International
Tables for Crystallography Volume C Mathematical, physical and chemical tables Edited by E. Prince © International Union of Crystallography 2006 |
International Tables for Crystallography (2006). Vol. C. ch. 5.2, p. 491
|
X-ray powder methods for the accurate determination of lattice parameters can be divided broadly into four groups, depending on the type of dispersion, type of source, and the type of detector. They are:
The geometry, advantages, and some practical details of the methods are given in the sections whose numbers are given in parentheses. The techniques will be discussed in the above order in Sections 5.2.4–5.2.8
. More details of systematic errors in diffractometry are given in Wilson (1963
, 1965c
, 1974
). Some general points on checking precision and accuracy were made in Chapter 5.1
. Many of them are treated in greater detail in Section 2.3.5
, and are recapitulated in Section 5.2.13
.
The technique of choice will depend on the accuracy required and on the nature and quantity of the material available. At present, the technique most frequently used for the purposes of this chapter is angle-dispersive diffractometry with a conventional tube source (1). Angle-dispersive diffractometry with synchrotron radiation (2) is capable of greater precision and accuracy, but access to the synchrotron sources is cumbersome and may involve long waiting periods. Energy-dispersive methods (3) would ordinarily be adopted only if the required environmental conditions (high or low temperatures, high pressures, ) can be achieved most readily by means of a fixed-angle diffractometer. Camera methods (4) are adaptable to small quantities of material, but microdiffractometers (Subsection 2.3.1.5
) can be used with similar or even smaller quantities.
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