International Tables for Crystallography (2013). Vol. D, ch. 1.4, pp. 100-105
doi: 10.1107/97809553602060000903

Chapter 1.4. Thermal expansion

Contents

  • 1.4. Thermal expansion  (pp. 100-105) | html | pdf | chapter contents |
    • 1.4.1. Definition, symmetry and representation surfaces  (pp. 100-101) | html | pdf |
    • 1.4.2. Grüneisen relation  (pp. 101-102) | html | pdf |
    • 1.4.3. Experimental methods  (pp. 102-104) | html | pdf |
      • 1.4.3.1. General remarks  (pp. 102-103) | html | pdf |
      • 1.4.3.2. Diffraction  (p. 103) | html | pdf |
      • 1.4.3.3. Optical methods (interferometry)  (pp. 103-104) | html | pdf |
      • 1.4.3.4. Electrical methods  (p. 104) | html | pdf |
        • 1.4.3.4.1. Inductance changes (pushrod dilatometry)  (p. 104) | html | pdf |
        • 1.4.3.4.2. Capacitance methods  (p. 104) | html | pdf |
    • 1.4.4. Relation to crystal structure  (pp. 104-105) | html | pdf |
    • 1.4.5. Glossary  (p. 105) | html | pdf |
    • References | html | pdf |
    • Figures
      • Fig. 1.4.1.1. Sections ( ac plane) of representation surfaces for a trigonal (or tetragonal or hexagonal) crystal  (p. 100) | html | pdf |
      • Fig. 1.4.3.1. Schematic diagram of a Fizeau interferometer  (p. 104) | html | pdf |
      • Fig. 1.4.3.2. Schematic diagram of a Michelson interferometer  (p. 104) | html | pdf |
    • Tables
      • Table 1.4.1.1. Shape of the quadric and symmetry restrictions  (p. 101) | html | pdf |