Figure 2.3.1.1

Parrish, W.; Langford, J. I.

doi:10.1107/97809553602060000578

International
Tables for
Crystallography
Volume C
Mathematical, physical and chemical tables
Edited by E. Prince

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International Tables for Crystallography (2006). Vol. C. ch. 2.3, p. 43

Figure 2.3.1.1

W. Parrish^a ^‡ and J. I. Langford^b

^a IBM Almaden Research Center, San Jose, CA, USA, and ^bSchool of Physics & Astronomy, University of Birmingham, Birmingham B15 2TT, England

Figure 2.3.1.1

Basic arrangements of focusing diffractometer methods. Simplified and not to scale; detailed drawings shown in later figures. (a)–(e) operate with θ–2θ scanning; (f) fixed specimen with detector scanning. F line focus of X-ray tube (normal to plane of drawings), F′ focus of incident-beam monochromator, PS parallel slits (to limit axial divergence), ES entrance (divergence) slit, ESM entrance slit for monochromator, S specimen, RS receiving slit, AS antiscatter slit, D detector, SFC specimen focusing circle, M focusing monochromator. Other symbols described in text.