|
International
Tables for Crystallography Volume C Mathematical, physical and chemical tables Edited by E. Prince © International Union of Crystallography 2006 |
International Tables for Crystallography (2006). Vol. C. ch. 4.2, pp. 191-258
https://doi.org/10.1107/97809553602060000592 Chapter 4.2. X-rays
U. W. Arndt,a‡ D. C. Creagh,b R. D. Deslattes,c‡ J. H. Hubbell,d P. Indelicato,e E. G. Kessler Jrf and E. Lindrothg
a MRC Laboratory of Molecular Biology, Hills Road, Cambridge CB2 2QH, England,bDivision of Health, Design, and Science, University of Canberra, Canberra, ACT 2601, Australia,cNational Institute of Standards and Technology, Gaithersburg, MD 20899, USA,dRoom C314, Radiation Physics Building, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA,eLaboratoire Kastler-Brossel, Case 74, Université Pierre et Marie Curie, 4 Place Jussieu, F-75252 Paris CEDEX 05, France,fAtomic Physics Division, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA, and gDepartment of Atomic Physics, Stockholm University, S-104 05 Stockholm, Sweden |
References
Agarwal, B. K. (1979). X-ray spectroscopy, p. 215. Berlin: Springer-Verlag.Google Scholar
Akhiezer, A. I. & Berestetsky, V. B. (1957). Quantum electrodynamics. TESE, Oak Ridge, Tennessee, USA.Google Scholar
Aldred, P. J. E. & Hart, M. (1973a). The electron distribution in silicon. I. Experiment. Proc. R. Soc. London Ser. A, 332, 233–238.Google Scholar
Aldred, P. J. E. & Hart, M. (1973b). The electron distribution in silicon. II. Theoretical interpretation. Proc. R. Soc. London Ser. A, 332, 239–254.Google Scholar
Allen, S. J. M. (1935). X-rays in theory and experiment, edited by A. H. Compton & S. K. Allison, pp. 799–806. New York: Van Nostrand.Google Scholar
Allen, S. J. M. (1969). Handbook of chemistry and physics, edited by R. C. Weast, pp. E143–E144. Cleveland: The Chemical Rubber Co.Google Scholar
Alvarez, L. W., Crawford, F. S. & Stevenson, M. L. (1958). Elastic scattering of 1.6 MeV gamma rays from H, Li, C and Al nuclei. Phys. Rev. 112, 1267–1273.Google Scholar
Aristov, V. V., Shmytko, I. M. & Shulakov, E. V. (1977). Dynamical contrast of the topographic image of a crystal with continuous X-radiation. Acta Cryst. A33, 412–418.Google Scholar
Arndt, U. W. (1992). X-ray wavelengths. International Tables for Crystallography, Vol. C, edited by A. J. C. Wilson, pp. 176–182. Dordrecht: Kluwer Academic Publishers.Google Scholar
Azaroff, L. V. & Pease, D. M. (1974). X-ray absorption spectra. X-ray spectroscopy, edited by L. V. Azaroff, Chap. 6, pp. 284–337. New York: McGraw-Hill.Google Scholar
Bailey, R. L. (1978). The design and operation of magnetic liquid shaft seals. In Thermomechanics of magnetic fluids, edited by B. Berkovsky. London: Hemisphere.Google Scholar
Balaic, D. X., Barnea, Z., Nugent, K. A., Garrett, R. F., Varghese, J. N. & Wilkins, S. W. (1996). Protein crystal diffraction patterns using a capillary-focused synchrotron X-ray beam. J. Synchrotron Rad. 3, 289–295.Google Scholar
Balaic, D. X. & Nugent, K. A. (1995). The X-ray optics of tapered capillaries. Appl. Opt. 34, 7263–7272.Google Scholar
Balaic, D. X., Nugent, K. A., Barnea, Z., Garrett, R. & Wilkins, S. W. (1995). Focusing of X-rays by total external reflection from a paraboloidally tapered glass capillary. J. Synchrotron Rad. 2, 296–299.Google Scholar
Band, I. M., Kharitonov, Yu. I. & Trzhaskovskaya, M. B. (1979). Photoionization cross sections and photoelectron angular distributions for X-ray line energies in the range 0.132–4.509 keV. At. Data Nucl. Data Tables, 23, 443–505.Google Scholar
Barreau, G. H., Börner, H. G., Egidy, T. V. & Hoff, R. W. (1982). Precision measurement of X-ray energies, natural widths and intensities in the actinide region. Z. Phys. A308, 209–213.Google Scholar
Basile, G., Bergamin, A., Cavagnero, G., Mana, G., Vittone, E. & Zosi, G. (1994). Measurement of the silicon (220) lattice spacing. Phys. Rev. Lett. 72, 3133–3136.Google Scholar
Basile, G., Bergamin, A., Cavagnero, G., Mana, G., Vittone, E. & Zosi, G. (1995). The (220) lattice spacing of silicon. IEEE Trans. Instrum. Meas. 44, 526–529.Google Scholar
Bearden, J. A. (1960). Lead K absorption edge for μ-meson mass determination. Phys. Rev. Lett. 4, 240–241.Google Scholar
Bearden, J. A. (1965). Selection of W Kα1 as the X-ray wavelength standard. Phys. Rev. B, 137, 455–461.Google Scholar
Bearden, J. A. (1967). X-ray wavelengths. Rev. Mod. Phys. 39, 78–100.Google Scholar
Bearden, J. A., Henins, A., Marzolf, J. G., Sauder, W. C. & Thomsen, J. S. (1964). Precision redetermination of standard reference wavelengths for X-ray spectroscopy. Phys. Rev. A, 135, 899–910.Google Scholar
Bearden, J. A., Thomsen, J. S., Burr, A. F., Yap, F. Y., Huffman, F. N., Henins, A. & Matthews, G. D. (1964). Remeasurement of selected X-ray lines and reevaluation of all published wavelengths on a consistent and absolute scale. Baltimore, Maryland: The Johns Hopkins University.Google Scholar
Beaumont, J. H. & Hart, M. (1973). Multiple-Bragg reflection monochromators for synchrotron radiation. J. Phys. E, 7, 823–829.Google Scholar
Becker, P., Dorenwendt, K., Ebeling, G., Lauer, R., Lucas, W., Probst, R., Rademacher, H.-J., Reim, G., Seyfried, P. & Siegert, H. (1981). Absolute measurement of the (220) lattice plane spacing in a silicon crystal. Phys. Rev. Lett. 46, 1540–1543.Google Scholar
Becker, P., Seyfried, P. & Siegert, H. (1982). The lattice parameter of highly pure silicon single crystals. Z. Phys. B48, 17–21.Google Scholar
Begum, R., Hart, M., Lea, K. R. & Siddons, D. P. (1986). Direct measurements of the complex X-ray atomic scattering factors for elements by X-ray interferometry at the Daresbury synchrotron radiation source. Acta Cryst. A42, 456–463.Google Scholar
Berman, L. E. & Hart, M. (1991). Adaptive crystal optics for high power synchrotron sources. Nucl. Instrum. Methods, A302, 558–562.Google Scholar
Bertin, E. P. (1975). Principles and practice of X-ray spectrometric analysis. New York: Plenum.Google Scholar
Beyer, H., Indelicato, P., Finlayson, H., Liesen, D. & Deslattes, R. D. (1991). Measurement of the 1s Lamb-shift in hydrogenlike nickel. Phys. Rev. A, 43, 223–227.Google Scholar
Bianconi, A., Incoccia, L. & Stipcich, S. (1983). Editors. EXAFS and near edge structure. Berlin: Springer.Google Scholar
Bijvoet, J. M., Peerdeman, A. F. & Van Bommel, A. J. (1951). Determination of the absolute configuration of optically active compounds by means of X-rays. Nature (London), 168, 271.Google Scholar
Bilderback, D. H., Thiel, D. J., Pahl, R. & Brister, K. E. (1994). X-ray applications with glass-capillary optics. J. Synchrotron Rad. 1, 37–42.Google Scholar
Blume, M. (1994). Magnetic effects in anomalous dispersion. Resonant anomalous X-ray scattering, edited by G. Materlik, C. J. Sparks & K. Fischer, pp. 495–512. Amsterdam: North Holland.Google Scholar
Blundell, S. A. (1993a). Ab initio calculations of QED effects of Li-like, Na-like and Cu-like ions. Phys. Scr. T46, 144–149.Google Scholar
Blundell, S. A. (1993b). Calculations of the screened self-energy and vacuum polarization in Li-like, Na-like and Cu-like ions. Phys. Rev. A, 47, 1790–1803.Google Scholar
Blundell, S. A., Johnson, W. R. & Sapirstein, J. (1990). Improved many-body perturbation theory calculations of the n = 2 states of lithiumlike uranium. Phys. Rev. A, 41, 1698–1700.Google Scholar
Blundell, S. A., Mohr, P. J., Johnson, W. R. & Sapirstein, J. (1993). Evaluation of two-photon exchange graphs for highly charged heliumlike ions. Phys. Rev. A, 48, 2615–2626.Google Scholar
Bonse, U. & Hart, M. (1965a). An X-ray interferometer. Appl. Phys. Lett. 6, 155–156.Google Scholar
Bonse, U. & Hart, M. (1965b). Tailless X-ray single-crystal reflection curves obtained by multiple reflection. Appl. Phys. Lett. 7, 238–240.Google Scholar
Bonse, U. & Hart, M. (1966a). A Laue-case X-ray interferometer. Z. Phys. 188, 154–162.Google Scholar
Bonse, U. & Hart, M. (1966b). An X-ray interferometer with Bragg-case beam splitting. Z. Phys. 194, 1–17.Google Scholar
Bonse, U. & Hart, M. (1966c). Moire patterns of atomic planes obtained by X-ray interferometry. Z. Phys. 190, 455–467.Google Scholar
Bonse, U. & Hart, M. (1966d). Small single X-ray scattering by spherical particles. Z. Phys. 189, 151–165.Google Scholar
Bonse, U. & Hart, M. (1970). Interferometry with X-rays. Phys. Today, 23(8), 26–31.Google Scholar
Bonse, U. & Hartmann-Lotsch, I. (1984). Kramers–Kronig correlation of measured f′(E) and f ′′(E) values. Nucl. Instrum. Methods, 222, 185–188.Google Scholar
Bonse, U., Hartmann-Lotsch, I. & Lotsch, H. (1983a). Interferometric measurement of absorption μ(E) and dispersion f′(E) at the K edge of copper. EXAFS and near edge structure, edited by A. Bianconi, I. Incoccia & A. S. Stipcich, pp. 376–377. Berlin: Springer.Google Scholar
Bonse, U., Hartmann-Lotsch, I. & Lotsch, H. (1983b). The X-ray interferometer for high resolution measurement of anomalous dispersion at HASYLAB. Nucl. Instrum. Methods, 208, 603–604.Google Scholar
Bonse, U. & Hellkötter, H. (1969). Interferometrische Messung des Brechungsindex für Röntgenstrahlen. Z. Phys. 223, 345–352.Google Scholar
