International
Tables for
Crystallography
Volume C
Mathematical, physical and chemical tables
Edited by E. Prince

International Tables for Crystallography (2006). Vol. C. ch. 3.4, pp. 162-163

Section 3.4.1.2.2. Non-ambient conditions

P. F. Lindleya

a ESRF, Avenue des Martyrs, BP 220, F-38043 Grenoble CEDEX, France

3.4.1.2.2. Non-ambient conditions

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A number of devices have recently been described to study polycrystalline specimens under non-ambient conditions. Rink, Mathias & Schlenoff (1994[link]) have designed a portable sample housing for work at room temperature with samples that are air or moisture sensitive. A review of designs and desirable features for high-temperature furnaces suitable for X-ray diffractometers has been given by McKinstry (1970[link]). More recently, Puxley, Squire & Bates (1994[link]) have described an in situ cell fitted to a Siemens D-500 powder diffractometer that allows samples in flowing or static reactive gas environments at atmospheric pressure and at temperatures up to 1273 K. These authors also review other developments in the field of high-temperature furnaces for polycrystalline X-ray diffraction published since the McKinstry article in 1970. Brown, Swapp, Bennett & Navrotsky (1993[link]) have devised methods to minimize the uncertainties in temperature at the sample and in the position of the sample itself. Tarling, Barnes & Mackay (1984[link]) have adapted a Guinier–Lenné high-temperature powder camera to include a gas rinsing system and a specially designed mini-environment cell in which conditions of industrial furnacing can be simulated. In the neutron area, Lorenz, Neder, Marxreiter, Frey & Schneider (1993[link]) have developed a mirror furnace working at up to 2300 K and suitable for polycrystalline or single-crystal samples.

A comprehensive account of cryogenic studies pertinent to both polycrystalline and single-crystal samples is given by Rudman (1976[link]). Nieman, Evans, Heal & Powell (1984[link]) have described a device for the preparation of low-temperature samples of noxious materials. The device is enclosed in a vanadium can and is therefore only suitable for neutron diffraction studies. Ihringer & Küster (1993[link]) have described a cryostat for powder diffraction, temperature range 8–300 K, for use on a synchrotron-radiation beam line at HASYLAB, Germany (Arnold et al., 1989[link]).)

References

First citation Arnold, H., Bartl, H., Fuess, H., Ihringer, J., Kosten, K., Löchner, U., Pennartz, P. U., Prandl, W. & Wroblewski, T. (1989). New powder diffractometer at HASYLAB/DESY. Rev. Sci. Instrum. 60, 2380–2381.Google Scholar
First citation Brown, N. E., Swapp, S. M., Bennett, C. L. & Navrotsky, A. (1993). High-temperature X-ray diffraction: solutions to uncertainties in temperature and sample position. J. Appl. Cryst. 26, 77–81.Google Scholar
First citation Ihringer, J. & Küster, A. (1993). Cryostat for synchrotron powder diffraction with sample rotation and controlled gas atmosphere in the sample chamber. J. Appl. Cryst. 26, 135–137.Google Scholar
First citation Lorenz, G., Neder, R. B., Marxreiter, J., Frey, F. & Schneider, J. (1993). A mirror furnace for neutron diffraction up to 2300 K. J. Appl. Cryst. 26, 632–635.Google Scholar
First citation McKinstry, H. A. (1970). Low thermal gradient high-temperature furnace for X-ray diffraction. J. Appl. Phys. 41, 5074–5079.Google Scholar
First citation Nieman, H. F., Evans, J. C., Heal, K. M. & Powell, B. M. (1984). A technique for the preparation of low-temperature powder samples of noxious materials. J. Appl. Cryst. 17, 372.Google Scholar
First citation Puxley, D. C., Squire, G. D. & Bates, D. R. (1994). A new cell for in situ X-ray diffraction studies of catalysts and other materials under reactive gas atmospheres. J. Appl. Cryst. 27, 585–594.Google Scholar
First citation Rink, W. J., Mathias, H. G. & Schlenoff, J. B. (1994). Hermetic sample housing for X-ray diffraction studies. J. Appl. Cryst. 27, 666–668. Google Scholar
First citation Rudman, R. (1976). Low-temperature X-ray diffraction: apparatus and techniques, Chap. 6, pp. 161–179. New York/London: Plenum.Google Scholar
First citation Tarling, S. E., Barnes, P. & Mackay, A. L. (1984). Simulation of industrial furnacing with powder X-ray diffraction. J. Appl. Cryst. 17, 96–99.Google Scholar








































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