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 Results for DC.creator="J." AND DC.creator="C." AND DC.creator="H." AND DC.creator="Spence"
Computation of dynamical wave amplitudes
Colliex, C., Cowley, J. M., Dudarev, S. L., Fink, M., Gjønnes, J., Hilderbrandt, R., Howie, A., Lynch, D. F., Peng, L. M., Ren, G., Ross, A. W., Smith, V. H. Jr, Spence, J. C. H., Steeds, J. W., Wang, J., Whelan, M. J. and Zvyagin, B. B.  International Tables for Crystallography (2006). Vol. C, Section 4.3.6, pp. 414-416 [ doi:10.1107/97809553602060000593 ]
... structure axes are often chosen or transformed such that the c axis is parallel to z and the a and b ... For simplicity, the equation is given for orthogonal axes and h'', k'' are the usually non-integral intercepts of the Laue ... beam voltage, v is the relativistic velocity of the electron, c is the velocity of light, and [lambda] is the ...

Shmueli, U., Flack, H. D. and Spence, J. C. H  International Tables for Crystallography (2016). Vol. A, Section 1.6.1, p. 107 [ doi:10.1107/97809553602060000924 ]
... twinned crystals and those displaying a specialized metric. References Flack, H. D. (2015). Methods of space-group determination - a supplement ...

Methods of space-group determination
Shmueli, U., Flack, H. D. and Spence, J. C. H  International Tables for Crystallography (2016). Vol. A, ch. 1.6, pp. 107-131 [ doi:10.1107/97809553602060000924 ]
... and ) is given bywhere the atomic scattering factor of atom j, taking into account resonant scattering, is given bythe wavelength-dependent ... real and imaginary parts, respectively, of the contribution of atom j to the resonant scattering, h contains in the (row) matrix (1 × 3) the diffraction ...

Electron diffraction and electron microscopy in structure determination
Cowley, J. M., Spence, J. C. H., Tanaka, M., Vainshtein, B. K., Zvyagin, B. B., Penczek, P. A. and Dorset, D. L.  International Tables for Crystallography (2010). Vol. B, ch. 2.5, pp. 297-402 [ doi:10.1107/97809553602060000767 ]
... to X-ray diffraction, the fundamental theory is presented by J. M. Cowley in Section 2.5.2. Unlike X-rays, which diffract ... data free of defects, bending or thickness variation. 2.5.1. Foreword J. M. Cowley a andJ. C. H. Spence b Given that electrons have wave properties ...

Alternative methods
Spence, J. C. H. and Cowley, J. M.  International Tables for Crystallography (2006). Vol. C, Section, pp. 427-428 [ doi:10.1107/97809553602060000593 ]
... an exact, non-perturbative inversion scheme for dynamical electron diffraction (Spence, 1998). The detection of secondary radiations (light, X-rays ... scattering of these inelastically scattered electrons (Endoh, Hashimoto & Makita, 1994; Spence & Lynch, 1982). Reflection electron microscopy (REM) has been shown ... high-resolution surface structure imaging considerably. References Binnig, G., Rohrer, H., Gerber, C. & Weibel, E. (1983). Direct imaging of ...
     [more results from section 4.3.8 in volume C]

Space groups for nanocrystals by electron microscopy
Spence, J. C. H  International Tables for Crystallography (2016). Vol. A, Section 1.6.6, pp. 128-129 [ doi:10.1107/97809553602060000924 ]
... in the location of their symmetry elements) are discussed in Spence & Lynch (1982), Eades (1988), and Saitoh et al. (2001). ... wurtzite structure of ZnO, with the beam normal to the c axis (Wang et al., 2003). The intensity variation along ... line running through the centres of these discs (along the c axis) is not an even function, strongly violating Friedel' ...

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