Bonse, U. & Henning, A. (1986). Measurement of polarization isotropy of the anomalous forward scattering amplitude at the niobium K-edge in LiNbO3. Nucl. Instrum. Methods, A246, 814–816.Google Scholar
Bonse, U. & Materlik, G. (1972). Dispersionskorrektur für Nickel nahe der K-Absorptionskante. Z. Phys. 253, 232–239.Google Scholar
Bonse, U. & Materlik, G. (1975). Dispersion correction measurements by X-ray interferometry. Anomalous scattering, edited by S. Ramaseshan & S. C. Abrahams, pp. 107–109. Copenhagen: Munksgaard.Google Scholar
Borchert, G. L. (1976). Precise energies of K-Röntgen-lines of Tm, Th, U and Pu. Z. Naturforsch. Teil A, 31, 102–104.Google Scholar
Borchert, G. L., Hansen, P. G., Jonson, B., Ravn, H. L. & Desclaux, J. P. (1980). Comparison of the K X-ray energy ratios of high Z and low Z elements with relativistic SCF DF calculations. Atomic masses and fundamental constants, edited by J. E. Nolen & W. Benenson, Vol. 6, pp. 189–201. New York: Plenum Press.Google Scholar
Bowen, D. K., Stock, S. R., Davies, S. T., Pantos, E., Birnbaum, H. R. & Chen, H. (1984). Topographic EXAFS. Nature (London), 309, 336–338.Google Scholar
Brodsky, A. (1982). Editor. Handbook of radiation measurement and protection, Vols. 1 and 2. Florida: CRC Press.Google Scholar
Brown, G. E., Peierls, R. E. & Woodward, J. B. (1955). The coherent scattering of γ-rays by K electrons in heavy atoms: method. Proc. R. Soc. London Ser. A, 227, 51–63.Google Scholar
Brysk, H. & Zerby, C. D. (1968). Photoelectric cross sections in the keV range. Phys. Rev. 171, 292–298.Google Scholar
Bunker, G., Hasnain, S. S. & Sayers, D. E. (1990). Report of the International Workshops on Standards and Criteria in XAFS. In X-ray absorption spectroscopy, edited by S. S. Hasnain. London: Ellis Horwood.Google Scholar
Buras, B. (1985). The European Synchrotron Radiation Project. Nucl. Sci. Appl. 2, 127–143.Google Scholar
Buras, B. & Marr, G. V. (1979). Editors. European Synchrotron Radiation Facility. Suppl. III: Instrumentation. Strasbourg: ESF.Google Scholar
Buras, B. & Tazzari, S. (1984). Editors. European Synchrotron Radiation Facility. Geneva: ESRP c/o CERN.Google Scholar
Buras, B. & Tazzari, S. (1985). The European Synchrotron Radiation Facility. Report of the ESRP, pp. 6–32. European Synchrotron Radiation Project, CERN, LEP Division, Geneva, Switzerland.Google Scholar
Burr, A. F. (1996). Personal communication.Google Scholar
Byer, R. L., Kuhn, K., Reed, M. & Trail, J. (1983). Progress in high peak and average power lasers for soft X-ray production. Proc. SPIE, 448, 2–7.Google Scholar
Caballero, A., Villain, F., Dexpert, H., Le Peltier, F. & Lynch, J. (1993). Characterization by in situ EXAFS spectroscopy of Pt/Al2O3 and PtRe/Al2O3 catalysts under reaction conditions. Jpn. J. Appl. Phys. 32, Suppl. 32–2, 439–441.Google Scholar
Cardona, M. & Ley, L. (1978). Photoemission in solids I. Top. Appl. Phys. 26, 265–276.Google Scholar
Castaing, R. & Descamps, J. (1955). Sur les bases physiques de l'analyse ponctuelle par spectrographie X. J. Phys. Radium, 16, 304–317.Google Scholar
Cauchois, Y. & Hulubei, H. (1947). Tables de constantes et données numeriques. I. Longueurs d'onde des emissions X et des discontinuités d'absorption X. Paris: Herman.Google Scholar
Cauchois, Y. & Senemaud, C. (1978). Tables internationales de constantes selectionnées. 18. Longeurs d'onde des emissions X et des discontinuités d'absorption X. London: Pergamon Press.Google Scholar
Chantler, C. T. (1994). Towards improved form factor tables. Resonant anomalous X-ray scattering, edited by G. Materlik, C. J. Sparks & K. Fischer, pp. 61–79. Amsterdam: North Holland.Google Scholar
Chantler, C. T. (1995). Theoretical form factor, attenuation and scattering tabulation for Z = 1–92 from 1–10 eV to E = 0.4–1.0 MeV. J. Phys. Chem. Ref. Data, 24, 71–643.Google Scholar
Chapuis, G., Templeton, D. H. & Templeton, L. K. (1985). Solving crystal structures using several wavelengths from conventional sources. Anomalous scattering by holmium. Acta Cryst. A41, 274–278.Google Scholar
Chipman, D. R. (1969). Conversion of relative intensities to an absolute scale. Acta Cryst. A25, 209–214.Google Scholar
Citrin, P. H., Eisenberger, P. & Hewitt, R. (1978). Extended X-ray absorption fine structure of surface atoms on single-crystal substrates: iodine absorbed on Ag(111). Phys. Rev. Lett. 41, 309–312.Google Scholar
Clay, R. E. (1934). A 5 kW X-ray generator with a spinning target. Proc. Phys. Soc. London, 46, 703–712.Google Scholar
Cohen, E. R. & Taylor, B. N. (1973). The 1973 least-squares adjustment of the fundamental constants. J. Phys. Chem. Ref. Data, 2, 663–734.Google Scholar
Cohen, E. R. & Taylor, B. N. (1987). The 1986 adjustment of the fundamental physical constants. Rev. Mod. Phys. 89, 1121–1148.Google Scholar
Cole, H. & Stemple, N. R. (1962). Effect of crystal perfection and polarity on absorption edges seen in Bragg diffraction. J. Appl. Phys. 33, 2227–2233.Google Scholar
Collins, C. B., Davanloo, F. & Bowen, T. S. (1986). Flash X-ray source of intense nanosecond pulses produced at high repetition rates. Rev. Sci. Instrum. 57, 863–865.Google Scholar
Compton, A. H. & Allison, S. K. (1935). X-rays in theory and experiment. New York: Van Nostrand.Google Scholar
Cooper, M. J. (1985). Compton scattering and electron momentum determination. Rep. Prog. Phys. 48, 415–481.Google Scholar
Cosslett, V. E. & Nixon, W. C. (1951). X-ray shadow microscope. Nature (London), 168, 24–25.Google Scholar
Cosslett, V. E. & Nixon, W. C. (1960). X-ray microscopy, pp. 217–222. Cambridge University Press.Google Scholar
Creagh, D. C. (1970). On the measurement of X-ray dispersion corrections using X-ray interferometers. Aust. J. Phys. 23, 99–103.Google Scholar
Creagh, D. C. (1977). Determination of the mass attenuation coefficients and the anomalous dispersion corrections for calcium at X-ray wavelengths from I Kα1 to Cu Kα1. Phys. Status Solidi A, 39, 705–715.Google Scholar
Creagh, D. C. (1978). A new device for the precise measurement of X-ray attenuation coefficients and dispersion corrections. Advances in X-ray analysis, Vol. 21, edited by C. S. Barrett & D. E. Leyden, pp. 149–153. New York: Plenum.Google Scholar
Creagh, D. C. (1980). X-ray interferometer measurements of the anomalous dispersion correction f′(ω, 0) for some low Z elements. Phys. Lett. A, 77, 129–132.Google Scholar
Creagh, D. C. (1982). On the use of photoelectric attenuation coefficients for the determination of the anomalous dispersion coefficient f′ for X-rays. Phys. Lett. A, 103, 52–56.Google Scholar
Creagh, D. C. (1984). The real part of the forward scattering factor for aluminium. Unpublished.Google Scholar
Creagh, D. C. (1985). Theoretical and experimental techniques for the determination of X-ray anomalous dispersion corrections. Aust. J. Phys. 38, 371–404.Google Scholar
Creagh, D. C. (1986). The X-ray anomalous dispersion of materials. In Recent advances in X-ray characterization of materials, edited by P. Krishna, Chap. 7. Oxford: Pergamon Press.Google Scholar
Creagh, D. C. (1987a). The resolution of discrepancies in tables of photon attenuation coefficients. Nucl. Instrum. Methods, A255, 1–16.Google Scholar
Creagh, D. C. (1987b). The X-ray anomalous dispersion corrections and their use for the characterization of materials. In Progress in crystal growth and characterization, Vol. 14, edited by P. Krishna, Chap. 7, pp. 1–46. Oxford: Pergamon Press.Google Scholar
Creagh, D. C. (1990). Tables of X-ray absorption corrections and dispersion corrections: the new versus the old. Nucl. Instrum. Methods, A295, 417–434.Google Scholar
Creagh, D. C. (1993). f′: its present and its future. Ind. J. Phys. 67B, 511–525.Google Scholar
Creagh, D. C. & Cookson, D. J. (1995). Diffraction anomalous fine structure study of basic zinc sulphate and basic zinc sulphonate. In Photon Factory Activity Report 1994, edited by K. Nasu. National Laboratory for High Energy Physics, Tsukuba 93-0305, Japan.Google Scholar
Creagh, D. C. & Garrett, R. F. (1995). Testing of a sagittal focusing monochromator at BL 20B at the Photon Factory. Access to major facilities program, edited by J. W. Boldeman, pp. 251–252. Sydney: ANSTO.Google Scholar
Creagh, D. C. & Hart, M. (1970). X-ray interferometric measurements of the forward scattering amplitude of lithium fluoride. Phys. Status Solidi, 37, 753–758.Google Scholar
Creagh, D. C. & Hubbell, J. H. (1987). Problems associated with the measurement of X-ray attenuation coefficients. I. Silicon. Acta Cryst. A43, 102–112.Google Scholar
Creagh, D. C. & Hubbell, J. H. (1990). Problems associated with the measurement of X-ray attenuation coefficients. II. Carbon. Acta Cryst. A46, 402–408.Google Scholar
Cromer, D. T. (1969). Anomalous dispersion corrections computed from self consistent field relativistic Dirac–Slater wavefunctions. J. Chem. Phys. 50, 4857–4859.Google Scholar
Cromer, D. T. & Liberman, D. (1970). Relativistic calculation of anomalous scattering factors for X-rays. J. Chem. Phys. 53, 1891–1898.Google Scholar
Cromer, D. T. & Liberman, D. A. (1981). Anomalous dispersion calculations near to and on the long-wavelength side of an absorption edge. Acta Cryst. A37, 267–268.Google Scholar
