in direct and reciprocal space (pp. 4-5) | html | pdf |
  - 1.1.4. The Miller formulae (p. 5) | html | pdf |
  - References | html | pdf |
  - Tables
    - Table 1.1.1.1. Direct and reciprocal lattices described with respect to conventional basis systems (p. 3) | html | pdf |
- 1.2. Application to the crystal systems (pp. 6-9) | html | pdf | chapter contents |
  E. Koch
  - 1.2.1. Triclinic crystal system (p. 6) | html | pdf |
  - 1.2.2. Monoclinic crystal system (p. 6) | html | pdf |
    - 1.2.2.1. Setting with `unique axis b ' (p. 6) | html | pdf |
    - 1.2.2.2. Setting with `unique axis c ' (p. 6) | html | pdf |
  - 1.2.3. Orthorhombic crystal system (pp. 6-7) | html | pdf |
  - 1.2.4. Tetragonal crystal system (p. 7) | html | pdf |
  - 1.2.5. Trigonal and hexagonal crystal system (pp. 7-9) | html | pdf |
    - 1.2.5.1. Description referred to hexagonal axes (pp. 7-8) | html | pdf |
    - 1.2.5.2. Description referred to rhombohedral axes (pp. 8-9) | html | pdf |
  - 1.2.6. Cubic crystal system (p. 9) | html | pdf |
  - References | html | pdf |
  - Tables
    - Table 1.2.4.1. Assignment of integers $[s\le 100]$ to pairs h , k with (p. 7) | html | pdf |
    - Table 1.2.5.1. Assignment of integers $[s\le100]$ to pairs h , k with (p. 8) | html | pdf |
    - Table 1.2.5.2. Assignment of integers $[s_1\le50]$ to triplets h , k , l with and to integers (p. 8) | html | pdf |
    - Table 1.2.6.1. Assignment of integers $[s\le 100]$ to triplets h , k , l with (p. 9) | html | pdf |
- 1.3. Twinning (pp. 10-14) | html | pdf | chapter contents |
  E. Koch
  - 1.3.1. General remarks (p. 10) | html | pdf |
  - 1.3.2. Twin lattices (pp. 10-12) | html | pdf |
    - 1.3.2.1. Examples (pp. 11-12) | html | pdf |
  - 1.3.3. Implication of twinning in reciprocal space (p. 12) | html | pdf |
  - 1.3.4. Twinning by merohedry (pp. 12-14) | html | pdf |
  - 1.3.5. Calculation of the twin element (p. 14) | html | pdf |
  - References | html | pdf |
  - Figures
    - Fig. 1.3.2.1. ( a ) Projection of the lattices of the twin components of a monoclinic twinned crystal (unique axis c , γ = 93°) with twin index 3 (p. 11) | html | pdf |
    - Fig. 1.3.2.2. Projection of the lattices of the twin components of an orthorhombic twinned crystal ( oP , b = $[\sqrt3]$ a ) with twin index 2 (p. 12) | html | pdf |
    - Fig. 1.3.2.3. Projection of the lattices of the twin components of an orthorhombic twinned crystal ( oC , b = 2 a ) with twin index 4 (p. 12) | html | pdf |
  - Tables
    - Table 1.3.2.1. Lattice planes and rows that are perpendicular to each other independently of the metrical parameters (p. 11) | html | pdf |
    - Table 1.3.4.1. Possible twin operations for twins by merohedry (p. 13) | html | pdf |
    - Table 1.3.4.2. Simulated Laue classes, extinction symbols, simulated `possible space groups', and possible true space groups for crystals twinned by merohedry (type 2) (p. 13) | html | pdf |
- 1.4. Arithmetic crystal classes and symmorphic space groups (pp. 15-22) | html | pdf | chapter contents |
  A. J. C. Wilson
  - 1.4.1. Arithmetic crystal classes (pp. 15-19) | html | pdf |
