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 Results for by Steeds, J. W.
Measurement of structure factors and determination of crystal thickness by electron diffraction
Gjønnes, J. and Steeds, J. W., International Tables for Crystallography (2006). Vol. C, Section 4.3.7, pp. 416-419 [ doi:10.1107/97809553602060000593 ]
Matsuhata, H. & Gjønnes, J. (1994). Bloch-wave degeneracies and non-systematic critical voltage: a method for structure-factor determination. Acta Cryst. A 50, 107–115. Google Scholar Matsuhata, H. & Steeds, J. W. (1987). Observation ...

Electron diffraction
Colliex, C., Cowley, J. M., Dudarev, S. L., Fink, M., Gjønnes, J., Hilderbrandt, R., Howie, A., Lynch, D. F., Peng, L. M., Ren, G., Ross, A. W., Smith, V. H. Jr, Spence, J. C. H., Steeds, J. W., Wang, J., Whelan, M. J. and Zvyagin, B. B., International Tables for Crystallography (2006). Vol. C, ch. 4.3, pp. 259-429 [ doi:10.1107/97809553602060000593 ]


Computation of dynamical wave amplitudes
Colliex, C., Cowley, J. M., Dudarev, S. L., Fink, M., Gjønnes, J., Hilderbrandt, R., Howie, A., Lynch, D. F., Peng, L. M., Ren, G., Ross, A. W., Smith, V. H. Jr, Spence, J. C. H., Steeds, J. W., Wang, J., Whelan, M. J. and Zvyagin, B. B., International Tables for Crystallography (2006). Vol. C, Section 4.3.6, pp. 414-416 [ doi:10.1107/97809553602060000593 ]
: Kluwer Academic Publishers. Google Scholar Jones, P. M., Rackham, G. M. & Steeds, J. W. (1977). High-order Laue zone electron diffraction. Proc. R. Soc. London Ser. A, 354, 192–222. Google Scholar Pendry, J. B. (1974). Low ...

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