Figure 2.3.5.4

Parrish, W.; Langford, J. I.

doi:10.1107/97809553602060000578

International
Tables for
Crystallography
Volume C
Mathematical, physical and chemical tables
Edited by E. Prince

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International Tables for Crystallography (2006). Vol. C. ch. 2.3, p. 76

Figure 2.3.5.4

W. Parrish^a ^‡ and J. I. Langford^b

^a IBM Almaden Research Center, San Jose, CA, USA, and ^bSchool of Physics & Astronomy, University of Birmingham, Birmingham B15 2TT, England

Figure 2.3.5.4

(a) Continuous X-ray spectrum of tungsten target X-ray tube as a function of voltage and constant current. Full-wave rectification, silicon (111) crystal analyser, scintillation counter. (b) Plot of Moseley's law for four characteristic X-ray spectral lines.