Cromer, D. T. & Liberman, D. A. (1983). Calculation of anomalous scattering factors at arbitrary wavelengths. J. Appl. Cryst. 16, 437.Google Scholar
Cromer, D. T. & Mann, J. B. (1967). Compton scattering factors for spherically symmetric free atoms. J. Chem. Phys. 47, 1892–1893.Google Scholar
Cromer, D. T. & Waber, J. T. (1974). Atomic scattering factors for X-rays. International tables for X-ray crystallography, Vol. IV, edited by J. A. Ibers & W. C. Hamilton, Chap. 2.2, pp. 71–147. Birmingham: Kynoch Press.Google Scholar
Crozier, E. D. & Seary, A. J. (1980). Asymmetric effects in the extended X-ray absorption fine structure. Analysis of solid and liquid zinc. Can. J. Phys. 58, 1388–1399.Google Scholar
Cusatis, C. & Hart, M. (1975). Dispersion correction measurements by X-ray interferometry. Anomalous scattering, edited by S. Ramaseshan & S. C. Abrahams, pp. 57–68. Copenhagen: Munksgaard.Google Scholar
Cusatis, C. & Hart, M. (1977). The anomalous dispersion corrections for zirconium. Proc. R. Soc. London Ser. A, 354, 291–302.Google Scholar
De Marco, J. J. & Suortti, P. (1971). Effect of scattering on the attenuation of X-rays. Phys. Rev. B, 4, 1028–1033.Google Scholar
Delf, B. W. (1961). The effect of absorption in the β-filter on the mean wavelength of X-ray emission lines. Proc. Phys. Soc. London, 78, 305–306.Google Scholar
Desclaux, J. P. (1975). A multiconfiguration relativistic Dirac–Fock program. Comput. Phys. Commun. 9, 31–45.Google Scholar
Desclaux, J. P. (1993). Relativistic multiconfiguration Dirac–Fock package. Methods and techniques in computational chemistry - 94, Vol. A, edited by E. Clementi. Cagliary: STEF.Google Scholar
Deslattes, R. D. & Henins, A. (1973). X-ray to visible wavelength ratios. Phys. Rev. Lett. 31, 972–975.Google Scholar
Deslattes, R. D. & Kessler, E. G. Jr (1985). Experimental evaluation of inner-vacancy level energies for comparison with theory. Atomic inner-shell physics, edited by B. Crasemann, pp. 181–235. New York: Plenum.Google Scholar
Deslattes, R. D., Tanaka, M., Greene, G. L., Henins, A. & Kessler, E. G. (1987). Remeasurement of a silicon lattice period. IEEE Trans. Instrum. Meas. IM-36, 166.Google Scholar
Deutsch, M. & Hart, M. (1982). Wavelength energy shape and structure of the Cu Kα1 X-ray emission line. Phys. Rev. B, 26, 5550–5567.Google Scholar
Deutsch, M. & Hart, M. (1984a). Noninterferometric measurement of the X-ray refractive index of beryllium. Phys. Rev. B, 30, 643–646.Google Scholar
Deutsch, M. & Hart, M. (1984b). X-ray refractive-index measurement in silicon and lithium fluoride. Phys. Rev. B, 30, 640–642.Google Scholar
Deutsch, M. & Hart, M. (1985). A new approach to the measurement of X-ray structure amplitudes determined by the Pendellösung method. Acta Cryst. A41, 48–55.Google Scholar
Doyle, P. A. & Turner, P. S. (1968). Relativistic Hartree–Fock X-ray and electron scattering factors. Acta Cryst. A24, 390–397.Google Scholar
Dreier, P., Rabe, P., Malzfeldt, W. & Niemann, W. (1984). Anomalous X-ray scattering factors calculated from experimental absorption factor. J. Phys. C, 17, 3123–3136.Google Scholar
Durham, P. J. (1983). Multiple scattering calculations of XANES. EXAFS and near edge structure, edited by A. Bianconi, L. Incoccia & S. Stipcich, pp. 37–43. Berlin: Springer.Google Scholar
Dyson, N. A. (1973). X-rays in atomic and nuclear physics. London: Longman.Google Scholar
Ehrenberg, W. & Spear, W. E. (1951). An electrostatic focusing system and its application to a fine focus X-ray tube. Proc. Phys. Soc. London Sect. B, 64, 67–75.Google Scholar
Engel, D. H. & Sturm, M. (1975). Experimental determination of f′′ for heavy atoms. Anomalous scattering, edited by S. Ramaseshan & S. C. Abrahams, pp. 93–100. Copenhagen: Munksgaard.Google Scholar
Engström, P., Rindby, A. & Vincze, L. (1996). Capillary optics. ESRF Newsletter, 26, 30–31.Google Scholar
Farge, Y. & Duke, P. J. (1979). Editors. European Synchrotron Radiation Facility. Suppl. 1: The scientific case. Strasbourg: ESF.Google Scholar
Fermi, E. (1928). Eine statistiche Methode zur Bestimmung einiger geschaften des Atoms und ihre Anwendung auf die Theorie des periodische Systems der Elemente. Z. Phys. 48, 73–79.Google Scholar
Fiorito, R. B., Rule, D. W., Piestrup, M. A., Li, Q., Ho, A. H. & Maruyama, X. K. (1993). Parametric X-ray generation from moderate-energy electron beams. Nucl. Instrum. Methods, B79, 758–761.Google Scholar
Fock, V. (1930). Näherungsmethode zur Lösung des quantenmechanischen Mehrkörperproblems. Z. Phys. 61, 126–148.Google Scholar
Forsyth, J. M. & Frankel, R. D. (1980). Flash X-ray diffraction from biological specimens using a laser-produced plasma source. Report No. 106. Laboratory for Laser Energetics, University of Rochester, USA.Google Scholar
Forsyth, J. M. & Frankel, R. D. (1984). Experimental facility for nanosecond time-resolved low-angle X-ray diffraction experiments using a laser-produced plasma source. Rev. Sci. Instrum. 55, 1235–1242.Google Scholar
Fourme, R. (1992). Sources X intenses et cristallographie biologique. Ann. Phys. (Leipzig), 17, 247–255.Google Scholar
Frankel, R. D. & Forsyth, J. M. (1979). Nanosecond exposure X-ray diffraction patterns from biological specimens using a laser plasma source. Science, 204, 622–624.Google Scholar
Frankel, R. D. & Forsyth, J. M. (1985). Time-resolved X-ray diffraction study of photo stimulated purple membrane. Biophys. J. 47, 387–393.Google Scholar
Freund, A. (1975). Anomalous scattering of X-rays in copper. Anomalous scattering, edited by S. Ramaseshan & S. C. Abrahams, pp. 69–86. Copenhagen: Munksgaard.Google Scholar
Freund, A. K. (1993). Thin is beautiful. ESRF Newsletter, 19, 11–13.Google Scholar
Fricke, H. (1920). The K-characteristic absorption frequencies for the chemical elements magnesium to chromium. Phys. Rev. 16, 202–212.Google Scholar
Fuggle, J. C., Burr, A. F., Watson, L. M., Fabian, D. J. & Lang, W. (1974). X-ray photoelectron studies of thorium and uranium. J. Phys. F, 4, 335–342.Google Scholar
Fujimoto, Z., Fujii, K., Tanaka, M. & Nakayama, K. (1997). Lattice measurement in silicon. IEEE Trans. Instrum. Meas. 50, 123–124.Google Scholar
Fukumachi, T., Nakano, Y. & Kawamura, T. (1986). Energy dependence of X-ray reflectivity from multi-layer mirrors. X-ray instrumentation for the Photon Factory: dynamic analyses of micro-structures in matter, edited by S. Hosoya, Y. Iitaka & H. Hashizume, pp. 25–34. Japan: Photon Factory.Google Scholar
Fuoss, P. H. & Bienenstock, A. (1981). X-ray anomalous scattering factors – measurements and applications. Inner-shell and X-ray physics of atoms and solids, edited by D. J. Fabian, A. Kleinpoppen & L. M. Watson, pp. 875–884. New York: Plenum.Google Scholar
Fuoss, P. H., Eisenberger, P., Warburton, W. K. & Bienenstock, A. (1981). Application of differential anomalous X-ray scattering to structural studies of amorphous materials. Phys. Rev. Lett. 46, 1537–1540.Google Scholar
Gavrila, M. (1981). Photon atom elastic scattering in inner-shell and X-ray physics of atoms and solids, edited by B. Crasemann. New York: Plenum.Google Scholar
Gerstenberg, H. & Hubbell, J. H. (1982). Comparison of experimental with theoretical photon attenuation cross sections between 10 eV and 100 GeV. Nuclear data for science and technology, edited by K. H. Bockhoff, pp. 1007–1009. Amsterdam: North-Holland.Google Scholar
Gerward, L. (1981). X-ray attenuation coefficients and atomic photoelectric absorption cross sections of silicon. J. Phys. B, 14, 3389–3395.Google Scholar
Gerward, L. (1982). X-ray attenuation coefficients of copper in the energy range 5 to 50 keV. Z. Naturforsch. Teil A, 37, 451–459.Google Scholar
Gerward, L. (1983). X-ray attenuation coefficients of carbon in the energy range 5 to 20 keV. Acta Cryst. A39, 322–325.Google Scholar
Gerward, L. (1986). Empirical absorption equations for use in X-ray spectrometric analysis. X-ray Spectrom. 15, 29–33.Google Scholar
Gerward, L., Thuesen, G., Stibius-Jensen, M. & Alstrup, I. (1979). X-ray anomalous scattering factors for silicon and germanium. Acta Cryst. A35, 852–857.Google Scholar
Giles, C., Vettier, C., de Bergevin, F., Grubel, G., Goulon, J. & Grossi, F. (1994). X-ray polarimetry with phase plates. ESRF Newsletter, 21, 16–17.Google Scholar
Godwin, R. P. (1968). Synchrotron radiation light source. Springer Tracts Mod. Phys. 51, 1–69.Google Scholar
Goldberg, M. (1961). Intensités relatives des raies X du spectre L excité par bombardement électronique des éléments lourds. J. Phys. Radium, 22, 743–748.Google Scholar
Goldsztaub, S. (1947). Tube à rayons X de grande brilliance à foyer ponctuel. C. R. Acad. Sci. 224, 458–459.Google Scholar
Green, M. (1963). The target absorption correction in X-ray microanalysis. X-ray optics and X-ray microanalysis, edited by H. Pattee, V. E. Cosslett & A. Engstrom, pp. 361–377. London: Academic Press.Google Scholar
Green, M. & Cosslett, V. E. (1968). Measurement of K, L and M shell X-ray production efficiencies. Br. J. Appl. Phys. Ser. 2, 1, 425–436.Google Scholar
Grey, D. (1996). Instrumentation developments and observations in hard X-ray astronomy. PhD thesis. The University of New South Wales, Australia.Google Scholar
