International
Tables for
Crystallography
Volume D
Physical properties of crystals
Edited by A. Authier

International Tables for Crystallography (2006). Vol. D, ch. 1.4, p. 103

Section 1.4.3.4.2. Capacitance methods

H. Küppersa*

aInstitut für Geowissenshaften, Universität Kiel, Olshausenstrasse 40, D-24098 Kiel, Germany
Correspondence e-mail: kueppers@min.uni-kiel.de

1.4.3.4.2. Capacitance methods

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In a way similar to the interferometric methods, the change of the gap between the lower surface of P1 and the upper surface of P2 (Fig. 1.4.3.1[link]) is used to determine the thermal expansion of the sample. This gap – with electrically conducting surfaces – is used as the capacitance in an electric circuit with a fixed inductance. The change of capacitance leads to a change of resonance frequency, which is measured.








































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