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Computation of dynamical wave amplitudes
International Tables for Crystallography (2006). Vol. C, Section 4.3.6, pp. 414-416 [ doi:10.1107/97809553602060000593 ]
... structure axes are often chosen or transformed such that the c axis is parallel to z and the a and b ... For simplicity, the equation is given for orthogonal axes and h'', k'' are the usually non-integral intercepts of the Laue ... beam voltage, v is the relativistic velocity of the electron, c is the velocity of light, and [lambda] is the ...
Overview
International Tables for Crystallography (2016). Vol. A, Section 1.6.1, p. 107 [ doi:10.1107/97809553602060000924 ]
... twinned crystals and those displaying a specialized metric. References Flack, H. D. (2015). Methods of space-group determination - a supplement ...
Methods of space-group determination
International Tables for Crystallography (2016). Vol. A, ch. 1.6, pp. 107-131 [ doi:10.1107/97809553602060000924 ]
... and ) is given bywhere the atomic scattering factor of atom j, taking into account resonant scattering, is given bythe wavelength-dependent ... real and imaginary parts, respectively, of the contribution of atom j to the resonant scattering, h contains in the (row) matrix (1 × 3) the diffraction ...
Electron diffraction and electron microscopy in structure determination
International Tables for Crystallography (2010). Vol. B, ch. 2.5, pp. 297-402 [ doi:10.1107/97809553602060000767 ]
... to X-ray diffraction, the fundamental theory is presented by J. M. Cowley in Section 2.5.2. Unlike X-rays, which diffract ... data free of defects, bending or thickness variation. 2.5.1. Foreword J. M. Cowley a andJ. C. H. Spence b Given that electrons have wave properties ...
Alternative methods
International Tables for Crystallography (2006). Vol. C, Section 4.3.8.7, pp. 427-428 [ doi:10.1107/97809553602060000593 ]
... an exact, non-perturbative inversion scheme for dynamical electron diffraction (Spence, 1998). The detection of secondary radiations (light, X-rays ... scattering of these inelastically scattered electrons (Endoh, Hashimoto & Makita, 1994; Spence & Lynch, 1982). Reflection electron microscopy (REM) has been shown ... high-resolution surface structure imaging considerably. References Binnig, G., Rohrer, H., Gerber, C. & Weibel, E. (1983). Direct imaging of ...
[more results from section 4.3.8 in volume C]
Space groups for nanocrystals by electron microscopy
International Tables for Crystallography (2016). Vol. A, Section 1.6.6, pp. 128-129 [ doi:10.1107/97809553602060000924 ]
... in the location of their symmetry elements) are discussed in Spence & Lynch (1982), Eades (1988), and Saitoh et al. (2001). ... wurtzite structure of ZnO, with the beam normal to the c axis (Wang et al., 2003). The intensity variation along ... line running through the centres of these discs (along the c axis) is not an even function, strongly violating Friedel' ...
International Tables for Crystallography (2006). Vol. C, Section 4.3.6, pp. 414-416 [ doi:10.1107/97809553602060000593 ]
... structure axes are often chosen or transformed such that the c axis is parallel to z and the a and b ... For simplicity, the equation is given for orthogonal axes and h'', k'' are the usually non-integral intercepts of the Laue ... beam voltage, v is the relativistic velocity of the electron, c is the velocity of light, and [lambda] is the ...
Overview
International Tables for Crystallography (2016). Vol. A, Section 1.6.1, p. 107 [ doi:10.1107/97809553602060000924 ]
... twinned crystals and those displaying a specialized metric. References Flack, H. D. (2015). Methods of space-group determination - a supplement ...
Methods of space-group determination
International Tables for Crystallography (2016). Vol. A, ch. 1.6, pp. 107-131 [ doi:10.1107/97809553602060000924 ]
... and ) is given bywhere the atomic scattering factor of atom j, taking into account resonant scattering, is given bythe wavelength-dependent ... real and imaginary parts, respectively, of the contribution of atom j to the resonant scattering, h contains in the (row) matrix (1 × 3) the diffraction ...
Electron diffraction and electron microscopy in structure determination
International Tables for Crystallography (2010). Vol. B, ch. 2.5, pp. 297-402 [ doi:10.1107/97809553602060000767 ]
... to X-ray diffraction, the fundamental theory is presented by J. M. Cowley in Section 2.5.2. Unlike X-rays, which diffract ... data free of defects, bending or thickness variation. 2.5.1. Foreword J. M. Cowley a andJ. C. H. Spence b Given that electrons have wave properties ...
Alternative methods
International Tables for Crystallography (2006). Vol. C, Section 4.3.8.7, pp. 427-428 [ doi:10.1107/97809553602060000593 ]
... an exact, non-perturbative inversion scheme for dynamical electron diffraction (Spence, 1998). The detection of secondary radiations (light, X-rays ... scattering of these inelastically scattered electrons (Endoh, Hashimoto & Makita, 1994; Spence & Lynch, 1982). Reflection electron microscopy (REM) has been shown ... high-resolution surface structure imaging considerably. References Binnig, G., Rohrer, H., Gerber, C. & Weibel, E. (1983). Direct imaging of ...
[more results from section 4.3.8 in volume C]
Space groups for nanocrystals by electron microscopy
International Tables for Crystallography (2016). Vol. A, Section 1.6.6, pp. 128-129 [ doi:10.1107/97809553602060000924 ]
... in the location of their symmetry elements) are discussed in Spence & Lynch (1982), Eades (1988), and Saitoh et al. (2001). ... wurtzite structure of ZnO, with the beam normal to the c axis (Wang et al., 2003). The intensity variation along ... line running through the centres of these discs (along the c axis) is not an even function, strongly violating Friedel' ...
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