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Whole powder pattern modelling: microstructure determination from powder diffraction data
Leoni, M., International Tables for Crystallography (2019). Vol. H, ch. 3.6, pp. 288-303 [ doi:10.1107/97809553602060000951 ]
155–161. Google Scholar Armstrong, N., Leoni, M. & Scardi, P. (2006). Considerations concerning Wilkens' theory of dislocation line-broadening. Z. Kristallogr. Suppl. 23, 81–86. Google Scholar Balogh, L., Ribárik, G ...

Beyond the Warren–Averbach method
Leoni, M., International Tables for Crystallography (2019). Vol. H, Section 3.6.2.4, pp. 290-290 [ doi:10.1107/97809553602060000951 ]

     [more results from section 3.6.2 in volume H]

Nanocrystalline ceria
Leoni, M., International Tables for Crystallography (2019). Vol. H, Section 3.6.3.1, pp. 298-299 [ doi:10.1107/97809553602060000951 ]
References Caglioti, G., Paoletti, A. & Ricci, F. P. (1958). Choice of collimator for a crystal spectrometer for neutron diffraction. Nucl. Instrum. 3, 223–228. Google Scholar Leoni, M., Di Maggio, R., Polizzi, S. & Scardi, P ...
     [more results from section 3.6.3 in volume H]

Introduction
Leoni, M., International Tables for Crystallography (2019). Vol. H, Section 3.6.1, pp. 288-289 [ doi:10.1107/97809553602060000951 ]
size determination. Phys. Rev. 56, 978–982. Google Scholar Scardi, P., Leoni, M. & Delhez, R. (2004). Line broadening analysis using integral breadth methods: a critical review. J. Appl. Cryst. 37, 381–390. Google Scholar ...

Domain size and domain-size distributions
Leoni, M., International Tables for Crystallography (2019). Vol. H, ch. 5.1, pp. 524-537 [ doi:10.1107/97809553602060000966 ]
David, W. I., Leoni, M. & Scardi, P. (2010). Domain size analysis in the Rietveld method. Mater. Sci. Forum, 651, 187–200. Google Scholar Drits, V. A., Srodon, J. & Eberl, D. D. (1997). XRD measurement of mean crystallite thickness ...

Fourier methods
Leoni, M., International Tables for Crystallography (2019). Vol. H, Section 5.1.3, pp. 526-526 [ doi:10.1107/97809553602060000966 ]


Histogram (arbitrary) distributions
Leoni, M., International Tables for Crystallography (2019). Vol. H, Section 5.1.10, pp. 533-534 [ doi:10.1107/97809553602060000966 ]
in 2θ space and using the result of Wilson for a single sphere [equation (5.1.43) ]: the global profile is simply the weighted sum of the profiles corresponding to each size component. References David, W. I., Leoni, M ...

Introduction
Leoni, M., International Tables for Crystallography (2019). Vol. H, Section 5.1.1, pp. 524-524 [ doi:10.1107/97809553602060000966 ]
ray diffraction peaks. J. Phys. Condens. Matter, 24, 215301. Google Scholar Scardi, P. & Leoni, M. (2002). Whole powder pattern modelling. Acta Cryst. A 58, 190–200. Google Scholar Scardi, P., Ortolani, M. & Leoni ...

The Scherrer formula and integral-breadth methods
Leoni, M., International Tables for Crystallography (2019). Vol. H, Section 5.1.2, pp. 524-524 [ doi:10.1107/97809553602060000966 ]


Analytical distributions
Leoni, M., International Tables for Crystallography (2019). Vol. H, Section 5.1.9, pp. 533-533 [ doi:10.1107/97809553602060000966 ]
35, 338–346. Google Scholar Scardi, P. & Leoni, M. (2001). Diffraction line profiles from polydisperse crystalline systems. Acta Cryst. A 57, 604–613. Google Scholar Scardi, P., Leoni, M. & Faber, J. (2006). Diffraction ...

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