International
Tables for Crystallography Volume C Mathematical, physical and chemical tables Edited by E. Prince © International Union of Crystallography 2006 |
International Tables for Crystallography (2006). Vol. C. ch. 4.3, pp. 401-403
Section 4.3.4.3.3. Real solids
C. Colliexa
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The dielectric constants of many solids have been deduced from a number of methods involving either primary photon or electron beams. In optical measurements, one obtains the values of and
from a Krakers–Kronig analysis of the optical absorption and reflection curves, while in electron energy-loss measurements they are deduced from Kramers–Kronig analysis of energy-loss functions.
Fig. 4.3.4.18
shows typical behaviours of the dielectric and energy-loss functions.
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Čerenkov radiation is emitted when the velocity v of an electron travelling through a medium exceeds the speed of light for a particular frequency in this medium. The criterion for Čerenkov emission is
In an insulator, is positive at low energies and can considerably exceed unity, so that a `radiation peak' can be detected in the corresponding energy-loss range (between 2 and 4 eV in Si, Ge, III–V compounds, diamond,
); see Von Festenberg (1968
), Kröger (1970
), and Chen & Silcox (1971
). The associated scattering angle,
for high-energy electrons, is very small and this contribution can only be detected using a limited forward-scattering angular acceptance.
In an anisotropic crystal, the dielectric function has the character of a tensor, so that the energy-loss function is expressed as
If it is transformed to its orthogonal principal axes , and if the q components in this system are
, the above expression simplifies to
In a uniaxial crystal, such as a graphite, and
(i.e. parallel to the c axis):
where
is the angle between q and the c axis. The spectrum depends on the direction of q, either parallel or perpendicular to the c axis, as shown in Fig. 4.3.4.19
from Venghaus (1975
). These experimental conditions may be achieved by tilting the graphite layer at 45° with respect to the incident axis, and recording spectra in two directions at
with respect to it (see Fig. 4.3.4.20
).
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