International Tables for Crystallography (2006). Vol. F, ch. 11.2, pp. 212-217   | 1 | 2 |
doi: 10.1107/97809553602060000675

Chapter 11.2. Integration of macromolecular diffraction data

Contents

  • 11.2. Integration of macromolecular diffraction data  (pp. 212-217) | html | pdf | chapter contents |
    • 11.2.1. Introduction  (p. 212) | html | pdf |
    • 11.2.2. Prerequisites for accurate integration  (p. 212) | html | pdf |
      • 11.2.2.1. Crystal parameters  (p. 212) | html | pdf |
      • 11.2.2.2. Detector parameters  (p. 212) | html | pdf |
    • 11.2.3. Methods of integration  (p. 212) | html | pdf |
    • 11.2.4. The measurement box  (pp. 212-213) | html | pdf |
    • 11.2.5. Integration by simple summation  (pp. 213-214) | html | pdf |
      • 11.2.5.1. Determination of the best background plane  (p. 213) | html | pdf |
        • 11.2.5.1.1. Outlier rejection  (p. 213) | html | pdf |
      • 11.2.5.2. Evaluating the integrated intensity and standard deviation  (pp. 213-214) | html | pdf |
      • 11.2.5.3. The effect of instrument or detector errors  (p. 214) | html | pdf |
    • 11.2.6. Integration by profile fitting  (pp. 214-217) | html | pdf |
      • 11.2.6.1. Forming the standard profiles  (pp. 214-215) | html | pdf |
      • 11.2.6.2. Evaluation of the profile-fitted intensity  (p. 215) | html | pdf |
      • 11.2.6.3. Modifications for very close spots  (pp. 215-216) | html | pdf |
      • 11.2.6.4. Profile fitting very strong reflections  (p. 216) | html | pdf |
      • 11.2.6.5. Profile fitting very weak reflections  (p. 216) | html | pdf |
      • 11.2.6.6. Improvement provided by profile fitting weak reflections  (p. 216) | html | pdf |
      • 11.2.6.7. Other benefits of profile fitting  (pp. 216-217) | html | pdf |
        • 11.2.6.7.1. Incompletely resolved spots  (p. 216) | html | pdf |
        • 11.2.6.7.2. Elimination of peak pixel outliers  (p. 216) | html | pdf |
        • 11.2.6.7.3. Estimation of overloaded reflections  (pp. 216-217) | html | pdf |
      • 11.2.6.8. Profile fitting partially recorded reflections  (p. 217) | html | pdf |
      • 11.2.6.9. Systematic errors in profile-fitted intensities  (p. 217) | html | pdf |
    • References | html | pdf |
    • Figures
      • Fig. 11.2.4.1. The measurement-box definition used in MOSFLM   (p. 213) | html | pdf |