    - 1.4.1.1. Arithmetic crystal classes in three dimensions (p. 15) | html | pdf |
    - 1.4.1.2. Arithmetic crystal classes in one, two and higher dimensions (p. 16) | html | pdf |
  - 1.4.2. Classification of space groups (pp. 20-21) | html | pdf |
    - 1.4.2.1. Symmorphic space groups (p. 21) | html | pdf |
  - 1.4.3. Effect of dispersion on diffraction symmetry (p. 21) | html | pdf |
    - 1.4.3.1. Symmetry of the Patterson function (p. 21) | html | pdf |
    - 1.4.3.2. `Laue' symmetry (p. 21) | html | pdf |
  - References | html | pdf |
  - Tables
    - Table 1.4.1.1. The two-dimensional arithmetic crystal classes (p. 15) | html | pdf |
    - Table 1.4.2.1. The three-dimensional space groups, arranged by arithmetic crystal class (pp. 16-19) | html | pdf |
    - Table 1.4.3.1. Arithmetic crystal classes classified by the number of space groups that they contain (p. 20) | html | pdf |

Part 2. Diffraction geometry and its practical realization
- 2.1. Classification of experimental techniques (pp. 24-25) | html | pdf | chapter contents |
  J. R. Helliwell
  - References | html | pdf |
  - Tables
    - Table 2.1.1. Summary of main experimental techniques for structure analysis (p. 25) | html | pdf |
- 2.2. Single-crystal X-ray techniques (pp. 26-41) | html | pdf | chapter contents |
  J. R. Helliwell
  - 2.2.1. Laue geometry (pp. 26-29) | html | pdf |
    - 2.2.1.1. General (pp. 26-27) | html | pdf |
    - 2.2.1.2. Crystal setting (p. 27) | html | pdf |
    - 2.2.1.3. Single-order and multiple-order reflections (pp. 27-29) | html | pdf |
    - 2.2.1.4. Angular distribution of reflections in Laue diffraction (p. 29) | html | pdf |
    - 2.2.1.5. Gnomonic and stereographic transformations (p. 29) | html | pdf |
  - 2.2.2. Monochromatic methods (pp. 29-30) | html | pdf |
    - 2.2.2.1. Monochromatic still exposure (p. 30) | html | pdf |
    - 2.2.2.2. Crystal setting (p. 30) | html | pdf |
  - 2.2.3. Rotation/oscillation geometry (pp. 31-34) | html | pdf |
    - 2.2.3.1. General (p. 31) | html | pdf |
    - 2.2.3.2. Diffraction coordinates (pp. 31-33) | html | pdf |
    - 2.2.3.3. Relationship of reciprocal-lattice coordinates to crystal system parameters (p. 33) | html | pdf |
    - 2.2.3.4. Maximum oscillation angle without spot overlap (pp. 33-34) | html | pdf |
    - 2.2.3.5. Blind region (p. 34) | html | pdf |
  - 2.2.4. Weissenberg geometry (pp. 34-35) | html | pdf |
    - 2.2.4.1. General (p. 34) | html | pdf |
    - 2.2.4.2. Recording of zero layer (p. 34) | html | pdf |
    - 2.2.4.3. Recording of upper layers (pp. 34-35) | html | pdf |
  - 2.2.5. Precession geometry (pp. 35-36) | html | pdf |
    - 2.2.5.1. General (p. 35) | html | pdf |
    - 2.2.5.2. Crystal setting (p. 35) | html | pdf |
    - 2.2.5.3. Recording of zero-layer photograph (p. 35) | html | pdf |
    - 2.2.5.4. Recording of upper-layer photographs (pp. 35-36) | html | pdf |
    - 2.2.5.5. Recording of cone-axis photograph (p. 36) | html | pdf |
  - 2.2.6. Diffractometry (pp. 36-37) | html | pdf |
    - 2.2.6.1. General (p. 36) | html | pdf |
    - 2.2.6.2. Normal-beam equatorial geometry (pp. 36-37) | html | pdf |
