International
Tables for
Crystallography
Volume C
Mathematical, physical and chemical tables
Edited by E. Prince

International Tables for Crystallography (2006). Vol. C. ch. 2.3, p. 54

Figure 2.3.2.2 

W. Parrisha and J. I. Langfordb

a IBM Almaden Research Center, San Jose, CA, USA, and bSchool of Physics & Astronomy, University of Birmingham, Birmingham B15 2TT, England

[Figure 2.3.2.2]
Figure 2.3.2.2

Silicon powder pattern with 1 Å synchrotron radiation using method shown in Fig. 2.3.2.4(a)[link]. The 444 reflection is the limit for Cu Kα radiation.