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DENZO and SCALEPACK
Otwinowski, Z., Minor, W., Borek, D. and Cymborowski, M.  International Tables for Crystallography (2012). Vol. F, ch. 11.4, pp. 282-295 [ doi:10.1107/97809553602060000833 ]
... ray diffraction data analysis, as performed by the HKL package (Otwinowski, 1993; Otwinowski & Minor, 1997) or similar programs (Rossmann, 1979; Leslie & Tsukihara, 1980 ... of the reciprocal lattice tends to be the most reliable (Otwinowski & Minor, 1997; Steller et al., 1997). Autoindexing starts ...

HKL-2000 and HKL-3000
Otwinowski, Z., Minor, W., Borek, D. and Cymborowski, M.  International Tables for Crystallography (2012). Vol. F, Section 11.4.12, pp. 292-294 [ doi:10.1107/97809553602060000833 ]
... events. Biophys. J. 95, 1-9. Grabowski, M., Joachimiak, A., Otwinowski, Z. & Minor, W. (2007). Structural genomics: keeping up with expanding ... Opin. Struct. Biol. 17, 347-353. Minor, W., Cymborowski, M. & Otwinowski, Z. (2002). Automatic system for crystallographic data collection ...

Detector diagnostics
Otwinowski, Z., Minor, W., Borek, D. and Cymborowski, M.  International Tables for Crystallography (2012). Vol. F, Section 11.4.11, p. 292 [ doi:10.1107/97809553602060000833 ]
... tools that can detect possible detector or experimental setup problems (Otwinowski & Minor, 1997; Otwinowski et al., 2003). Visual inspection of the image may ... indicating saturation of the data-acquisition hardware or software. References Otwinowski, Z. & Minor, W. (1997). Processing of X-ray ...

Merging and signal validation
Otwinowski, Z., Minor, W., Borek, D. and Cymborowski, M.  International Tables for Crystallography (2012). Vol. F, Section 11.4.10.3, p. 292 [ doi:10.1107/97809553602060000833 ]
... . References Borek, D., Cymborowski, M., Machius, M., Minor, W. & Otwinowski, Z. (2010). Diffraction data analysis in the presence of radiation ... 436. Borek, D., Ginell, S. L., Cymborowski, M., Minor, W. & Otwinowski, Z. (2007). The many faces of radiation-induced ...
     [more results from section 11.4.10 in volume F]

Global refinement or post refinement
Otwinowski, Z., Minor, W., Borek, D. and Cymborowski, M.  International Tables for Crystallography (2012). Vol. F, Section 11.4.9, p. 291 [ doi:10.1107/97809553602060000833 ]
Global refinement or post refinement 11.4.9. Global refinement or post refinement The process of refining crystal parameters using the combined reflection intensity measurements is known as global refinement or post refinement (Rossmann, 1979; Evans, 1993). The implementation of this method in SCALEPACK allows for separate refinement of the orientation of ...

Stabilization of scaling parameters based on prior knowledge
Otwinowski, Z., Minor, W., Borek, D. and Cymborowski, M.  International Tables for Crystallography (2012). Vol. F, Section 11.4.8.2, pp. 290-291 [ doi:10.1107/97809553602060000833 ]
Stabilization of scaling parameters based on prior knowledge 11.4.8.2. Stabilization of scaling parameters based on prior knowledge The unknown parameters in equation (11.4.8.4) are estimated with various level of uncertainty depending on the multiplicity of observations and how symmetry-equivalent reflections are related to each other. Potentially, this may result in ...
     [more results from section 11.4.8 in volume F]

Integration of diffraction maxima by profile fitting
Otwinowski, Z., Minor, W., Borek, D. and Cymborowski, M.  International Tables for Crystallography (2012). Vol. F, Section 11.4.7, p. 289 [ doi:10.1107/97809553602060000833 ]
... this function defines the value of the profile-fitted intensity (Otwinowski & Minor, 1997): References Otwinowski, Z. & Minor, W. (1997). Processing of X-ray diffraction ...

Detector distortions
Otwinowski, Z., Minor, W., Borek, D. and Cymborowski, M.  International Tables for Crystallography (2012). Vol. F, Section 11.4.6.3, p. 289 [ doi:10.1107/97809553602060000833 ]
Detector distortions 11.4.6.3. Detector distortions The design of detectors results in pixels not being positioned on an exact square or rectangular grid. A correct understanding of the detector distortions is essential to accurate positional refinement. The types of distortions are detector-specific. The primary sources of error include misalignment of the ...
     [more results from section 11.4.6 in volume F]

Refinement and calibration
Otwinowski, Z., Minor, W., Borek, D. and Cymborowski, M.  International Tables for Crystallography (2012). Vol. F, Section 11.4.5.12, p. 288 [ doi:10.1107/97809553602060000833 ]
Refinement and calibration 11.4.5.12. Refinement and calibration Both the refinement and calibration procedures determine the properties of the instrument. The principal difference between refinement and calibration is that calibration is performed with data not obtained during the current diffraction experiment, and refinement uses data obtained during the current diffraction experiment. DENZO ...
     [more results from section 11.4.5 in volume F]

Beam-2[theta]
Otwinowski, Z., Minor, W., Borek, D. and Cymborowski, M.  International Tables for Crystallography (2012). Vol. F, Section 11.4.4.4, p. 285 [ doi:10.1107/97809553602060000833 ]
Beam-2[theta] 11.4.4.4. Beam-2[theta] The description of generalized multiple-axis goniostats introduced a conceptual change in the DENZO coordinate system. The data-collection axis can be oriented in any direction, so in principle rotx, roty and rotz no longer need to be defined relative to the data-collection ...
     [more results from section 11.4.4 in volume F]

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