International Tables for Crystallography

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Surfaces
Yasuhiro Iwasawa, Kiyotaka Asakura, Hiroshi Kondoh and Mizuki Tada. International Tables for Crystallography (2023). Vol. I [ doi:10.1107/S1574870720008393 ]

Abstract

X-rays can penetrate deeply into and pass through almost all samples, so that X-ray irradiation/detection methods such as X-ray absorption fine structure (XAFS) are not sensitive to sample surfaces. In order to determine surface structures, XAFS requires detection techniques such as electron yield, total reflection etc. and special samples such as nanoparticles with large surface to bulk ratios, monolayer samples etc. Since chemical reactions and catalysis occur at active surfaces, in situ and time-resolved methods are mandatory to analyse the surface active structures and reaction mechanisms. Spatial resolution techniques are also necessary to analyse real catalytic systems, which often have spatially heterogeneous properties. Here, modern extended XAFS (EXAFS) techniques are reviewed.


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About International Tables for Crystallography

International Tables for Crystallography is the definitive resource and reference work for crystallography. The multi-volume series comprises articles and tables of data relevant to crystallographic research and to applications of crystallographic methods in all sciences concerned with the structure and properties of materials.