    - 2.2.6.3. Fixed χ = 45° geometry with area detector (p. 37) | html | pdf |
  - 2.2.7. Practical realization of diffraction geometry: sources, optics, and detectors (pp. 37-41) | html | pdf |
    - 2.2.7.1. General (p. 37) | html | pdf |
    - 2.2.7.2. Conventional X-ray sources: spectral character, crystal rocking curve, and spot size (pp. 37-38) | html | pdf |
    - 2.2.7.3. Synchrotron X-ray sources (pp. 38-41) | html | pdf |
    - 2.2.7.4. Geometric effects and distortions associated with area detectors (p. 41) | html | pdf |
  - References | html | pdf |
  - Figures
    - Fig. 2.2.1.1. Laue geometry (p. 27) | html | pdf |
    - Fig. 2.2.1.2. A predicted Laue pattern of a protein crystal with a zone axis parallel to the incident, polychromatic X-ray beam (p. 27) | html | pdf |
    - Fig. 2.2.1.3. A multiple component spot in Laue geometry (p. 28) | html | pdf |
    - Fig. 2.2.1.4. The variation with M = λ _max /λ _min of the proportions of relp's lying on single, double, and triple rays for the case $[\lambda_{\rm max} \lt 2/d^*_{\rm max}]$ (p. 28) | html | pdf |
    - Fig. 2.2.1.5. Geometrical principles of the spherical, stereographic, gnomonic, and Laue projections (p. 29) | html | pdf |
    - Fig. 2.2.3.1. ( a ) Elevation of the sphere of reflection (p. 30) | html | pdf |
    - Fig. 2.2.3.2. Geometrical principles of recording the pattern on ( a ) a plane detector, ( b ) a V -shaped detector, ( c ) a cylindrical detector (p. 31) | html | pdf |
    - Fig. 2.2.3.3. The rotation method. Definition of coordinate systems (p. 32) | html | pdf |
    - Fig. 2.2.3.4. The rotation method. The blind region associated with a single rotation axis (p. 33) | html | pdf |
    - Fig. 2.2.5.1. The screenless precession setting photograph (schematic) and associated mis-setting angles for a typical orientation error when the crystal has been set previously by a monochromatic still or Laue (p. 35) | html | pdf |
    - Fig. 2.2.6.1. Normal-beam equatorial geometry: the angles ω, χ, ϕ, 2θ are drawn in the convention of Hamilton (1974) (p. 36) | html | pdf |
    - Fig. 2.2.6.2. Diffractometry with normal-beam equatorial geometry and angular motions ω, χ and ϕ (p. 36) | html | pdf |
    - Fig. 2.2.7.1. Reflection rocking width for a conventional X-ray source (p. 38) | html | pdf |
    - Fig. 2.2.7.2. Single-crystal monochromator illuminated by synchrotron radiation: ( a ) flat crystal, ( b ) Guinier setting, ( c ) overbent crystal, ( d ) effect of source size (shown at the Guinier setting for clarity) (p. 39) | html | pdf |
    - Fig. 2.2.7.3. Double-crystal monochromator illuminated by synchrotron radiation (p. 40) | html | pdf |
    - Fig. 2.2.7.4. The rocking width of an individual reflection for the case of Fig. 2.2.7.2( c ) and a vertical rotation axis (p. 40) | html | pdf |
  - Tables
    - Table 2.2.3.1. Glossary of symbols used to specify quantities on diffraction patterns and in reciprocal space (p. 32) | html | pdf |
    - Table 2.2.5.1. The distance displacement (in mm) measured on the film versus angular setting error of the crystal for a screenless precession ( $[\bar\mu=5^\circ]$ ) setting photograph (p. 35) | html | pdf |
