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 Results for by van Smaalen, S.
Constraints in the MEM based on the measured intensities from powder-diffraction data
Magdysyuk, O.V., van Smaalen, S. and Dinnebier, R.E., International Tables for Crystallography (2019). Vol. H, Section 4.8.6, p. [ doi:10.1107/97809553602060000963 ]
on calculated structure factors,, of the prior structure model (Palatinus & van Smaalen, 2005): where the symbols have the same meaning as in equations (4.8.10) and (4.8.28), but and is the number of reflections included in the PDC ...

Constraints using `partly phased' reflections for anomalous-scattering X-ray powder diffraction
Magdysyuk, O.V., van Smaalen, S. and Dinnebier, R.E., International Tables for Crystallography (2019). Vol. H, Section 4.8.6.2, p. [ doi:10.1107/97809553602060000963 ]
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F and G constraints
Magdysyuk, O.V., van Smaalen, S. and Dinnebier, R.E., International Tables for Crystallography (2019). Vol. H, Section 4.8.6.1, p. [ doi:10.1107/97809553602060000963 ]
ray powder data by use of profile fits and the maximum-entropy method. J. Appl. Cryst. 23, 526–534. Google Scholar Samy, A., Dinnebier, R. E., van Smaalen, S. & Jansen, M. (2010). Maximum entropy method and charge flipping ...

Observed structure factors
Magdysyuk, O.V., van Smaalen, S. and Dinnebier, R.E., International Tables for Crystallography (2019). Vol. H, Section 4.8.6.4, p. [ doi:10.1107/97809553602060000963 ]
Schneider, M. & van Smaalen, S. (1998). Disorder in the crystal structure of Cs 2 HgCl 4 studied by the maximum entropy method. Acta Cryst. B 54, 626–634. Google Scholar International Tables for Crystallography (2019). Vol ...

Prior-derived F constraints
Magdysyuk, O.V., van Smaalen, S. and Dinnebier, R.E., International Tables for Crystallography (2019). Vol. H, Section 4.8.6.3, p. [ doi:10.1107/97809553602060000963 ]
constraints (PDCs) based on calculated structure factors,, of the prior structure model (Palatinus & van Smaalen, 2005): where the symbols have the same meaning as in equations (4.8.10) and (4.8.28), but and is the number ...

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