Figure 8.8.1

Gjønnes, J.

doi:10.1107/97809553602060000616

International
Tables for
Crystallography
Volume C
Mathematical, physical and chemical tables
Edited by E. Prince

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International Tables for Crystallography (2006). Vol. C. ch. 8.8, p. 736

Figure 8.8.1

J. Gjønnes^a

^a Department of Physics, University of Oslo, PO Box 1048, Blindern, N-0316 Oslo, Norway

Figure 8.8.1

Schematic representations of four convergent-beam configurations used for structure-factor determination: (a) intensity profile of a low-order reflection, g; (b) non-systematic three- or four-beam configuration with a strong coupling reflection, h; (c) symmetric many-beam configuration in a dense zone; (d) integrated intensity measurement of high-order reflections using a wide aperture (Taftø & Metzger, 1985).