International
Tables for Crystallography Volume F Crystallography of biological macromolecules Edited by M. G. Rossmann and E. Arnold © International Union of Crystallography 2006 |
International Tables for Crystallography (2006). Vol. F. ch. 11.2, p. 213
Section 11.2.5.1. Determination of the best background plane
aMRC Laboratory of Molecular Biology, Hills Road, Cambridge CB2 2QH, England |
The background plane constants a, b, c are determined by minimizing where is the total counts at the pixel with coordinates with respect to the centre of the measurement box, and the summation is over the n background pixels. is a weight which should ideally be the inverse of the variance of . Assuming that the variance is determined by counting statistics, this gives where G is the gain of detector, which converts pixel counts to equivalent X-ray photons, and is the expectation value of the background counts . In practice, the variation in background across the measurement box is usually sufficiently small that all weights can be considered to be equal.
This gives the following equations for a, b and c, as given in Rossmann (1979), where all summations are over the n background pixels.
It is not unusual for the diffraction pattern to display features other than the Bragg diffraction spots from the crystal of interest. Possible causes are the presence of a satellite crystal or twin component, white-radiation streaks, cosmic rays or zingers. In order to minimize their effect on the determination of the background plane constants, the following outlier rejection algorithm is employed:
The rationale for using a subset of the pixels with the lowest pixel values in step (1) is that the presence of zingers or cosmic rays, or a strongly diffracting satellite crystal, can distort the initial calculation of the background plane so much that it becomes difficult to identify the true outliers. Such features will normally only affect a small percentage of the background pixels and will invariably give higher than expected pixel counts. Selecting a subset with the lowest pixel values will facilitate identification of the true outliers. The initial bias in the resulting plane constant c due to this procedure will be corrected in step (3). Poisson statistics are used to evaluate the standard deviations used in outlier rejection, and the standard deviation used in step (2) is increased to allow for the choice of background pixels in step (1).
References
Rossmann, M. G. (1979). Processing oscillation diffraction data for very large unit cells with an automatic convolution technique and profile fitting. J. Appl. Cryst. 12, 225–238.Google Scholar