International
Tables for
Crystallography
Volume C
Mathematical, physical and chemical tables
Edited by E. Prince

International Tables for Crystallography (2006). Vol. C. ch. 2.3, p. 59

Figure 2.3.2.9 

W. Parrisha and J. I. Langfordb

a IBM Almaden Research Center, San Jose, CA, USA, and bSchool of Physics & Astronomy, University of Birmingham, Birmingham B15 2TT, England

[Figure 2.3.2.9]
Figure 2.3.2.9

(a)–(d) High-resolution energy-dispersive diffraction patterns of quartz powder sample obtained with 2θ settings shown in upper left corners. (e) d range as a function of detector 2θ setting for λ = 0.4 to 2 Å. (f) Effect of 2θ setting and E on profile widths of quartz. Right: 121 reflection, 20°2θ, Ep 10.45 keV; left: 100 reflection, 45°2θ, ep 8.35; both reflections broadened by X-ray optics and peak intensity of 100 twice that of 121.