International Tables for Crystallography
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Inelastic X-ray scattering International Tables for Crystallography (2022). Vol. I [ doi:10.1107/S1574870720007557 ] Abstract The first- and second-order terms of the X-ray scattering cross section are given and an overview is provided of the excitations that can be studied using inelastic X-ray scattering. The second-order (resonant) term is then elaborated on and the role of the core-hole lifetime broadening is explained. Approximations and the one-electron transitions that describe the scattering process are briefly addressed in a simplified equation. X-ray emission (fluorescence) and outline momentum, angular and polarization dependence of the resonant scattering process are discussed. |
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About International Tables for Crystallography
International Tables for Crystallography is the definitive resource and reference work for crystallography. The multi-volume series comprises articles and tables of data relevant to crystallographic research and to applications of crystallographic methods in all sciences concerned with the structure and properties of materials.