International
Tables for
Crystallography
Volume B
Reciprocal space
Edited by U. Shmueli

International Tables for Crystallography (2006). Vol. B. ch. 4.2, p. 435   | 1 | 2 |

Section 4.2.4.4.7. Small concentrations of defects

H. Jagodzinskia and F. Freyb

aInstitut für Kristallographie und Mineralogie, Universität, Theresienstrasse 41, D-8000 München 2, Germany, and  bInstitut für Kristallographie und Mineralogie, Universität, Theresienstrasse 41, D-8000 München 2, Germany

4.2.4.4.7. Small concentrations of defects

| top | pdf |

In the literature small concentrations are treated in terms of fluctuations of the functions [\pi_{{\bf n}\nu}] as defined in equation (4.2.4.56)[link]. Generally we prefer the introduction of the distribution function of the defects or clusters. Since this problem has already been treated in Section 4.2.4.4.3[link] only some very brief remarks are given here. The most convenient way to derive the distribution function correctly from experimental data is the use of low-angle scattering which generally shows one or more clear maxima caused by partly periodic properties of the distribution function. For the deconvolution of the distribution function, received by Fourier transformation of the corrected diffused low-angle scattering, the reader is referred to the relevant literature. Since deconvolutions are not unique some reasonable assumptions are necessary for the final solution. Anomalous scattering may be very helpful if applicable.








































to end of page
to top of page