International
Tables for
Crystallography
Volume C
Mathematical, physical and chemical tables
Edited by E. Prince

International Tables for Crystallography (2006). Vol. C. ch. 2.3, p. 48

Figure 2.3.1.8 

W. Parrisha and J. I. Langfordb

a IBM Almaden Research Center, San Jose, CA, USA, and bSchool of Physics & Astronomy, University of Birmingham, Birmingham B15 2TT, England

[Figure 2.3.1.8]
Figure 2.3.1.8

Diffractometer profiles. (a) and (b) Spectral profiles λ of Cu Kα doublet (dashed-line profiles) inside experimental profiles R (solid line). (c)–(f) Experimental profiles with reflection specimen (R) geometry (Fig. 2.3.1.3[link]) with αES 1° and αRS 0.046° (solid line profiles), and transmission specimen (T) (Fig. 2.3.1.12[link]) with αES 2° and receiving axial divergence parallel slits (dotted profiles). Cu Kα radiation. (a) Si(531), (b) quartz(100), (c) Si(111), (d) Si(220), (e) Si(311), and (f) Si(422).