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 Results for DC.creator="B." AND DC.creator="H." AND DC.creator="Toby" in section 3.3.10 of volume G
Phase identification and indexing
Toby, B. H.  International Tables for Crystallography (2006). Vol. G, Section 3.3.10.2, pp. 129-130 [ doi:10.1107/97809553602060000735 ]
Phase identification and indexing 3.3.10.2. Phase identification and indexing For phase identification, a CIF will include unprocessed measurements, as described in Section 3.3.8. Sample characterization information, for example chemical analysis information, can often aid phase determination. Characterization information is described in Section 3.3.4.1. Similarly, sample preparation information can also be quite ...

Simulated intensities
Toby, B. H.  International Tables for Crystallography (2006). Vol. G, Section 3.3.10.1, p. 129 [ doi:10.1107/97809553602060000735 ]
Simulated intensities 3.3.10.1. Simulated intensities It is common to simulate a diffraction pattern from a known or hypothetical structural model. The structural model is recorded in CIF using core data items, such as _atom_site_label, _atom_site_fract_x, _atom_site_fract_y, _atom_site_fract_z, _atom_site_U ...

Other pdCIF applications
Toby, B. H.  International Tables for Crystallography (2006). Vol. G, Section 3.3.10, pp. 129-130 [ doi:10.1107/97809553602060000735 ]
Other pdCIF applications 3.3.10. Other pdCIF applications As mentioned above, there are other applications for pdCIF than the storage of unprocessed measurements and the reporting of the results of a Rietveld refinement. This section describes the use of data items in other common pdCIF applications. 3.3.10.1. Simulated intensities | | It is common ...

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