International
Tables for Crystallography Volume C Mathematical, physical and chemical tables Edited by E. Prince © International Union of Crystallography 2006 |
International Tables for Crystallography (2006). Vol. C. ch. 4.2, p. 220
Section 4.2.3.5. Comments
D. C. Creaghb
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For reliable experiments using XAFS and XANES to be undertaken, intense-radiation sources must be used. Synchrotron-radiation sources are such a source of highly intense X-rays. Their ready availability to experimenters and the comparative simplicity of the equipment required to perform the experiments have made experiments involving XAFS and XANES very much easier to perform than has hitherto been the case.
At some synchrotron-radiation sources, database and program libraries for the storage and analysis of XAFS and XANES data exist. These are usually part of the general computing facilities (Pantos, 1982).
Crystallographers seeking information concerning the nature and extent of these computer facilities can find such information by contacting the computer centre at one of the synchrotron-radiation establishments listed in Table 4.2.3.1.
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