Grimvall, G. & Persson, E. (1969). Absorption of X-rays in germanium. Acta Cryst. A25, 417–422.Google Scholar
Guo, C.-L. & Wu, Y.-Q. (1985). Empirical relationship between the characteristic X-ray intensity and the incident electron energy. Kexue Tongbao, 30, 1621–1627.Google Scholar
Gurman, S. J. (1988). The small atom approximation in EXAFS and surface EXAFS. J. Phys. C, 21, 3699–3717.Google Scholar
Gurman, S. J. (1995). Interpretation of EXAFS data. J. Synchrotron Rad. 2, 56–63.Google Scholar
Hanfland, M., Häusermann, D., Snigirev, A., Snigireva, I., Ahahama, Y. & McMahon, M. (1994). Bragg–Fresnel lens for high pressure studies. ESRF Newsletter, 22, 8–9.Google Scholar
Hart, M. (1968). An ångström ruler. J. Phys. D, 1, 1405–1408.Google Scholar
Hart, M. (1971). Bragg reflection X-ray optics. Rep. Prog. Phys. 34, 435–490.Google Scholar
Hart, M. (1985). Private communication.Google Scholar
Hart, M. (1994). Polarizing X-ray optics and anomalous dispersion in chiral systems. Resonant anomalous X-ray scattering, edited by G. Materlik, C. J. Sparks & K. Fischer, pp. 103–118. Amsterdam: North Holland.Google Scholar
Hart, M. & Rodrigues, A. R. D. (1978). Harmonic-free single-crystal monochromators for neutrons and X-rays. J. Appl. Cryst. 11, 248–253.Google Scholar
Hart, M. & Siddons, D. P. (1981). Measurements of anomalous dispersion corrections made from X-ray interferometers. Proc. R. Soc. London Ser. A, 376, 465–482.Google Scholar
Hartree, D. R. (1928). The wavemechanics of an atom with a non-Coulomb central field. Proc. Cambridge Philos. Soc. 24, 89–132.Google Scholar
Härtwig, J., Hölzer, G., Wolf, J. & Förster, E. (1993). Remeasurement of the profile of the characteristic Cu Kα emission line with high precision and accuracy. J. Appl. Cryst. 26, 539–548.Google Scholar
Hashimoto, H., Kozaki, S. & Ohkawa, T. (1965). Observations of Pendellösung fringes and images of dislocations by X-ray shadow micrographs of silicon crystals. Appl. Phys. Lett. 6, 16–17.Google Scholar
Hashizume, H. (1983). Asymmetrically grooved monolithic crystal monochromators for suppression of harmonics in synchrotron X-radiation. J. Appl. Cryst. 16, 420–427.Google Scholar
Hasnain, S. S. (1990). X-ray absorption fine structure. London: Ellis Horwood.Google Scholar
Hastings, J. B., Eisenberger, P., Lengeler, B. & Perlman, M. L. (1975). Local structure determination at high dilution: internal oxidation at 75 ppm Fe in Cu. Phys. Rev. Lett. 43, 1807–1810.Google Scholar
Heinrich, K. F. J. (1966). X-ray absorption uncertainty. The electron microprobe, edited by T. D. McKinley, K. F. J. Heinrich & D. B. Wittrey, pp. 296–377. New York: John Wiley.Google Scholar
Helliwell, J. R. (1984). Synchrotron X-radiation protein crystallography. Rep. Prog. Phys. 47, 1403–1497.Google Scholar
Hendrickson, W. A. (1994). MAD phasing for macromolecular structures. Resonant anomalous X-ray scattering, edited by G. Materlik, C. J. Sparks & K. Fischer, pp. 159–173. Amsterdam: North Holland.Google Scholar
Henins, A. (1971). Ruled grating measurements of the Al Kα1,2 wavelength. Precision measurements and fundamental constants, edited by D. N. Langenberg & B. N. Taylor, pp. 255–258. Natl Bur. Stand. (US) Spec. Publ. No. 343. Gaithersburg, Maryland: National Bureau of Standards.Google Scholar
Henke, B. L., Lee, P., Tanaka, T. J., Shimambukuro, R. L. & Fujikawa, B. K. (1982). Low-energy X-ray interaction coefficients: photoabsorption, scattering and reflection. At. Data Nucl. Data Tables, 27, 1–144.Google Scholar
Hertz, G. (1920). Über die Absorptionsgrenzen in den L-Serie. Z. Phys. 3, 19–27.Google Scholar
Hida, M., Wada, N., Maeda, H., Hikaru, T., Tsu, Y. & Kamino, N. (1985). An EXAFS investigation on the lattice relaxation of Ni fine particles prepared by gas evaporation. Jpn. J. Appl. Phys. 24, L3–L5.Google Scholar
Hofmann, A. (1978). Quasi-monochromatic synchrotron radiation from undulators. Nucl. Instrum. Methods, 152, 17–21.Google Scholar
Holt, S. A., Brown, A. S., Creagh, D. C. & Leon, R. (1997). The application of grazing incidence X-ray diffraction and specular reflectivity to the structural investigation of multiple quantum well and quantum dot semiconductor devices. J. Synchrotron Rad. 4, 169–174.Google Scholar
Hölzer, G., Fritsch, M., Deutsch, M., Härtwig, J. & Förster, E. (1997). Kα1,2 and Kβ1,3 X-ray emission lines of the 3d transition metals. Phys. Rev. A, 56, 4554–4568.Google Scholar
Honkimaki, V., Sleight, J. & Suortti, P. (1990). Characteristic X-ray flux from sealed Cr, Cu, Mo, Ag and W tubes. J. Appl. Cryst. 23, 412–417.Google Scholar
Hönl, H. (1933a). Zur Dispersions theorie der Röntgenstrahlen. Z. Phys. 84, 1–16.Google Scholar
Hönl, H. (1933b). Atomfactor für Röntgenstrahlen als Problem der Dispersionstheorie (K-Schale). Ann. Phys. (Leipzig), 18, 625–657.Google Scholar
Hosoya, S. (1975). Anomalous scattering measurements and amplitude and phase determinations with continuous X-rays. Anomalous scattering, edited by S. Ramaseshan & S. C. Abrahams, pp. 275–287. Copenhagen: Munksgaard.Google Scholar
Hubbell, J. H. (1969). Phonon cross sections, attenuation coefficients, and energy absorption coefficients from 10 keV to 100 GeV. Report NRDS-NBS29. National Institute of Standards and Technology, Gaithersburg, MD, USA.Google Scholar
Hubbell, J. H., Gerstenberg, H. M. & Saloman, E. B. (1986). Bibliography of photon total cross section (attenuation coefficient) measurements 10 eV to 13.5 GeV. Report NBSIR 86-3461. National Institute of Standards and Technology, Gaithersburg, MD, USA.Google Scholar
Hubbell, J. H., McMaster, W. H., Del Grande, N. K. & Mallett, J. H. (1974). X-ray cross sections and attenuation coefficients. International tables for X-ray crystallography, Vol. IV, edited by J. A. Ibers & W. C. Hamilton, pp. 47–70. Birmingham: Kynoch Press.Google Scholar
Hubbell, J. H. & Øverbø, I. (1979). Relativistic atomic form factors and photon coherent scattering cross sections. J. Phys. Chem. Ref. Data, 8, 69–105.Google Scholar
Hubbell, J. H., Veigele, W. J., Briggs, E. A., Brown, R. T., Cromer, D. T. & Howerton, R. J. (1975). Atomic form factors, incoherent scattering functions and photon scattering cross sections. J. Phys. Chem. Ref. Data, 4, 471–538.Google Scholar
Huke, K. & Kobayakawa, M. (1989). World-wide census of SR facilities. Rev. Sci. Instrum. 60, 2548–2561.Google Scholar
Indelicato, P. (1990). Kα transitions in few-electron ions and in atoms. X-ray and inner-shell processes, edited by T. A. Carlson, M. O. Krause & S. T. Manson, pp. 591–601. New York: American Institute of Physics.Google Scholar
Indelicato, P. & Desclaux, J. P. (1990). Multiconfiguration Dirac–Fock calculations of transition energies with QED corrections in three-electron ions. Phys. Rev. A, 42, 5139–5149.Google Scholar
Indelicato, P., Gorceix, O. & Desclaux, J. P. (1987). MCDF studies of two electron ions II: radiative corrections and comparison with experiment. J. Phys. B, 20, 651.Google Scholar
Indelicato, P. & Lindroth, E. (1992). Relativistic effects, correlation, and QED corrections on Kα transitions in medium to very heavy atoms. Phys. Rev. A, 46, 2426–2436.Google Scholar
Indelicato, P. & Lindroth, E. (1996). Current status of the relativistic theory of inner hole states in heavy atoms. Comments At. Mol. Phys. 32, 197–208.Google Scholar
Indelicato, P. & Mohr, P. J. (1990). Electron screening correction to the self energy in high-Z atoms. 12th International Conference on Atomic Physics, Ann Arbor, Michigan, USA.Google Scholar
Indelicato, P. & Mohr, P. J. (1991). Quantum electrodynamic effects in atomic structure. Theor. Chim. Acta, 80, 207–214.Google Scholar
International Tables for Crystallography
(2001). Vol. B. Dordrecht: Kluwer Academic Publishers.Google Scholar
International Tables for X-ray Crystallography
(1974). Vol. IV. Birmingham: Kynoch Press.Google Scholar
Ishida, K. & Katoh, H. (1982). Use of multiple reflection diffraction to measure X-ray refractive index. Jpn. J. Appl. Phys. 21, 1109.Google Scholar
Ishimura, T., Shiraiwa, Y. & Sawada, M. (1957). The input power limit of the cylindrical rotating anode of an X-ray tube. J. Phys. Soc. Jpn, 12, 1064–1070.Google Scholar
Jackson, D. F. & Hawkes, D. J. (1981). X-ray attenuation coefficients of elements and mixtures. Phys. Rep. 70, 169–233.Google Scholar
James, R. W. (1955). The optical principles of the diffraction of X-rays. Ithaca: Cornell University Press.Google Scholar
Jenkins, R., Manne, R., Robin, J. & Senemaud, C. (1991). Nomenclature, symbols, units and their usage in spectrochemical analysis. VIII. Nomenclature system for X-ray spectroscopy. Pure Appl. Chem. 63, 735–746.Google Scholar
Jennings, L. D. (1981). Extinction, polarization and crystal monochromators. Acta Cryst. A37, 584–593.Google Scholar
Jennings, L. D. (1984). The polarization ratio of crystal monochromators. Acta Cryst. A40, 12–16.Google Scholar
Johnson, W. R. & Soff, G. (1985). The Lamb shift in hydrogenlike atoms, 1 ≤ Z ≤ 110. At. Data Nucl. Data Tables, 33, 405.Google Scholar
Joy, D. C. & Maher, D. (1985). Quantitative electron energy loss spectroscopy: an introduction to the power of Kevex Elstar software. Kevex Analyst, 10, 6–9.Google Scholar
