International
Tables for Crystallography Volume C Mathematical, physical and chemical tables Edited by E. Prince © International Union of Crystallography 2006 |
International Tables for Crystallography (2006). Vol. C. ch. 2.3, p. 58
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Figure 2.3.2.8
Synchrotron diffraction patterns of annealed 5000 Å iron oxide film, λ = 1.75 Å, (a) θ–2θ scan; relative intensities of random powder sample shown above each reflection. (b) Grazing incidence pattern of same film with α = 0.25° showing only reflections from top 60 Å of film, superstructure peak S.S. and α-Fe2O3 peaks not seen in (a). Absolute intensity is an order of magnitude lower than (a). |