International Tables for Crystallography
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Accurate structure-factor determination with electron diffraction International Tables for Crystallography (2006). Vol. C, ch. 8.8, pp. 735-743 [ doi:10.1107/97809553602060000616 ] Abstract Techniques for accurate structure-factor determination with electron diffraction are discussed. Topics covered include: the systematic row method; three- and four-beam nonsystematic cases; zone-axis convergent-beam electron diffraction; the critical voltage and intersecting-Kikuchi-line method; phases and absorption in multiple-beam cases; and thickness fringes. |
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About International Tables for Crystallography
International Tables for Crystallography is the definitive resource and reference work for crystallography. The multi-volume series comprises articles and tables of data relevant to crystallographic research and to applications of crystallographic methods in all sciences concerned with the structure and properties of materials.