Thin films and multilayers
Birkholz, M.,
International Tables for Crystallography
(2019).
Vol. H,
ch. 5.4,
pp. 581-600
[ doi:10.1107/97809553602060000969 ]
of yttria-stabilized zirconia: the {211}⟨111⟩ structure. Appl. Phys. Lett. 82, 343–345. Google Scholar
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M. (2007 ...
Grazing-incidence X-ray scattering (GIXS)
Birkholz, M.,
International Tables for Crystallography
(2019).
Vol. H,
Section 5.4.7,
pp. 597-598
[ doi:10.1107/97809553602060000969 ]
...
Texture gradients
Birkholz, M.,
International Tables for Crystallography
(2019).
Vol. H,
Section 5.4.4.3,
pp. 592-593
[ doi:10.1107/97809553602060000969 ]
between 5 and 15 keV. The thickness of the films is assumed to be 1 µm (Birkholz, 2007).
References
Birkholz,
M. (2007). Modelling of diffraction from fibre texture gradients in thin polycrystalline films. J. Appl ...
[
more
results from section 5.4.4 in volume H]
Conclusions and perspective
Birkholz, M.,
International Tables for Crystallography
(2019).
Vol. H,
Section 5.4.8,
pp. 598-598
[ doi:10.1107/97809553602060000969 ]
diffraction techniques that are in use and under development will continue to deliver indispensable contributions during this fascinating journey.
References
Birkholz,
M. (2007). Modelling of diffraction from ...
Reflectivity from a substrate
Birkholz, M.,
International Tables for Crystallography
(2019).
Vol. H,
Section 5.4.6.1,
pp. 594-595
[ doi:10.1107/97809553602060000969 ]
...
[
more
results from section 5.4.6 in volume H]
Absorption factor
Birkholz, M.,
International Tables for Crystallography
(2019).
Vol. H,
Section 5.4.2.1,
pp. 581-582
[ doi:10.1107/97809553602060000969 ]
...
[
more
results from section 5.4.2 in volume H]
Penetration depth and information depth
Birkholz, M.,
International Tables for Crystallography
(2019).
Vol. H,
Section 5.4.3.2,
pp. 587-587
[ doi:10.1107/97809553602060000969 ]
...
[
more
results from section 5.4.3 in volume H]
Introduction
Birkholz, M.,
International Tables for Crystallography
(2019).
Vol. H,
Section 5.4.1,
pp. 581-581
[ doi:10.1107/97809553602060000969 ]
sufficient structural information for thin films and multilayers.
References
Birkholz,
M. (2006). Thin Film Analysis by X-ray Scattering . Weinheim: Wiley-VCH. Google Scholar
Boscherini, F.,
Birkholz,
M., Buffière, J.-Y ...
Stress and strain analysis
Birkholz, M.,
International Tables for Crystallography
(2019).
Vol. H,
Section 5.4.5,
pp. 593-594
[ doi:10.1107/97809553602060000969 ]
C. & Balzar, D. (2011). Rietveld refinement of energy-dispersive synchrotron measurements. Z. Kristallogr. 226, 934–943. Google Scholar
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M., Albers, U. & Jung, T. (2004). Nanocomposite layers of ceramic oxides and metals ...