- 2.3. Powder and related techniques: X-ray techniques (pp. 42-79) | html | pdf | chapter contents |
  W. Parrish and J. I. Langford
  - 2.3.1. Focusing diffractometer geometries (pp. 43-54) | html | pdf |
    - 2.3.1.1. Conventional reflection specimen, θ–2θ scan (pp. 44-50) | html | pdf |
      - 2.3.1.1.1. Geometrical instrument parameters (pp. 44-46) | html | pdf |
      - 2.3.1.1.2. Use of monochromators (p. 46) | html | pdf |
      - 2.3.1.1.3. Alignment and angular calibration (pp. 46-47) | html | pdf |
      - 2.3.1.1.4. Instrument broadening and aberrations (pp. 47-48) | html | pdf |
      - 2.3.1.1.5. Focal line and receiving-slit widths (p. 48) | html | pdf |
      - 2.3.1.1.6. Aberrations related to the specimen (pp. 48-49) | html | pdf |
      - 2.3.1.1.7. Axial divergence (p. 50) | html | pdf |
      - 2.3.1.1.8. Combined aberrations (p. 50) | html | pdf |
    - 2.3.1.2. Transmission specimen, θ–2θ scan (pp. 50-52) | html | pdf |
    - 2.3.1.3. Seemann–Bohlin method (pp. 52-53) | html | pdf |
    - 2.3.1.4. Reflection specimen, θ–θ scan (p. 53) | html | pdf |
    - 2.3.1.5. Microdiffractometry (pp. 53-54) | html | pdf |
  - 2.3.2. Parallel-beam geometries, synchrotron radiation (pp. 54-60) | html | pdf |
    - 2.3.2.1. Monochromatic radiation, θ–2θ scan (pp. 55-57) | html | pdf |
    - 2.3.2.2. Cylindrical specimen, 2θ scan (pp. 57-58) | html | pdf |
    - 2.3.2.3. Grazing-incidence diffraction (p. 58) | html | pdf |
    - 2.3.2.4. High-resolution energy-dispersive diffraction (pp. 58-60) | html | pdf |
  - 2.3.3. Specimen factors, angle, intensity, and profile-shape measurement (pp. 60-69) | html | pdf |
    - 2.3.3.1. Specimen factors (pp. 60-62) | html | pdf |
      - 2.3.3.1.1. Preferred orientation (pp. 60-61) | html | pdf |
      - 2.3.3.1.2. Crystallite-size effects (p. 62) | html | pdf |
    - 2.3.3.2. Problems arising from the K α doublet (pp. 62-63) | html | pdf |
    - 2.3.3.3. Use of peak or centroid for angle definition (p. 63) | html | pdf |
    - 2.3.3.4. Rate-meter/strip-chart recording (p. 63) | html | pdf |
    - 2.3.3.5. Computer-controlled automation (pp. 63-64) | html | pdf |
    - 2.3.3.6. Counting statistics (pp. 64-65) | html | pdf |
    - 2.3.3.7. Peak search (pp. 65-66) | html | pdf |
    - 2.3.3.8. Profile fitting (pp. 66-69) | html | pdf |
    - 2.3.3.9. Computer graphics for powder patterns (p. 69) | html | pdf |
  - 2.3.4. Powder cameras (pp. 70-71) | html | pdf |
    - 2.3.4.1. Cylindrical cameras (Debye–Scherrer) (p. 70) | html | pdf |
    - 2.3.4.2. Focusing cameras (Guinier) (pp. 70-71) | html | pdf |
    - 2.3.4.3. Miscellaneous camera types (p. 71) | html | pdf |
  - 2.3.5. Generation, modifications, and measurement of X-ray spectra (pp. 71-79) | html | pdf |
    - 2.3.5.1. X-ray tubes (pp. 71-74) | html | pdf |
      - 2.3.5.1.1. Stability (p. 72) | html | pdf |
      - 2.3.5.1.2. Spectral purity (p. 72) | html | pdf |
      - 2.3.5.1.3. Source intensity distribution and size (p. 73) | html | pdf |
      - 2.3.5.1.4. Air and window transmission (pp. 73-74) | html | pdf |
      - 2.3.5.1.5. Intensity variation with take-off angle (p. 74) | html | pdf |
