International
Tables for
Crystallography
Volume C
Mathematical, physical and chemical tables
Edited by E. Prince

© International Union of Crystallography 2006
International Tables for Crystallography (2006). Vol. C. ch. 5.4, pp. 537-540
https://doi.org/10.1107/97809553602060000598

Chapter 5.4. Electron-diffraction methods

A. W. S. Johnsona and A. Olsenb

aCentre for Microscopy and Microanalysis, University of Western Australia, Nedlands, WA 6009, Australia, and bDepartment of Physics, University of Oslo, PO Box 1048, N-0316 Blindern, Norway

References

First citationEdington, J. W. (1975). Electron diffraction in the electron microscope. Monographs in practical electron microscopy in materials science, No. 2. Eindhoven: N. V. Philips Gloeilampenfabrieken.Google Scholar
 First citationFitzGerald, J. D. & Johnson, A. W. S. (1984). A simplified method of electron microscope voltage measurement. Ultramicroscopy, 12, 231–236.Google Scholar
 First citationGard, J. A. (1976). Electron microscopy in mineralogy, p. 52. Berlin: Springer.Google Scholar
 First citationGjønnes, J. & Olsen, A. (1984). Analytical electron microscopy. JEOL News, 22E, 13–18.Google Scholar
 First citationHirsch, P. B., Howie, A., Nicholson, R. B., Pashley, D. W. & Whelan, M. J. (1965). Electron microscopy of thin crystals. London: Butterworth.Google Scholar
 First citationHøier, R. (1969). A method to determine the ratio between lattice parameter and electron wavelength from Kikuchi line intersections. Acta Cryst. A25, 516–518.Google Scholar
 First citationInternational Tables for Crystallography (2005). Vol. A. Heidelberg: Springer.Google Scholar
 First citationJones, P. M., Rackham, G. M. & Steeds, J. W. (1977). Higher order Laue zone effects in electron diffraction and their use in lattice parameter determination. Proc. R. Soc. London Ser. A, 354, 197–222.Google Scholar
 First citationLePage, Y. (1992). Ab initio primitive cell parameters from single convergent beam patterns: a converse route to the identification of microcrystals with electrons. Microsc. Res. Tech. 21, 158–165.Google Scholar
 First citationOlsen, A. (1976a). Lattice parameter determination using Kikuchi-line intersections: application to olivine and feldspar. J. Appl. Cryst. 9, 9–13.Google Scholar
 First citationOlsen, A. (1976b). Determination of lattice constants using Kikuchi line intersections. Solid State Group Report Series. Institute of Physics, University of Oslo, Norway.Google Scholar
 First citationRackham, G. M., Jones, P. M. & Steeds, J. W. (1974). Upper layer diffraction effects in zone axis patterns. Proceedings of the Eighth International Congress on Electron Microscopy, Canberra, Australia, pp. 336–337.Google Scholar
 First citationSteeds, J. W. (1979). Convergent beam electron diffraction. Introduction to analytical electron microscopy, edited by J. J. Hren, J. I. Goldstein & D. C. Joy, pp. 387–422. New York: Plenum.Google Scholar
 First citationThomas, G. (1970). Kikuchi electron diffraction and applications. Modern diffraction and imaging techniques in material science, edited by S. Amelinckx, S. Gevers, G. Remaut & J. Van Landuyt, pp. 131–185. Amsterdam: North-Holland.Google Scholar
 First citationUyeda, R., Nonoyama, M. & Kogiso, M. (1965). Determination of the wavelength of electrons from a Kikuchi pattern. J. Electron Microsc. 14, 296–300.Google Scholar
 First citationWalker, A. R. & Booker, G. R. (1982). A selected-area channelling pattern (SACP) method for measuring small local changes in lattice parameter with bulk specimens. Electron microscopy 1982, Vol. 1, pp. 651–652. Hamburg: Elsevier.Google Scholar
 First citationZuo, J. M. (1993). New method of Bravais lattice determination. Ultramicroscopy, 52, 459–464.Google Scholar