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Electron powder diffraction
International Tables for Crystallography (2018). Vol. H, ch. 2.4, pp. 102-117 [ doi:10.1107/97809553602060000939 ]
Electron powder diffraction Electron powder diffraction patterns can be recorded from small volumes of nanoparticles or localized areas of nanocrystalline thin films, which makes electron diffraction a complementary technique to X-ray and neutron powder diffraction for challenging samples. This chapter covers electron diffraction techniques for powder diffraction data collection and ...
Summary
International Tables for Crystallography (2018). Vol. H, Section 2.4.8, p. 114 [ doi:10.1107/97809553602060000939 ]
Summary 2.4.8. Summary Powder electron diffraction can be used for materials structural characterization, just as is routinely done using X-rays and neutrons. The specific characteristics of electron scattering result in both benefits and drawbacks to using electron diffraction data. Strong scattering of electrons allows collection of a sufficient signal from ...
The pair distribution function from electron diffraction data
International Tables for Crystallography (2018). Vol. H, Section 2.4.7, pp. 113-114 [ doi:10.1107/97809553602060000939 ]
... M. C. D., Malliakas, C. D., Juhás, P., Bozin, E. S., Kanatzidis, M. G. & Billinge, S. J. L. (2012). ... electron scattering. Annu. Rev. Mater. Res. 37, 159-187.GoogleScholar Egami, T. & Billinge, S. J. L. (2003). Underneath the Bragg Peaks ... Acta Cryst. A65, 232-239.GoogleScholar Hirata, A., Hirotsu, Y., Ohkubo, T., Hanada, T. & Bengus, V. Z. (2006). Compositional dependence ...
Rietveld refinement with electron diffraction data
International Tables for Crystallography (2018). Vol. H, Section 2.4.6, pp. 111-113 [ doi:10.1107/97809553602060000939 ]
... instrumental parameters needs further systematic study. References Burdett, J. K. T., Hughbanks, T., Miller, G. J., Richardson, J. W. & Smith, J. V. (1987 ... J., Fischer, J., Merlini, M., Poli, S., Fumagalli, P., Mugnaioli, E. & Kolb, U. (2011). A new hydrous Al-bearing ...
Introduction
International Tables for Crystallography (2018). Vol. H, Section 2.4.1, pp. 102-103 [ doi:10.1107/97809553602060000939 ]
... Tanaka, 1999 ; Hovmoller et al., 2002 ; Sun et al., 2009 ; Gorelik et al., 2010 ; Mugnaioli et al., 2012 ), or in combination ... Monographs on Crystallography. Oxford: IUCr/Oxford University Press.GoogleScholar Elsayedali, H. E. & Herman, J. W. (1990). Ultrahigh vacuum picosecond laser-driven ... the [001] projection of AlmFe. Acta Cryst. A54, 102-119.GoogleScholar Gorelik, T., Matveeva, G., Kolb, U., Schleuss, T., Kilbinger, A. ...
Electron powder diffraction
International Tables for Crystallography (2018). Vol. H, ch. 2.4, pp. 102-117 [ doi:10.1107/97809553602060000939 ]
... Tanaka, 1999 ; Hovmoller et al., 2002 ; Sun et al., 2009 ; Gorelik et al., 2010 ; Mugnaioli et al., 2012 ), or in combination ... is the electron structure factor of the hkl reflection: Here T is the atomic displacement factor, which accounts for atomic thermal vibrations, and the electron atomic scattering factor fi e is defined by equation (4.3.1.13) in International Tables for ...
International Tables for Crystallography (2018). Vol. H, ch. 2.4, pp. 102-117 [ doi:10.1107/97809553602060000939 ]
Electron powder diffraction Electron powder diffraction patterns can be recorded from small volumes of nanoparticles or localized areas of nanocrystalline thin films, which makes electron diffraction a complementary technique to X-ray and neutron powder diffraction for challenging samples. This chapter covers electron diffraction techniques for powder diffraction data collection and ...
Summary
International Tables for Crystallography (2018). Vol. H, Section 2.4.8, p. 114 [ doi:10.1107/97809553602060000939 ]
Summary 2.4.8. Summary Powder electron diffraction can be used for materials structural characterization, just as is routinely done using X-rays and neutrons. The specific characteristics of electron scattering result in both benefits and drawbacks to using electron diffraction data. Strong scattering of electrons allows collection of a sufficient signal from ...
The pair distribution function from electron diffraction data
International Tables for Crystallography (2018). Vol. H, Section 2.4.7, pp. 113-114 [ doi:10.1107/97809553602060000939 ]
... M. C. D., Malliakas, C. D., Juhás, P., Bozin, E. S., Kanatzidis, M. G. & Billinge, S. J. L. (2012). ... electron scattering. Annu. Rev. Mater. Res. 37, 159-187.GoogleScholar Egami, T. & Billinge, S. J. L. (2003). Underneath the Bragg Peaks ... Acta Cryst. A65, 232-239.GoogleScholar Hirata, A., Hirotsu, Y., Ohkubo, T., Hanada, T. & Bengus, V. Z. (2006). Compositional dependence ...
Rietveld refinement with electron diffraction data
International Tables for Crystallography (2018). Vol. H, Section 2.4.6, pp. 111-113 [ doi:10.1107/97809553602060000939 ]
... instrumental parameters needs further systematic study. References Burdett, J. K. T., Hughbanks, T., Miller, G. J., Richardson, J. W. & Smith, J. V. (1987 ... J., Fischer, J., Merlini, M., Poli, S., Fumagalli, P., Mugnaioli, E. & Kolb, U. (2011). A new hydrous Al-bearing ...
Introduction
International Tables for Crystallography (2018). Vol. H, Section 2.4.1, pp. 102-103 [ doi:10.1107/97809553602060000939 ]
... Tanaka, 1999 ; Hovmoller et al., 2002 ; Sun et al., 2009 ; Gorelik et al., 2010 ; Mugnaioli et al., 2012 ), or in combination ... Monographs on Crystallography. Oxford: IUCr/Oxford University Press.GoogleScholar Elsayedali, H. E. & Herman, J. W. (1990). Ultrahigh vacuum picosecond laser-driven ... the [001] projection of AlmFe. Acta Cryst. A54, 102-119.GoogleScholar Gorelik, T., Matveeva, G., Kolb, U., Schleuss, T., Kilbinger, A. ...
Electron powder diffraction
International Tables for Crystallography (2018). Vol. H, ch. 2.4, pp. 102-117 [ doi:10.1107/97809553602060000939 ]
... Tanaka, 1999 ; Hovmoller et al., 2002 ; Sun et al., 2009 ; Gorelik et al., 2010 ; Mugnaioli et al., 2012 ), or in combination ... is the electron structure factor of the hkl reflection: Here T is the atomic displacement factor, which accounts for atomic thermal vibrations, and the electron atomic scattering factor fi e is defined by equation (4.3.1.13) in International Tables for ...
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