Kane, P. P., Kissel, L., Pratt, R. H. & Roy, S. C. (1986). Elastic scattering of γ-rays and X-rays by atoms. Phys. Rep. 150, 75–159.Google Scholar
Karle, J. (1980). Anomalous dispersion and the use of triplet phase invariants. Int. J. Quantum Chem. 7, 357–367.Google Scholar
Karle, J. (1984a). Rules for evaluating triplet phase invariants by use of anomalous dispersion data. Acta Cryst. A40, 366–379.Google Scholar
Karle, J. (1984b). The relative scaling of multiple wavelength anomalous dispersion data. Acta Cryst. A40, 1–4.Google Scholar
Karle, J. (1984c). Triplet phase invariants from an exact algebraic analysis of anomalous dispersion. Acta Cryst. A40, 526–532.Google Scholar
Karle, J. (1985). Many algebraic formulas for the evaluation of triplet phase invariants from isomorphous replacement and anomalous dispersion data. Acta Cryst. A41, 182–189.Google Scholar
Katoh, H., Shimakura, H., Ogawa, T., Hattori, S., Kobayashi, Y., Umezawa, K., Ishikawa, T. & Ishida, K. (1985a). Measurement of X-ray refractive index by multiple reflection diffractometer. Activity Report, KEK, Tsukuba, Japan.Google Scholar
Katoh, H., Shimakura, H., Ogawa, T., Hattori, S., Kobayashi, Y., Umezawa, K., Ishikawa, T. & Ishida, K. (1985b). Measurement of the X-ray anomalous scattering of the germanium K-edge with synchrotron radiation. J. Phys. Soc. Jpn, 54, 881–884.Google Scholar
Kessler, E. G. Jr, Deslattes, R. D. & Henins, A. (1979). Wavelength of the W Kα1 X-ray line. Phys. Rev. A, 19, 215–218.Google Scholar
Kikuta, S. (1971). X-ray crystal monochromators using successive asymmetric diffractions and their applications to measurements of diffraction curves. II. Type 1 collimator. J. Phys. Soc. Jpn, 30, 222–227.Google Scholar
Kikuta, S. & Kohra, K. (1970). X-ray crystal collimators using successive asymmetric diffractions and their applications to measurements of diffraction curves. I. General considerations on collimators. J. Phys. Soc. Jpn, 29, 1322–1328.Google Scholar
Kim, Y. K., Baik, D. H., Indelicato, P. & Desclaux, J. P. (1991). Resonance transition energies of Li-, Na-, and Cu-like ions. Phys. Rev. A, 44, 148–166.Google Scholar
Kirfel, A. (1994). Anisotropy of anomalous scattering in single crystals. Resonant anomalous X-ray scattering, edited by G. Materlik, C. J. Sparks & K. Fischer, pp. 231–256. Amsterdam: North Holland.Google Scholar
Kirkpatrick, P. & Wiedmann, L. (1945). Theoretical continuous X-ray energy and polarization. Phys. Rev. 67, 321–339.Google Scholar
Kissel, L. (1977). Rayleigh scattering: elastic scattering by bound electrons. PhD thesis, University of Pittsburgh, PA, USA.Google Scholar
Kissel, L. & Pratt, R. H. (1985). Rayleigh scattering: elastic photon scattering by bound electrons. In Atomic inner-shell physics, edited by B. Crasemann. New York: Plenum.Google Scholar
Kissel, L., Pratt, R. H., Kane, P. P. & Roy, S. C. (1985). Elastic scattering of X-rays and γ-rays by atoms. Sandia Report SANDE5-0501J. Sandia, Albuquerque, NM, USA.Google Scholar
Kissel, L., Pratt, R. H. & Roy, S. C. (1980). Rayleigh scattering by neutral atoms, 100 eV to 10 MeV. Phys. Rev. A, 22, 1970–2004.Google Scholar
Koch, B., MacGillavry, C. H. & Milledge, H. J. (1962). Absorption. International tables for X-ray crystallography, Vol. III, Section 2.2, pp. 157–192. Birmingham: Kynoch Press.Google Scholar
Koch, E. E. (1983). Editor. Handbook on synchrotron radiation. Amsterdam: North-Holland.Google Scholar
Kohn, W. & Sham, L. S. (1965). Self consistent equations including exchange and correlation effects. Phys. Rev. A, 140, 1133–1138.Google Scholar
Kostarev, A. L. (1941). Theory of the fine structure of X-ray absorption spectra in solids. Zh. Eksper. Teor. Fiz. 11, 60–73.Google Scholar
Kostarev, A. L. (1949). Elucidation of the super-fine structure of X-ray absorption spectra in solids. Zh. Eksper. Teor. Fiz. 19, 413–420.Google Scholar
Kraft, S., Stümpel, J., Becker, P. & Kuetgens, U. (1996). High resolution X-ray absorption spectroscopy with absolute energy calibration for the determination of absorption edge energies. Rev. Sci. Instrum. 67, 681–687.Google Scholar
Kramers, H. A. (1923). On the theory of X-ray absorption and of the continuous X-ray spectrum. Philos. Mag. 46, 836–871.Google Scholar
Kronig, R. de L. (1932a). Zur Theorie der Feinstruktur in den Röntgenabsorptionspecktren II. Z. Phys. 75, 191–210.Google Scholar
Kronig, R. de L. (1932b). Zur Theorie der Feinstruktur in den Röntgenabsorptionspecktren III. Z. Phys. 75, 468–475.Google Scholar
Kulenkampff, H. & Schmidt, L. (1943). Die Energieverteilung im Spektrum der Röntgen Bremsstrahlung. Ann. Phys. (Leipzig), 43, 494–512.Google Scholar
Kulipanov, G. N. & Skrinskii, A. N. (1977). Utilization of synchrotron radiation: current status and prospects. Usp. Fiz. Nauk, 122, 369–418. English translation: Sov. Phys. Usp. 20, 559–586.Google Scholar
Kumakhov, M. A. & Komarov, F. F. (1990). Multiple reflection from surface X-ray optics. Phys. Rep. 191(5), 289–350.Google Scholar
Kunz, C. (1979). Editor. Synchrotron radiation. Berlin: Springer.Google Scholar
Kuroda, H., Ohta, T., Murata, T., Udagawa, Y. & Nomura, M. (1992). XAFS VII: Proceedings of the Seventh Conference on X-ray Absorption Fine Structure. Jpn. J. Appl. Phys. 32, Suppl. 32-2.Google Scholar
Kusev, S. V., Raiko, V. I. & Skuratowski, I. Ya. (1992). The status of beam lines for macromolecular crystallography at the Siberia-2 storage ring. Rev. Sci. Instrum. 63, 1055–1057.Google Scholar
Kutzler, F. W., Natoli, C. R., Misemer, D. K., Doniach, S. & Hodgson, K. O. (1981). Use of one electron theory for the interpretation of near edge structure in K-shell X-ray absorption spectra of transition metal complexes. J. Chem. Phys. 73, 3274–3288.Google Scholar
Laclare, J. L. (1994). Target specifications and performance of the ESRF source. J. Synchrotron Rad. 1, 12–18.Google Scholar
Lea, K. (1978). Highlights of synchrotron radiation. Phys. Rep. 43, 337–375.Google Scholar
Leapman, R. D. & Cosslett, V. E. (1976). Extended fine structure above the X-ray edge in electron energy loss spectra. J. Phys. D, 9, L29–L31.Google Scholar
Lebugle, A., Axelsson, U., Nyholm, R. & Mårtensson, N. (1981). Experimental L and M core level binding energies for the metals 22Ti to 30Zn. Phys Scr. 23, 825–827.Google Scholar
Lee, P. A. (1981). Theory of extended X-ray absorption fine structure. EXAFS spectroscopy: techniques and applications, edited by B. K. Teo & D. C. Joy, Chap. 2, pp. 5–13. New York: Plenum.Google Scholar
Lee, P. A. & Beni, G. (1977). New method for the calculation of atomic phase shifts: application to extended X-ray absorption fine structure (EXAFS) in molecules and crystals. Phys. Rev. B, 15, 2862–2883.Google Scholar
Lee, P. A., Citrin, P. H., Eisenberger, P. & Kincaid, B. M. (1981). Extended X-ray absorption fine structure – its strengths and limitations as a structural tool. Rev. Mod. Phys. 53, 769–787.Google Scholar
Lengeler, B. (1994). Experimental determination of the dispersion correction f′(E) to the atomic scattering factor. Resonant anomalous X-ray scattering, edited by G. Materlik, C. J. Sparks & K. Fischer, pp. 35–69. Amsterdam: North Holland.Google Scholar
Lengeler, B., Materlik, G. & Müller, J. E. (1983). Near edge structure in cerium and cerium compounds. EXAFS and near edge structure, edited by A. Bianconi, L. Incoccia & S. Stipcich, pp. 150–153. Berlin: Springer.Google Scholar
Lereboures, B., Dürr, J., d'Huysser, A., Bonelle, J. P. & Lenglet, M. (1980). Phys. Status Solidi, 62, K175.Google Scholar
Leroux, J. & Thinh, T. P. (1977). Revised tables of X-ray mass attenuation coefficients. Quebec: Corporation Scientifique Claisse, Inc.Google Scholar
Levinger, J. S. (1952). Small angle coherent scattering of gammas by bound electrons. Phys. Rev. 87, 656–662.Google Scholar
Liberman, D., Waber, J. T. & Cromer, D. T. (1965). Self-consistent field Dirac–Slater wavefunctions for atoms and ions. I. Comparison with previous calculations. Phys. Rev. A, 137, 27–34.Google Scholar
Liebhafsky, H. A., Pfeiffer, H. G., Winslow, E. H. & Zemany, P. D. (1960). X-ray absorption and emission analytical chemistry, pp. 313–317. New York: John Wiley.Google Scholar
Lindgren, I., Persson, H., Salomonson, S. & Labzowsky, L. (1995). Full QED calculations of two-photon exchange for heliumlike systems: analysis in the Coulomb and Feynman gauge. Phys. Rev. A, 51, 1167–1195.Google Scholar
Lindroth, E. & Indelicato, P. (1993). Inner shell transitions in heavy atoms. Phys. Scr. T46, 139–143.Google Scholar
Lindroth, E. & Indelicato, P. (1994). High precision calculations of inner shell transitions in heavy elements. Nucl. Instrum. Methods, B87, 222–226.Google Scholar
Lum, G. K., Wiegand, C. E., Kessler, E. G. Jr, Deslattes, R. D., Jacobs, L., Schwitz, W. & Seki, R. (1981). Kaonic mass by critical absorption of kaonic atom X-rays. Phys. Rev. D, 23, 2522–2532.Google Scholar
Lytle, F. W., Sayers, D. E. & Stern, E. A. (1989). Report of the International Workshops on Standards and Criteria in XAFS. In X-ray absorption spectroscopy. Physica (Utrecht), B158, 701–722.Google Scholar
Lytle, F. W., Stern, E. A. & Sayers, D. E. (1975). Extended X-ray-absorption fine-structure technique II. Experimental practice and selected results. Phys. Rev. B, 11, 4825–4835.Google Scholar