    - 2.3.5.2. X-ray spectra (pp. 74-75) | html | pdf |
      - 2.3.5.2.1. Wavelength selection (p. 75) | html | pdf |
    - 2.3.5.3. Other X-ray sources (p. 75) | html | pdf |
    - 2.3.5.4. Methods for modifying the spectrum (pp. 75-79) | html | pdf |
      - 2.3.5.4.1. Crystal monochromators (pp. 76-78) | html | pdf |
      - 2.3.5.4.2. Single and balanced filters (pp. 78-79) | html | pdf |
  - References | html | pdf |
  - Figures
    - Fig. 2.3.1.1. Basic arrangements of focusing diffractometer methods (p. 43) | html | pdf |
    - Fig. 2.3.1.2. Specimen orientation for three diffractometer geometries (p. 44) | html | pdf |
    - Fig. 2.3.1.3. X-ray optics in the focusing plane of a `conventional' diffractometer with reflection specimen, diffracted-beam monochromator, and θ–2θ scanning (p. 44) | html | pdf |
    - Fig. 2.3.1.4. Length of specimen irradiated, S _l , as a function of 2θ for various angular apertures (p. 45) | html | pdf |
    - Fig. 2.3.1.5. Slit designs made with ( a ) rods, ( b ) bars, and ( c ) machined from single piece (p. 45) | html | pdf |
    - Fig. 2.3.1.6. Zero-angle calibration (p. 46) | html | pdf |
    - Fig. 2.3.1.7. ( a ) θ–2θ setting at 0° (p. 47) | html | pdf |
    - Fig. 2.3.1.8. Diffractometer profiles (p. 48) | html | pdf |
    - Fig. 2.3.1.9. ( a ) Effect of source size on profile shape, Cu K α, α _ES 1°, α _RS 0.05°, Si(111) (p. 49) | html | pdf |
    - Fig. 2.3.1.10. ( a ) Origin of specimen-related aberrations in focusing plane of conventional reflection specimen diffractometer (Fig. 2.3.1.3) (p. 50) | html | pdf |
    - Fig. 2.3.1.11. Effect of axial divergence on profile shape (p. 50) | html | pdf |
    - Fig. 2.3.1.12. X-ray optics of the transmission specimen with asymmetric focusing monochromator and θ–2θ scanning (p. 51) | html | pdf |
    - Fig. 2.3.1.13. Seemann–Bohlin method (p. 52) | html | pdf |
    - Fig. 2.3.1.14. Optics of θ–θ scanning diffractometer (p. 53) | html | pdf |
    - Fig. 2.3.1.15. Rigaku microdiffractometer for microanalysis (p. 54) | html | pdf |
    - Fig. 2.3.2.1. Method to obtain parallel beam from X-ray tube for powder diffraction (p. 54) | html | pdf |
    - Fig. 2.3.2.2. Silicon powder pattern with 1 Å synchrotron radiation using method shown in Fig. 2.3.2.4( a ) (p. 54) | html | pdf |
    - Fig. 2.3.2.3. Synchrotron-radiation patterns of a mixture of Ni and ZnO powders (p. 55) | html | pdf |
    - Fig. 2.3.2.4. ( a ) Optics of dispersive parallel-beam method for synchrotron X-rays (p. 56) | html | pdf |
    - Fig. 2.3.2.5. Comparison of patterns obtained with a conventional focusing diffractometer ( a ) and ( c ), and synchrotron parallel-beam method ( b ) and ( d ) (p. 57) | html | pdf |
    - Fig. 2.3.2.6. ( a ) and ( c ) Fourier maps of orthorhombic Mg ₂ GeO ₄ calculated directly from profile-fitted synchrotron powder data (p. 57) | html | pdf |
    - Fig. 2.3.2.7. Penetration depth t ' as a function of grazing-incidence angle α for γ-Fe ₂ O ₃ thin film (p. 58) | html | pdf |
    - Fig. 2.3.2.8. Synchrotron diffraction patterns of annealed 5000 Å iron oxide film, λ = 1.75 Å (p. 58) | html | pdf |
