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Detectors for X-rays
Amemiya, Y., Arndt, U. W., Buras, B., Chikawa, J., Gerward, L., Langford, J. I., Parrish, W. and Wolff, P. M. de  International Tables for Crystallography (2006). Vol. C, ch. 7.1, pp. 618-638 [ doi:10.1107/97809553602060000604 ]
... for obliquity (Whittaker, 1953; Hellner, 1954). 7.1.2. Geiger counters2 | | W. Parrish f++ andJ. I. Langford e Geiger-Müller counters (Geiger ... A. X-rays enter at a low-absorption end window W, made of mica about 0.013mm thick or other suitable ...

Quantum-counting efficiency and linearity
Parrish, W. and Langford, J. I.  International Tables for Crystallography (2006). Vol. C, Section 7.1.4.4, pp. 621-622 [ doi:10.1107/97809553602060000604 ]
Quantum-counting efficiency and linearity 7.1.4.4. Quantum-counting efficiency and linearity The quantum-counting efficiency E of the detector, its variation with wavelength, and electronic discrimination determine the response to the X-ray spectrum. E is determined by where fT is the fraction of the incident radiation transmitted by the window ...
     [more results from section 7.1.4 in volume C]

Resolution, discrimination, efficiency
Parrish, W. and Langford, J. I.  International Tables for Crystallography (2006). Vol. C, Section 7.1.3.4, p. 619 [ doi:10.1107/97809553602060000604 ]
Resolution, discrimination, efficiency 7.1.3.4. Resolution, discrimination, efficiency The topics of energy resolution, pulse-height discrimination, quantum-counting efficiency, and linearity are common to proportional, scintillation and solid-state counters, and are treated in Subsections 7.1.4.3.-7.1.4.5. References International Tables for Crystallography (2006). Vol. C, ch. 7.1, p. 619 © International Union ...
     [more results from section 7.1.3 in volume C]

Geiger counters
Parrish, W. and Langford, J. I.  International Tables for Crystallography (2006). Vol. C, Section 7.1.2, pp. 618-619 [ doi:10.1107/97809553602060000604 ]
... A. X-rays enter at a low-absorption end window W, made of mica about 0.013mm thick or other suitable material ... The arrows X show direction of incident X-ray beam, W thin window, C cathode, A anode, SC scintillation crystal, PT ... in Sections 7.1.3.-7.1.8. References Eastabrook, J. N. & Hughes, J. W. (1953). Elimination of dead-time corrections in monitored ...

Powder and related techniques: X-ray techniques
Parrish, W. and Langford, J. I.  International Tables for Crystallography (2006). Vol. C, ch. 2.3, pp. 42-79 [ doi:10.1107/97809553602060000578 ]
... resolution diffractometers which greatly expanded the use of the method (Parrish, 1949; Parrish, Hamacher & Lowitzsch, 1954). The replacement of film by the ... of the powder method in the USA was written by Parrish (1983). The following description includes only the most ...

Factors determining accuracy
Parrish, W., Wilson, A. J. C. and Langford, J. I.  International Tables for Crystallography (2006). Vol. C, Section 5.2.13, pp. 501-504 [ doi:10.1107/97809553602060000596 ]
... been used in parallel-beam synchrotron-radiation lattice-parameter studies (Parrish et al., 1987). (3) The profile shape has a ... parameter refinement. Powder Diffr. 1, 66-76. Jenkins, R. & Schreiner, W. N. (1986). Considerations in the design of goniometers for ... programs for lattice-parameter refinement and calculations. British Crystallographic Association. Parrish, W., Hart, M., Huang, T. C. & Bellotto, M. (1987) ...

Instrumental line-profile-shape standards
Parrish, W., Wilson, A. J. C. and Langford, J. I.  International Tables for Crystallography (2006). Vol. C, Section 5.2.12, p. 501 [ doi:10.1107/97809553602060000596 ]
... C. E., Brownell, S. J., Zhang, Y., Hubbard, C., Schreiner, W., Hamill, G. P., Huang, T. C., Sabino, E., Langford, J. ...

Intensity standards
Parrish, W., Wilson, A. J. C. and Langford, J. I.  International Tables for Crystallography (2006). Vol. C, Section 5.2.11, p. 500 [ doi:10.1107/97809553602060000596 ]
Intensity standards 5.2.11. Intensity standards The measurement of intensity falls within the scope of Parts 6 and 7 . However, powder methods are much used in quantitative analysis, and the National Institute of Standards and Technology provides five standards for use as internal standards for this purpose and for checking the ...

Powder-diffraction standards
Parrish, W., Wilson, A. J. C. and Langford, J. I.  International Tables for Crystallography (2006). Vol. C, Section 5.2.10, pp. 498-499 [ doi:10.1107/97809553602060000596 ]
... from three factors: uncertainties in the lattice parameters of the W and Ag internal standards, the experimental precision, and the methods ... reference material. J. Appl. Cryst. 8, 45-48. Wong-Ng, W. & Hubbard, C. R. (1987). Standard reference materials for X ...

Testing for remanent systematic error
Parrish, W., Wilson, A. J. C. and Langford, J. I.  International Tables for Crystallography (2006). Vol. C, Section 5.2.9, p. 498 [ doi:10.1107/97809553602060000596 ]
... in different laboratories) is lower. The IUCr lattice-parameter project (Parrish, 1960) showed a standard deviation of 1 in 30000 in ... J. C. Wilson, pp. 151-181. Guilderland, NY: Adenine Press. Parrish, W. (1960). Results of the IUCr precision lattice-parameter ...

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