McMaster, W. H., Del Grande, N. K., Mallett, J. H. & Hubbell, J. H. (1969/1970). Compilation of X-ray cross sections. Report UCRL-50174. (Section I, 1970; Section II, 1969; Section III, 1969; Section IV, 1969.) Lawrence Livermore National Laboratory, Livermore, CA, USA.Google Scholar
Marcus, M., Powers, L. S., Storm, A. R., Kincaid, B. M. & Chance, B. (1980). Curved-crystal (LiF) X-ray focusing array for fluorescence EXAFS in dilute samples. Rev. Sci. Instrum. 51, 1023–1029.Google Scholar
Martens, G. & Rabe, P. (1980). EXAFS studies on superficial regions by means of total reflection. Phys. Status Solidi A, 58, 415–425.Google Scholar
Maruyama, X. K., Di Nova, K., Snyder, D., Piestrup, M. A., Li, Q., Fiorito, R. B. & Rule, D. W. (1993). A compact tunable X-ray source based on parametric X-ray generation by moderate-energy linacs. Proc. 1993 Particle Accelerator Conference. IEEE, 2, 1620–1622.Google Scholar
Materlik, G., Bedzyk, M. J. & Frahm, A. (1984). Report SR-84-07. DESY, Hamburg, Germany.Google Scholar
Matsushita, T., Ishikawa, T. & Oyanagi, H. (1986). Sagitally focusing double-crystal monochromator with constant exit height at the Photon Factory. Nucl. Instrum. Methods, A246, 377–379.Google Scholar
Matsushita, T., Kikuta, S. & Kohra, K. (1971). X-ray crystal monochromators using successive asymmetric diffractions and their applications to measurements of diffraction curves. III. Type I1 collimators. J. Phys. Soc. Jpn, 30, 1136–1144.Google Scholar
Metchnik, V. & Tomlin, S. G. (1963). On the absolute intensity of emission of characteristic X radiation. Proc. Phys. Soc. London, 81, 956–964.Google Scholar
Mohr, P. J. (1974a). Numerical evaluation of the 1S1/2 state radiative level shift. Ann. Phys. (Leipzig), 88, 52–87.Google Scholar
Mohr, P. J. (1974b). Self-energy radiative corrections in hydrogen-like systems. Ann. Phys. (Leipzig), 88, 26–51.Google Scholar
Mohr, P. J. (1975). Lamb shift in a strong Coulomb potential. Phys. Rev. Lett. 34, 1050–1052.Google Scholar
Mohr, P. J. (1982). Self-energy of the n = 2 states in a strong Coulomb field. Phys. Rev. A, 26, 2338–2354.Google Scholar
Mohr, P. J. (1992). Self-energy correction to one-electron energy levels in a strong Coulomb field. Phys. Rev. A, 46, 4421–4424.Google Scholar
Mohr, P. J. & Soff, G. (1993). Nuclear size correction to the electron self-energy. Phys. Rev. Lett. 70, 158–161.Google Scholar
Mohr, P. J. & Taylor, B. N. (2000). CODATA recommended values of the fundamental physical constants: 1998. Rev. Mod. Phys. 72, 351–495.Google Scholar
Montenegro, E. C., Baptista, G. B. & Duarte, P. W. E. P. (1978). K and L X-rays mass attenuation coefficients for low-Z materials. At. Data Nucl. Data Tables, 22, 131–177.Google Scholar
Mooney, T., Lindroth, E., Indelicato, P., Kessler, E. & Deslattes, R. D. (1992). Precision measurements of K and L transitions in xenon: experiment and theory for the K, L and M levels. Phys. Rev. A, 45, 1531–1543.Google Scholar
Mooney, T. M. (1996). Personal communication.Google Scholar
Morgenroth, W., Kirfel, A. & Fischer, K. (1994). Computing kinematic diffraction intensities with anomalous scatterers – `forbidden' axial reflections in space groups up to orthorhombic symmetry. Resonant anomalous X-ray scattering, edited by G. Materlik, C. J. Sparks & K. Fischer, pp. 257–264. Amsterdam: North Holland.Google Scholar
Müller, A. (1927). Input limits of X-ray generators. Proc. R. Soc. London Ser. A, 117, 30–42.Google Scholar
Müller, A. (1929). A spinning-target X-ray generator and its input limit. Proc. R. Soc. London Ser. A, 125, 507–516.Google Scholar
Müller, A. (1931). Further estimates of the input limits of X-ray generators. Proc. R. Soc. London Ser. A, 132, 646–649.Google Scholar
Mustre de Leon, J., Stern, E. A., Sayers, D. E., Ma, Y. & Rehr, J. J. (1988). XAFS V: Proceedings of the Fifth International Conference on X-ray Absorption Fine Structure. Amsterdam: North-Holland.Google Scholar
Nagel, D. J. (1980). Comparison of X-ray sources for exposure of photo resists. Ann. NY Acad. Sci. 342, 235–247.Google Scholar
Natoli, C. R. (1990). Multichannel multiple scattering theory with general potentials. Phys. Rev. B, 42, 1944–1968.Google Scholar
Natoli, C. R., Misemer, D. K., Doniach, S. & Kutzler, F. W. (1980). First principles calculation of X-ray absorption edge structure in molecular clusters. Phys. Rev. A, 22, 1104–1108.Google Scholar
Nelms, A. T. & Oppenheimer, I. (1955). J. Res. Natl Bur. Stand. 55, 53–62.Google Scholar
Nordfors, B. (1960). The statistical error in X-ray absorption measurements. Ark. Fys. 18, 37–47.Google Scholar
Norman, D., Durham, P. J. & Pendry, J. B. (1983). The absorption of oxygen on nickel (001) studied by XANES. EXAFS and near edge structure, edited by A. Bianconi, L. Incoccia & S. Stipcich, pp. 144–146. Berlin: Springer.Google Scholar
Nyholm, R., Berndtsson, A. & Mårtensson, N. (1980). Core level binding energies for the elements Hf to Bi (Z = 72–83). J. Phys. C, 13, L1091–L1096.Google Scholar
Nyholm, R. & Mårtensson, N. (1980). Core level binding energies for the elements Zr–Te (Z = 40–52). J. Phys. C, 13, L279-L284.Google Scholar
Oosterkamp, W. J. (1948a). The heat dissipation in the anode of an X-ray tube. Philips Res. 3, 49–59.Google Scholar
Oosterkamp, W. J. (1948b). The heat dissipation in the anode of an X-ray tube. Philips Res. 3, 161–173.Google Scholar
Oosterkamp, W. J. (1948c). The heat dissipation in the anode of an X-ray tube. Philips Res. 3, 303–317.Google Scholar
Oshima, K., Harada, J. & Sakabe, N. (1986). Curved crystal monochromator. X-ray instrumentation for the Photon Factory: dynamic analyses of micro-structures in matter, edited by S. Hosoya, Y. Iitaka & H. Hashizume, pp. 35–41. Japan: Photon Factory.Google Scholar
OSMIC (1996). Catalogue. A new family of collimating and focusing optics for X-ray analysis. OSMIC, Michigan, USA.Google Scholar
Øverbø, I. (1977). The Coulomb correction to electron pair production by intermediate-energy photons. Phys. Lett. B, 71, 412–414.Google Scholar
Øverbø, I. (1978). Large-q form factors for light atoms. Phys. Scr. 17, 547–549.Google Scholar
Oyanagi, H., Ihara, H., Matsushita, T., Hirabayashi, M., Terada, N., Tokumoto, M., Senzaki, K., Kimura, T. & Yao, T. (1987). Short range order in high Tc superconductors BaxY1−xCuO3−y and SrxLa2−xCuO4–7. Jpn. J. Appl. Phys. 26, L828–L831.Google Scholar
Oyanagi, H., Martini, M., Saito, M. & Haga, K. (1995). Nineteen element high purity Ge solid state detector array for fluorescence X-ray absorption fine structure studies. Submitted to Rev. Sci. Instrum.Google Scholar
Oyanagi, H., Matsushita, T., Tanoue, H., Ishiguro, T. & Kohra, K. (1985). Fluorescence-detected X-ray absorption spectroscopy applied to structural characterization of very thin films: ion-beam-induced modification of thin Ni layers on Si (100). Jpn. J. Appl. Phys. 24, 610–619.Google Scholar
Oyanagi, H., Takeda, T., Matsushita, T., Ishiguro, T. & Sasaki, A. (1986). Local structure in InGaAsP I quaternary alloys. J. Phys. (Paris), 28, Suppl. 12, C8, 423–426.Google Scholar
Pantos, E. (1982). The SRS program library documentation. Daresbury: SRC.Google Scholar
Papatzacos, P. & Mort, K. (1975). Delbrück scattering calculations. Phys. Rev. D, 12, 206–221.Google Scholar
Parratt, L. G. (1959). Electronic band structure of solids by X-ray spectroscopy. Rev. Mod. Phys. 31, 616–645.Google Scholar
Parratt, L. G., Porteus, I. O., Schnopper, H. W. & Watanabe, T. (1959). X-ray absorption coefficients and geometrical collimation of the beam. Rev. Sci. Instrum. 30, 344–347.Google Scholar
Peele, A. G., Nugent, K. A., Rode, A. V., Gabel, K., Richardson, M. C. M., Strack, R. & Siegmund, W. (1996). X-ray focusing with lobster-eye optics: a comparison of theory with experiment. Appl. Opt. 35, 4420–4425.Google Scholar
Pendry, J. B. (1983). The transition region between XANES and EXAFS. EXAFS and near edge structure, edited by A. Bianconi, L. Incoccia & S. Stipcich, pp. 4–10. Berlin: Springer.Google Scholar
Petiau, J. & Calas, G. (1983). EXAFS for inorganic systems, pp. 127–129. Daresbury: SRC.Google Scholar
Philips, J. C. & Hodgson, K. O. (1985). Single-crystal X-ray diffraction and anomalous scattering using synchrotron radiation. Synchrotron radiation research, edited by H. Winick & S. Doniach, pp. 565–604. New York: Plenum.Google Scholar
Philips, J. C., Templeton, D. H., Templeton, L. K. & Hodgson, K. O. (1978). L-III edge anomalous X-ray scattering by cesium measured with synchrotron radiation. Science, 201, 257–259.Google Scholar
Phillips, W. C. (1985). X-ray sources. Methods Enzymol. 114, 300–316.Google Scholar
Piestrup, M. A., Boyers, D. G., Pincus, C. I., Harris, J. L., Maruyama, X. K., Bergstrom, J. C., Caplan, H. S., Silzer, R. M. & Skopik, D. M. (1991). Quasimonochromatic X-ray source using photoabsorption-edge transition radiation. Phys. Rev. A, 43, 3653–3661.Google Scholar
Piestrup, M. A., Moran, M. J., Boyers, D. G., Pincus, C. I., Kephart, J. O., Gearhart, R. A. & Maruyama, X. K. (1991). Generation of hard X-rays from transition radiation using high-density foils and moderate-energy electrons. Phys. Rev. A, 43, 2387–2396.Google Scholar