    - Fig. 2.3.2.9. ( a )–( d ) High-resolution energy-dispersive diffraction patterns of quartz powder sample obtained with 2θ settings shown in upper left corners (p. 59) | html | pdf |
    - Fig. 2.3.2.10. Specimen orientation for symmetric reflection ( a ) from ( hkl ) planes and ( b ) specimen rotated θ _r for symmetric reflection from ( pqr ) planes (p. 59) | html | pdf |
    - Fig. 2.3.3.1. Differences in relative intensities due to preferred orientation as seen in synchrotron X-ray patterns of m -chlorobenzoic acid obtained with a specimen in reflection and transmission compared with calculated pattern (p. 61) | html | pdf |
    - Fig. 2.3.3.2. Effect of specimen rotation and particle size on Si powder intensity using a conventional diffractometer (Fig. 2.3.1.3) and Cu K α (p. 62) | html | pdf |
    - Fig. 2.3.3.3. Various measures of profile (p. 62) | html | pdf |
    - Fig. 2.3.3.4. Rate-meter strip-chart recordings (p. 63) | html | pdf |
    - Fig. 2.3.3.5. Fig (p. 64) | html | pdf |
    - Fig. 2.3.3.6. Percentage error as a function of the total number of counts N for several confidence levels (p. 64) | html | pdf |
    - Fig. 2.3.3.7. Effect of 4 σ maximum peak height (horizontal line) on dropping weak peaks from inclusion in computer calculation (p. 65) | html | pdf |
    - Fig. 2.3.3.8. ( a ) Si(220) Cu K α reflection (p. 66) | html | pdf |
    - Fig. 2.3.3.9. ( a ) Computer-generated symmetrical Lorentzian profile L and Gaussian G with equal peak heights, 2θ and FWHM (p. 66) | html | pdf |
    - Fig. 2.3.3.10. Profile fitting with sum-of-Lorentzians method (p. 68) | html | pdf |
    - Fig. 2.3.3.11. Profile fitting of poor statistical data (p. 69) | html | pdf |
    - Fig. 2.3.3.12. Some examples of computer graphics of powder patterns (p. 69) | html | pdf |
    - Fig. 2.3.4.1. Powder-camera geometries (p. 70) | html | pdf |
    - Fig. 2.3.5.1. Sealed X-ray diffraction tube (Philips), dimensions are given in mm (p. 71) | html | pdf |
    - Fig. 2.3.5.2. ( a ) Transmission of Be, Al and air as a function of wavelength (p. 73) | html | pdf |
    - Fig. 2.3.5.3. X-ray spectrum of copper target tube with Be window, 50 kV constant potential, 12° take-off angle (p. 75) | html | pdf |
    - Fig. 2.3.5.4. ( a ) Continuous X-ray spectrum of tungsten target X-ray tube as a function of voltage and constant current (p. 76) | html | pdf |
    - Fig. 2.3.5.5. Portion of diffractometer pattern of topaz showing effect of increasing dispersion on separation of peaks (p. 76) | html | pdf |
    - Fig. 2.3.5.6. Crystal monochromators most frequently used in powder diffraction (p. 77) | html | pdf |
  - Tables
    - Table 2.3.3.1. Preferred-orientation data for silicon (p. 61) | html | pdf |
    - Table 2.3.3.2. R (Bragg) values obtained with different preferred-orientation formulae (p. 61) | html | pdf |
    - Table 2.3.5.1. X-ray tube maximum ratings (p. 72) | html | pdf |
    - Table 2.3.5.2. β filters for common target elements (p. 78) | html | pdf |
    - Table 2.3.5.3. Calculated thickness of balanced filters for common target elements (p. 79) | html | pdf |
