International Tables for Crystallography

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Mounting and setting of specimens for X-ray crystallographic studies
P. F. Lindley. International Tables for Crystallography (2006). Vol. C, ch. 3.4, pp. 162-170  [ doi:10.1107/97809553602060000588 ]

Abstract

This chapter describes the mounting of both polycrystalline specimens (powders) and single crystals for recording X-ray diffraction patterns. It also deals with the handling of specimens under extreme conditions of both high and low temperature and the problems associated with radiation damage. With respect to single crystals, the optimum orientation for recording a complete data set is described. In the light of modern data-collection equipment using both conventional and synchrotron X-ray sources, much of the information on crystal orientation may appear redundant, but for newcomers to the field and for crystal structure analyses that prove to be difficult, reference should be made to the basic principles described in this chapter.


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About International Tables for Crystallography

International Tables for Crystallography is the definitive resource and reference work for crystallography. The multi-volume series comprises articles and tables of data relevant to crystallographic research and to applications of crystallographic methods in all sciences concerned with the structure and properties of materials.