Pirenne, M. H. (1946). The diffraction of X-rays and electrons by free molecules. Cambridge University Press.Google Scholar
Plechaty, E. F., Cullen, E. E. & Howerton, R. J. (1981). Tables and graphs of photon-interaction cross sections from 0.1 keV to 100 MeV. Derived from the LLL Evaluated-Nuclear-Data Library. Report UCRL-50400, Vol. 6, Rev. 3. Lawrence Livermore National Laboratory, Livermore, CA, USA.Google Scholar
Powell, C. J. (1995). Elemental binding energies for X-ray photoelectron spectroscopy. Appl. Surf. Sci. 89, 141–149.Google Scholar
Pratt, R. H., Kissel, L. & Bergstrom, P. M. Jr (1994). New relativistic S-matrix results for scattering – beyond the anomalous factors/beyond impulse approximation. Resonant anomalous X-ray scattering, edited by G. Materlik, C. J. Sparks & K. Fischer, pp. 9–34. Amsterdam: North Holland.Google Scholar
Price, P. F., Maslen, E. N. & Mair, S. L. (1978). Electron-density studies. III. A re-evaluation of the electron distribution in crystalline silicon. Acta Cryst. A34, 183–193.Google Scholar
Ramaseshan, S. & Abrahams, S. C. (1975). Anomalous scattering. Copenhagen: Munksgaard.Google Scholar
Reed, S. J. B. (1975). Electron microprobe analysis. Cambridge University Press.Google Scholar
Rehr, J. J. & Albers, R. C. (1990). Phys. Rev. B, 41, 8139–8144.Google Scholar
Rieck, C. D. (1962). Tables relating to the production, wavelengths, and intensities of X-rays. International tables for X-ray crystallography, Vol. III, edited by C. H. MacGillavry & G. D. Rieck, pp. 59–72. Birmingham: Kynoch Press.Google Scholar
Riggs, P. J., Mei, R., Yocum, C. F. & Penner-Hahn, J. E. (1993). The characterization of the Mn site in the photosynthetic oxygen evolving complexes: the effect of hydroxylamine and hydroquinone on the XAFS. Jpn. J. Appl. Phys. 32, Suppl. 32–2, 527–529.Google Scholar
Roy, S. C., Kissel, L. & Pratt, R. H. (1983). Elastic photon scattering at small momentum transfer and validity of form-factor theories. Phys. Rev. A, 27, 285–290.Google Scholar
Roy, S. C. & Pratt, R. H. (1982). Validity of non relativistic dipole approximation for forward Rayleigh scattering. Phys. Rev. A, 26, 651–653.Google Scholar
Rudakov, L. I., Baigarin, K. A., Kalinin, Y. G., Korolev, V. D. & Kumachov, M. A. (1991). Pulsed-plasma-based X-ray source and new X-ray optics. Phys. Fluids B (Plasma Phys.), 3, 2414–2419.Google Scholar
Sakurai, K. (1993). High-intensity X-ray line-focal spot for laboratory EXAFS measurements. Rev. Sci. Instrum. 64, 267–268.Google Scholar
Sakurai, K. & Sakurai, H. (1994). Comment on high intensity low tube-voltage X-ray source for laboratory EXAFS measurements. Rev. Sci. Instrum. 65, 2417–2418.Google Scholar
Saloman, E. B. & Hubbell, J. H. (1986). X-ray attenuation coefficients (total cross sections): comparison of the experimental data base with the recommended values of Henke and the theoretical values of Scofield for energies between 0.1–100 keV. Report NBSIR 86-3431. National Institute of Standards and Technology, Gaithersburg, MD, USA.Google Scholar
Saloman, E. B. & Hubbell, J. H. (1987). Critical analysis of soft X-ray cross section data. Nucl. Instrum. Methods, A255, 38–42.Google Scholar
Saloman, E. B., Hubbell, J. H. & Scofield, J. H. (1988). At. Data Nucl. Data Tables, 38, 1–197.Google Scholar
Sano, H., Ohtaka, K. & Ohtsuki, Y. H. (1969). Normal and abnormal absorption coefficients of X-rays. J. Phys. Soc. Jpn, 27, 1254–1261.Google Scholar
Sawada, M., Tsutsumi, K., Shiraiwa, T., Ishimura, T. & Obashi, M. (1959). Some contributions to the X-ray spectroscopy of solid state. Annu. Rep. Sci. Works Osaka Univ. 7, R–87.Google Scholar
Sayers, D. E., Lytle, F. W. & Stern, E. A. (1970). Point scattering theory of X-ray K absorption fine structure. Adv. X-ray Anal. 13, 248–256.Google Scholar
Schaupp, D., Schumacher, M., Smend, F., Rullhusen, P. & Hubbell, J. H. (1983). Small-angle Rayleigh scattering of photons at high energies: tabulations of relativistic HFS modified atomic form factors. J. Phys. Chem. Ref. Data, 12, 467–512.Google Scholar
Schmidt, V. V. (1961a). Contribution to the theory of the temperature dependence of the fine structure of X-ray absorption spectra. Bull. Acad. Sci. USSR Phys. Ser. 25, 988–993.Google Scholar
Schmidt, V. V. (1961b). On the effect of the temperature dependence of the fine structure of X-ray absorption spectra. J. Exp. Theor. Phys. 12, 886–890.Google Scholar
Schmidt, V. V. (1963). Contributions to the theory of the dependence of the fine structure of X-ray absorption spectra II. Case of high temperatures. Bull. Acad. Sci. USSR Phys. Ser. 27, 392–397.Google Scholar
Schwarzenbach, D., Abrahams, S. C., Flack, H. D., Prince, E. & Wilson, A. J. C. (1995). Statistical descriptors in crystallography. II. Report of a Working Group on Expression of Uncertainty in Measurement. Acta Cryst. A51, 565–569.Google Scholar
Schweppe, J., Deslattes, R. D., Mooney, T. & Powell, C. J. (1994). Accurate measurement of Mg and Al Kα1,2 X-ray energy profiles. J. Electron Spectrosc. Relat. Phenom. 67, 463–478.Google Scholar
Schweppe, J. E. (1995). Personal communication.Google Scholar
Schwinger, J. (1949). On the classical radiation of accelerated electrons. Phys. Rev. 75, 1912–1925.Google Scholar
Scofield, J. H. (1973). Theoretical photoionization cross sections from 1 to 1500 keV. Report UCRL-51326. Lawrence Livermore National Laboratory, Livermore, CA, USA.Google Scholar
Scofield, J. H. (1986). Personal communication to E. B. Saloman & J. H. Hubbell. Calculated photoeffect values 0.1 to 1.0 keV. [Presented in Saloman & Hubbell (1986)![[link]](/graphics/greenarr.gif)
and Saloman et al. (1988).]Google Scholar
Scott, V. D. & Love, G. (1983). Quantitative electron microprobe analysis. Cambridge University Press.Google Scholar
Sears, V. F. (1983). Optimum sample thickness for total cross section measurements. Nucl. Instrum. Methods, 213, 561–562.Google Scholar
Seka, W., Soures, J. M., Lewis, O., Bunkenburg, J., Brown, D., Jacobs, S., Mourou, X. & Zimmermann, J. (1980). High-power phosphate-glass laser system: design and performance characteristics. Appl. Opt. 19, 409–419.Google Scholar
Seka, W., Soures, J. M., Lund, L. & Craxton, R. S. (1981). GDL: a high-power 0.35 µm laser irradiation facility. IEEE J. Quantum Electron. QE-17, 1689–1693.Google Scholar
Sevillano, E., Meuth, H. & Rehr, J. J. (1978). Extended X-ray absorption fine structure Debye-Waller factors. I. Monatomic crystals. Phys. Rev. B, 20, 4908–4911.Google Scholar
Shulman, R. G., Weisenberger, P., Teo, B. K., Kincaid, B. M. & Brown, G. S. (1978). Fluorescence X-ray absorption studies of rubendoxin and its compounds. J. Mol. Biol. 124, 305–315.Google Scholar
Siddons, P. & Hart, M. (1983). Simultaneous measurements of the real and imaginary parts of the X-ray anomalous dispersion using X-ray interferometers. EXAFS and near edge structure, edited by A. Branconi, L. Incoccia & S. Stipcich, pp. 373–375. Berlin: Springer.Google Scholar
Siegbahn, M. (1925). The spectroscopy of X-rays. Oxford University Press.Google Scholar
Siemens (1996a). Parallel beam optics for measurements of samples with irregularly shaped surfaces. Laboratory Report X-ray Analysis, DXRD, 13. Karlsruhe: Siemens.Google Scholar
Siemens (1996b). Goebel mirrors for X-ray reflectometry investigations. Laboratory Report X-ray Analysis, DXRD, 14. Karlsruhe: Siemens.Google Scholar
Siemens (1996c) Grazing incidence diffraction with Goebel mirrors. Laboratory Report X-ray Analysis, DXRD, 15. Karlsruhe: Siemens.Google Scholar
Sinfelt, J. H., Via, G. H. & Lytle, F. W. (1980). Structures of biometallic clusters. Extended X-ray absorption fine structure (EXAFS) studies of Ru–Cu clusters. J. Chem. Phys. 72, 4832–4843.Google Scholar
Smith, D. Y. (1987). Anomalous X-ray scattering: relativistic effects in X-ray dispersion analysis. Phys. Rev. A, 35, 3381–3387.Google Scholar
Snigirev, A. (1994). Bragg–Fresnel optics: new fields of applications. ESRF Newsletter, 22, 20–21.Google Scholar
Soff, G. & Mohr, P. J. (1988). Vacuum polarization in a strong external field. Phys. Rev. A, 38, 5066–5075.Google Scholar
Sorenson, L. B., Cross, J. O., Newville, M., Ravel, B., Rehr, J. J., Stragier, H., Bouldin, C. E. & Woicik, J. C. (1994). Diffraction anomalous fine structure: unifying X-ray diffraction and X-ray absorption with DAFS. In Resonant anomalous X-ray scattering, edited by G. Materlik, C. J. Sparks & K. Fischer, pp. 389–420. Amsterdam: North Holland.Google Scholar
Stanglmeier, F., Lengeler, B., Weber, W., Gobel, H. & Schuster, M. (1992). Determination of the dispersive correction f′(E) to the atomic form factor from X-ray reflection. Acta Cryst. A48, 626–639.Google Scholar
Stearns, D. G. (1984). Broadening of extended X-ray absorption fine structure ensuing from the finite lifetime of the K hole. Philos. Mag. 49, 541–558.Google Scholar
Stephens, P. W., Eng, P. J. & Tse, T. (1992). Construction and performance of a bent crystal X-ray monochromator. Rev. Sci. Instrum. 64, 374–378.Google Scholar
Stephenson, S. T. (1957). The continuous X-ray spectrum. Handbuch der Physik. XXX: X-rays, edited by S. Flügge, pp. 337–370. Berlin: Springer.Google Scholar
