International Tables for Crystallography
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Two-dimensional powder diffraction International Tables for Crystallography (2019). Vol. H, ch. 2.5, pp. 118-149 [ doi:10.1107/97809553602060000940 ] Abstract Two-dimensional X-ray diffraction, also referred to as 2D powder diffraction, covers X-ray diffraction applications with a 2D detector and corresponding data reduction and analysis. A two-dimensional diffraction pattern contains abundant information about the atomic arrangement, microstructure and defects of a solid or liquid material. In recent years, use of two-dimensional detectors has dramatically increased in academic research and various industries. When a 2D detector is used for X-ray powder diffraction, the diffraction cones are intercepted by the area detector and the X-ray intensity distribution on the sensing area is converted to a 2D diffraction pattern. A 2D diffraction pattern contains far more information than a conventional diffraction pattern, and therefore demands a special data-collection strategy and data-evaluation algorithms. This chapter covers the basic concepts and recent progress in two-dimensional X-ray diffraction theory and technologies, including geometry conventions, X-ray source and optics, two-dimensional detectors, and diffraction-data interpretation, and various applications, such as phase identification, texture, stress, crystallinity and crystallite-size analysis. |
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About International Tables for Crystallography
International Tables for Crystallography is the definitive resource and reference work for crystallography. The multi-volume series comprises articles and tables of data relevant to crystallographic research and to applications of crystallographic methods in all sciences concerned with the structure and properties of materials.