Figure 2.9.2.3

Smith, G. S.; Majkrzak, C. F.

doi:10.1107/97809553602060000584

International
Tables for
Crystallography
Volume C
Mathematical, physical and chemical tables
Edited by E. Prince

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International Tables for Crystallography (2006). Vol. C. ch. 2.9, p. 127

Figure 2.9.2.3

G. S. Smith^a and C. F. Majkrzak^b

^a Manuel Lujan Jr Neutron Scattering Center, Los Alamos National Laboratory, Los Alamos, NM 87545, USA, and ^bNIST Center for Neutron Research, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA

Figure 2.9.2.3

Neutron reflectivities calculated for an infinite Si substrate (dashed line) and 1000 Å Ni film on an Si substrate (solid line).