Stern, E. A. (1980). Editor. Laboratory EXAFS facilities 1980. AIP Conf. Proc. No. 64.Google Scholar
Stern, E. A., Bunker, B. & Heald, A. (1981). Understanding the causes of non-transferability of EXAFS amplitude. EXAFS spectroscopy: techniques and applications, edited by B. K. Teo & D. C. Joy, pp. 59–79. New York: Plenum.Google Scholar
Stern, E. A., Sayers, D. E. & Lytle, F. W. (1975). Extended X-ray absorption fine structure technique. III. Determination of physical parameters. Phys. Rev. B, 11, 4836–4846.Google Scholar
Stibius-Jensen, M. (1979). Some remarks on the anomalous scattering factors for X-rays. Phys. Lett. A, 74, 41–44.Google Scholar
Stibius-Jensen, M. (1980). Atomic X-ray scattering factors for forward scattering beyond the dipole approximation. Personal communication.Google Scholar
Stohr, J., Denley, D. & Perfettii, P. (1978). Surface extended X-ray absorption fine structure in the soft X-ray region: study of an oxidized Al surface. Phys. Rev. B, 18, 4132–4135.Google Scholar
Storm, E. & Israel, H. I. (1970). Photon cross sections from 0.001 to 100 MeV for elements 1 through 100. Nucl. Data Tables, A7, 565–681.Google Scholar
Stuhrmann, H. (1982). Editor. Uses of synchrotron radiation in biology. Esp. Properties of synchrotron radiation, Chap. 1, by G. Materlik. London: Academic Press.Google Scholar
Suller, V. P. (1992). Review of the status of synchrotron radiation storage rings. Third European Particle Accelerator Conference. Editions Frontières, 1, 77–81.Google Scholar
Suortti, P., Hastings, J. B. & Cox, D. E. (1985). Powder diffraction with synchrotron radiation. II. Dispersion factors of Ni. Acta Cryst. A41, 417–420.Google Scholar
Sussini, J. & Labergerie, D. (1995). Bi-morph piezo-electric mirror: a novel active mirror. Synchrotron Rad. News, 8, 21–26.Google Scholar
Takama, T., Iwasaki, N. & Sato, S. (1980). Measurement of X-ray Pendellösung intensity beats in diffracted white radiation from silicon wafers. Acta Cryst. A36, 1025–1030.Google Scholar
Takama, T., Kobayashi, K. & Sato, S. (1982). Determination of the atomic scattering factor of aluminium by the Pendellösung beat measurement using white radiation. Trans. Jpn. Inst. Met. 23, 153–160.Google Scholar
Takama, T. & Sato, S. (1982). Atomic scattering factors of copper determined by Pendellösung beat measurements using white radiation. Philos. Mag. 45, 615–626.Google Scholar
Takama, T. & Sato, S. (1984). Determination of the atomic scattering factors of germanium by means of the Pendellösung beat measurement using white radiation. Jpn. J. Appl. Phys. 20, 1183–1190.Google Scholar
Taylor, A. (1949). A 5 kW crystallographic X-ray tube with a rotating anode. J. Sci. Instrum. 26, 225–229.Google Scholar
Taylor, A. (1956). Improved demountable crystallographic rotating anode X-ray tube. Rev. Sci. Instrum. 27, 757–759.Google Scholar
Taylor, B. N. & Kuyatt, C. E. (1994). Guidelines for evaluating and expressing the uncertainty of NIST measurement results. NIST Technical Note No. 1297. Gaithersburg, MD: National Institute of Standards and Technology.Google Scholar
Templeton, D. H. (1994). X-ray resonance, then and now. In Resonant anomalous X-ray scattering: theory and applications, edited by G. Materlik, C. J. Sparks & K. Fischer, pp. 1–7. Amsterdam: North Holland.Google Scholar
Templeton, D. H. & Templeton, L. K. (1982). X-ray dichroism and polarized anomalous scattering of the uranyl ion. Acta Cryst. A38, 62–67.Google Scholar
Templeton, D. H. & Templeton, L. K. (1985a). X-ray dichroism and anomalous scattering of potassium tetrachloroplatinate(II). Acta Cryst. A41, 356–371.Google Scholar
Templeton, D. H. & Templeton, L. K. (1985b). Tensor X-ray optical properties of the bromate ion. Acta Cryst. A41, 133–142.Google Scholar
Templeton, D. H. & Templeton, L. K. (1986). X-ray birefringence and forbidden reflections in sodium bromate. Acta Cryst. A42, 478–481.Google Scholar
Templeton, D. H., Templeton, L. K., Philips, J. C. & Hodgson, K. O. (1980). Anomalous scattering of X-rays by cesium and cobalt measured with synchrotron radiation. Acta Cryst. A36, 436–442.Google Scholar
Templeton, L. K. & Templeton, D. H. (1978). Cesium hydrogen tartrate and anomalous dispersion of cesium. Acta Cryst. A34, 368–373.Google Scholar
Teo, B. K. (1981). EXAFS spectroscopy: techniques and applications, edited by B. K. Teo and D. C. Joy, Chap. 3, pp. 13–59. New York: Plenum.Google Scholar
Teo, B. K. & Joy, D. C. (1981). Editors. EXAFS spectroscopy: techniques and applications. New York: Plenum.Google Scholar
Teo, B. K. & Lee, P. A. (1979). Ab initio calculations of amplitude and phase functions for extended X-ray absorption fine structure spectroscopy. J. Am. Chem. Soc. 101, 2815–2832.Google Scholar
Teo, B. K., Lee, P. A., Simons, A. L., Eisenberger, P. & Kincaid, B. M. (1977). EXAFS. Approximation, parameterization and chemical transferability of amplitude function. J. Am. Chem. Soc. 99, 3854–3856.Google Scholar
Theisen, R. & Vollath, D. (1967). Tables of X-ray mass attenuation coefficients. Düsseldorf: Verlag Stahleisen.Google Scholar
Thomas, L. H. (1927). The calculation of atomic fields. Proc. Cambridge Philos. Soc. 23, 542–548.Google Scholar
Thompson, D. J. & Poole, M. W. (1979). Editors. European Synchrotron Radiation Facility. Suppl. II: The machine. Strasbourg: ESF.Google Scholar
Thomsen, J. S. & Burr, A. F. (1968). Biography of the x-unit – the X-ray wavelength scale. Am. J. Phys. 36, 803–810.Google Scholar
Tohji, K., Udagawa, Y., Kawasaki, T. & Masuda, K. (1983). Laboratory EXAFS spectrometer with a bent-crystal, a solid-state detector, and a fast detection system. Rev. Sci. Instrum. 54, 1482–1487.Google Scholar
Uehling, E. A. (1935). Polarization effects in the positron theory. Phys. Rev. 48, 55–63.Google Scholar
Veigele, W. J. (1973). Photon cross sections from 0.1 keV to 1 MeV for elements Z = 1 to Z = 94. At. Data, 5, 51–111.Google Scholar
Victoreen, J. A. (1949). The calculation of X-ray mass absorption coefficients. J. Appl. Phys. 20, 1141–1147.Google Scholar
Wagenfeld, H. (1975). Theoretical computations of X-ray dispersion corrections. Anomalous scattering, edited by S. Ramaseshan & S. C. Abrahams, pp. 12–23. Copenhagen: Munksgaard.Google Scholar
Waller, I. (1928). Über eine verallgemeinerte Streuungsformel. Z. Phys. 51, 213–231.Google Scholar
Wang, M. S. (1986). Relativistic dispersion relation for X-ray anomalous scattering factor. Phys. Rev. A, 34, 636–637.Google Scholar
Wang, M. S. & Pratt, R. H. (1983). Importance of bound–bound transitions in the dispersion relation for calculation of soft-X-ray forward Rayleigh scattering from light elements. Phys. Rev. A, 28, 3115–3116.Google Scholar
Warren, B. E. (1968). X-ray diffraction. New York: Addison-Wesley.Google Scholar
Wichmann, E. H. & Kroll, N. M. (1956). Vacuum polarization in a strong Coulomb field. Phys. Rev. 101, 843–859.Google Scholar
Wilson, R. R. (1941). A vacuum-tight sliding seal. Rev. Sci. Instrum. 12, 91–93.Google Scholar
Winick, H. (1980). Properties of synchrotron radiation. In Synchrotron radiation research, edited by H. Winick & S. Doniach. New York: Plenum.Google Scholar
Winick, H. & Bienenstock, A. (1978). Synchrotron radiation research. Ann. Rev. Nucl. Sci. 28, 33–113.Google Scholar
Winick, H. & Doniach, S. (1980). Editors. Synchrotron radiation research. New York: Plenum.Google Scholar
Woodruff, D. P. (1986). Fine structure in ionization cross sections and applications to surface science. Rep. Prog. Phys. 49, 683–723.Google Scholar
Yaakobi, B., Boehli, T., Bourke, P., Conturie, Y., Craxton, R. S., Delettrez, J., Forsyth, J. M., Frankel, R. D., Goldman, L. M., McCrory, L. R., Richardson, M. C., Seka, W., Shvarts, D. & Soures, J. M. (1981). Characteristics of target interaction with high-power UV laser radiation. Opt. Commun. 39, 175–179.Google Scholar
Yaakobi, B., Bourke, P., Conturie, Y., Delettrez, J., Forsyth, J. M., Frankel, R. D., Goldman, L. M., McCrory, L. R., Seka, W., Soures, J. M., Burek, A. J. & Deslattes, R. D. (1981). High X-ray conversion efficiency with target irradiation by a frequency-tripled Nd:glass laser. Opt. Commun. 38, 196–200.Google Scholar
Yamaguchi, T., Mitsunaga, T., Yoshida, N., Wakita, H., Fujiwara, M., Matsushita, T., Ikeda, S. & Nomura, M. (1993). XAFS study with an in situ electrochemical cell on manganese Schiff base complexes as a model of a photosystem. Jpn. J. Appl. Phys. 32, Suppl. 32-2, 533–535.Google Scholar
Yao, T. (1992). Lanthanum hexaboride filament in an X-ray generator of a laboratory EXAFS facility. Rev. Sci. Instrum. 63, 2103–2104.Google Scholar
Yeh, J. J. & Lindau, I. (1985). Atomic subshell photoionization cross sections and asymmetry parameters: 1 ≤ Z ≤ 103. At. Data Nucl. Data Tables, 32, 1–156.Google Scholar
Yoshimatsu, M. & Kozaki, S. (1977). High-brilliance X-ray sources. X-ray optics, edited by H.-J. Queisser, Chap. 2. Berlin: Springer.Google Scholar
Young, R. A. (1963). Balanced filters for X-ray diffractometry. Z. Kristallogr. 118, 233–247.Google Scholar
Young, R. A. (1993). The Rietveld method. Oxford University Press.Google Scholar
Zachariasen, W. H. (1945). Theory of X-ray diffraction in crystals. New York: Dover.Google Scholar