International Tables for Crystallography

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You have followed a link to material from the 2012 edition of International Tables for Crystallography Volume F. If you would like to update your licence to include this material please contact support@iucr.org. If you have a licence for the 2006 edition of this volume please follow the link below to access material from it:

International Tables for Crystallography (2006). Vol. F, Section 11.6.2.4
XDS
W. Kabsch. International Tables for Crystallography (2012). Vol. F, ch. 11.6, pp. 304-310  [ doi:10.1107/97809553602060000835 ]

Abstract

The usage and control of recent modifications of the program package XDS for the processing of rotation images are described in the context of previous versions. New features include automatic determination of spot size and reflecting range, and recognition and assignment of crystal symmetry. Moreover, the limitations of earlier package versions on the number of correction/scaling factors and the representation of pixel contents have been removed. Large program parts have been restructured for parallel processing so that the quality and completeness of collected data can be assessed soon after measurement.


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About International Tables for Crystallography

International Tables for Crystallography is the definitive resource and reference work for crystallography. The multi-volume series comprises articles and tables of data relevant to crystallographic research and to applications of crystallographic methods in all sciences concerned with the structure and properties of materials.