- 2.4. Powder and related techniques: electron and neutron techniques (pp. 80-83) | html | pdf | chapter contents |
  J. M. Cowley and A. W. Hewat
  - 2.4.1. Electron techniques (pp. 80-82) | html | pdf |
    J. M. Cowley
    - 2.4.1.1. Powder-pattern geometry (p. 80) | html | pdf |
    - 2.4.1.2. Diffraction patterns in electron microscopes (p. 80) | html | pdf |
    - 2.4.1.3. Preferred orientations (p. 80) | html | pdf |
    - 2.4.1.4. Powder-pattern intensities (pp. 80-81) | html | pdf |
    - 2.4.1.5. Crystal-size analysis (p. 81) | html | pdf |
    - 2.4.1.6. Unknown-phase identification: databases (pp. 81-82) | html | pdf |
  - 2.4.2. Neutron techniques (pp. 82-83) | html | pdf |
    A. W. Hewat
  - References | html | pdf |
  - Figures
    - Fig. 2.4.2.1. Schematic drawing of the high-resolution neutron powder diffractometer D2B at ILL, Grenoble (p. 82) | html | pdf |
- 2.5. Energy-dispersive techniques (pp. 84-88) | html | pdf | chapter contents |
  B. Buras, W. I. F. David, L. Gerward, J. D. Jorgensen and B. T. M. Willis
  - 2.5.1. Techniques for X-rays (pp. 84-87) | html | pdf |
    B. Buras and L. Gerward
    - 2.5.1.1. Recording of powder diffraction spectra (p. 84) | html | pdf |
    - 2.5.1.2. Incident X-ray beam (p. 84) | html | pdf |
    - 2.5.1.3. Resolution (p. 85) | html | pdf |
    - 2.5.1.4. Integrated intensity for powder sample (pp. 85-86) | html | pdf |
    - 2.5.1.5. Corrections (p. 86) | html | pdf |
    - 2.5.1.6. The Rietveld method (p. 86) | html | pdf |
    - 2.5.1.7. Single-crystal diffraction (p. 86) | html | pdf |
    - 2.5.1.8. Applications (pp. 86-87) | html | pdf |
  - 2.5.2. White-beam and time-of-flight neutron diffraction (pp. 87-88) | html | pdf |
    J. D. Jorgensen, W. I. F. David and B. T. M. Willis
    - 2.5.2.1. Neutron single-crystal Laue diffraction (p. 87) | html | pdf |
    - 2.5.2.2. Neutron time-of-flight powder diffraction (pp. 87-88) | html | pdf |
  - References | html | pdf |
  - Figures
    - Fig. 2.5.1.1. Standard and conical diffraction geometries: 2θ ₀ = fixed scattering angle (p. 84) | html | pdf |
    - Fig. 2.5.1.2. XED powder spectrum of BaTiO ₃ recorded with synchrotron radiation from the electron storage ring DORIS at DESY-HASYLAB in Hamburg, Germany (p. 84) | html | pdf |
    - Fig. 2.5.1.3. Relative resolution, $[\delta E/E]$ , as function of Bragg angle, $[\theta_0]$ , for two values of the lattice plane spacing: ( a ) 1 Å and ( b ) 0.5 Å (p. 85) | html | pdf |
    - Fig. 2.5.2.1. Construction in reciprocal space to illustrate the use of multi-wavelength radiation in single-crystal diffraction (p. 87) | html | pdf |
- 2.6. Small-angle techniques (pp. 89-112) | html | pdf | chapter contents |
  O. Glatter and R. May
  - 2.6.1. X-ray techniques (pp. 89-104) | html | pdf |
    O. Glatter
    - 2.6.1.1. Introduction (pp. 89-90) | html | pdf |
    - 2.6.1.2. General principles (pp. 90-91) | html | pdf |
    - 2.6.1.3. Monodisperse systems (pp. 91-99) |

International Tables for CrystallographyVolume C: Mathematical, physical and chemical tables

Edited by E. Prince

Contents

International Tables for Crystallography
Volume C: Mathematical, physical and chemical tables