International
Tables for
Crystallography
Volume C
Mathematical, physical and chemical tables
Edited by E. Prince

International Tables for Crystallography (2006). Vol. C. ch. 2.3, p. 58

Figure 2.3.2.8 

W. Parrisha and J. I. Langfordb

a IBM Almaden Research Center, San Jose, CA, USA, and bSchool of Physics & Astronomy, University of Birmingham, Birmingham B15 2TT, England

[Figure 2.3.2.8]
Figure 2.3.2.8

Synchrotron diffraction patterns of annealed 5000 Å iron oxide film, λ = 1.75 Å, (a) θ–2θ scan; relative intensities of random powder sample shown above each reflection. (b) Grazing incidence pattern of same film with α = 0.25° showing only reflections from top 60 Å of film, superstructure peak S.S. and α-Fe2O3 peaks not seen in (a). Absolute intensity is an order of magnitude lower than (a).