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International
Tables for Crystallography Volume G Definition and exchange of crystallographic data Edited by S. R. Hall and B. McMahon © International Union of Crystallography 2006 |
International Tables for Crystallography (2006). Vol. G. ch. 3.3, p. 128
Section 3.3.8.9. Use of an incident-intensity monitor
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NIST Center for Neutron Research, National Institute of Standards and Technology, Gaithersburg, Maryland 20899-8562, USA |
For radiation sources for which the intensity may vary, such as synchrotron-radiation sources, the intensity of the incident radiation is measured using an incident-intensity monitor. This value may be specified for every data point using _pd_meas_counts_monitor (or _pd_meas_intensity_monitor) by including this data item in the loop with the diffraction intensities. For some instruments, counting times are set so that the same number of monitor counts are measured for each data point. If this is the case, _pd_meas_counts_monitor will be the same for every data point and need not be included in the loop.
