X-ray diffraction methods: polycrystalline

Parrish, W.; Wilson, A. J. C.; Langford, J. I.

doi:10.1107/97809553602060000596

Aberrations

centroid displacements 5.2.4.1, 5.2.4

geometrical 5.2.3

of an energy-dispersive diffractometer 5.2.7.1

physical 5.2.3, 5.2.4.1

refraction 5.2.2.2

Accuracy 5.2.2.1, 5.2.2.1

factors determining 5.2.13

Analytical extrapolation of lattice

parameters 5.2.3.1, 5.2.3.2

Angle-dispersive diffractometry 5.2.1.1, 5.2.1.1, 5.2.1.1, 5.2.4, 5.2.5

Axial divergence 5.2.4.1, 5.2.7.1

Axial-divergence error 5.2.4.1

Backlash in diffractometer drives 5.2.13

Beam divergence 5.2.8.1

Best overall fit 5.2.3.1

Bond method 5.2.9

Bragg angle

errors 5.2.1.3

operational definitions 5.2.1.4

Bragg–Brentano (Parrish) angle-dispersive diffractometers 5.2.4

Camera methods for lattice-parameter determination 5.2.1.1, 5.2.1.1, 5.2.8

Centroid of a reflection 5.2.1.4

Centroid of wavelength distribution 5.2.2.1, 5.2.3.1, 5.2.3.1

Cerium oxide (intensity standard) 5.2.11, 5.2.11.1

Chromium oxide (intensity standard) 5.2.11, 5.2.11.1

Corundum

intensity standard 5.2.11, 5.2.11.1

Debye–Scherrer camera

aberrations in 5.2.8.1

Detection

of systematic error 5.2.9, 5.2.10

Diffractometers

Bragg–Brentano 5.2.1.4, 5.2.4

gears 5.2.13

Seemann–Bohlin 5.2.1.4, 5.2.4

Diffractometry

angle-dispersive 5.2.1.1, 5.2.1.1, 5.2.1.1, 5.2.4, 5.2.5

energy-dispersive 5.2.1.1

Energy-dispersive

diffractometer, aberrations of 5.2.7.1

methods, in lattice-spacing determination 5.2.7

techniques 5.2.7

Equatorial divergence 5.2.7.1

Errors

and uncertainties in wavelength 5.2.2.1

of the Bragg angle 5.2.1.3

External standard 5.2.10

Extrapolation in lattice-parameter determination

analytical 5.2.3.1, 5.2.3.2, 5.2.3.2

graphical 5.2.3.2

Factors determining accuracy 5.2.13

Film shrinkage 5.2.8.1

Fluctuations

in particle orientation 5.2.2.3

in recording counts 5.2.2.3

Fluorophlogopite reflection angles 5.2.10.6

Geometrical aberrations 5.2.3

Graphical extrapolation of lattice parameters 5.2.3.2

Inclination of plane of specimen 5.2.4.1

Intensity

standards 5.2.11

Internal

standard 5.2.10

Knife-edge calibration 5.2.8.1

Lanthanum hexaboride

instrumental sample 5.2.12

Lattice-parameter determination 5.2.1.1

aberrations in 5.2.3.1

least-squares methods 5.2.9, 5.2.9

powder diffraction 5.2.1.1

standards 5.2.10

systematic errors in 5.2.3.1, 5.2.9

wavelength problems 5.2.2

Lattice-parameter determination methods

camera 5.2.8

diffractometer 5.2.4, 5.2.5

energy-dispersive 5.2.7

polycrystalline X-ray 5.2.1.1

synchrotron 5.2.5

whole-pattern 5.2.6

Lattice parameters

of silicon 5.2.10

of silver 5.2.10

of tungsten 5.2.10

Least-squares refinement 5.2.13

Lorentz factor 5.2.7.1

Mean-square broadening 5.2.3.1

Measured profile

as a convolution 5.2.13

Microdiffractometers 5.2.1.1

Multichannel pulse-height analyser 5.2.7, 5.2.7, 5.2.7

NIST (National Institute of Standards and Technology)

silicon standard 5.2.5

Particle orientation, fluctuations 5.2.2.3

Peak

of a reflection 5.2.1.4

Photographic film

shrinkage 5.2.8.1

Physical aberrations 5.2.3

Powder diffraction

standards 5.2.10

Precision 5.2.2.3, 5.2.13

Profile fitting 5.2.1.4

computer procedures 5.2.1.4

Recording counts

fluctuations 5.2.2.3

Refinement

least-squares 5.2.13

Reflection

angles 5.2.10, 5.2.10, 5.2.10.2, 5.2.10.3, 5.2.10.4

Refraction

correction for 5.2.2.2

Remanent systematic error

testing for 5.2.9

Rietveld method 5.2.3.1, 5.2.6

Rutile

intensity standard 5.2.11.1

Seemann–Bohlin diffractometers 5.2.4

Silicon

lattice parameter of 5.2.5, 5.2.10

Silver behenate reflection angles 5.2.10.7

Silver

lattice parameter of 5.2.10

Soller slits 5.2.4.1, 5.2.4.1, 5.2.4.1

Specimen

absorption 5.2.7.1, 5.2.8.1

displacement 5.2.4.1, 5.2.8.1

preparation 5.2.13

surface displacement 5.2.10, 5.2.13

transparency 5.2.4.1, 5.2.7.1, 5.2.10, 5.2.10

Standard reference materials 5.2.10

Standards

intensity 5.2.10

powder-diffraction 5.2.10

Standard specimens 5.2.12

Statistical fluctuations 5.2.2.3

Synchrotron radiation

determination of wavelength 5.2.5, 5.2.5

sources 5.2.5

Systematic errors 5.2.2.1, 5.2.13

detection and treatment 5.2.9, 5.2.10

testing for 5.2.9

Time-constant errors 5.2.1.4

Tungsten

lattice parameter of 5.2.10

reflection angles 5.2.10, 5.2.10.5

Wavelength problems 5.2.2

Wavelengths

errors 5.2.2.1

X-ray powder techniques 5.2.1.1

Zero-angle calibration 5.2.4.1

Zinc oxide (intensity standard) 5.2.11.1

Chapter 5.2. X-ray diffraction methods: polycrystalline

Chapter index